검색결과 : 3건
No. | Article |
---|---|
1 |
V-DD scalability of FinFET SRAMs: Robustness of different design options against LER-induced variations Baravelli E, De Marchi L, Speciale N Solid-State Electronics, 54(9), 909, 2010 |
2 |
Fin shape fluctuations in FinFET: Correlation to electrical variability and impact on 6-T SRAM noise margins Baravelli E, De Marchi L, Speciale N Solid-State Electronics, 53(12), 1303, 2009 |
3 |
Wavelet-based adaptive mesh generation for device simulation De Marchi L, Franze F, Baravelli E, Speciale N Solid-State Electronics, 50(4), 650, 2006 |