화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Suspended slab and photonic crystal waveguides in lithium niobate
Si GY, Teo EJ, Bettiol AA, Teng JH, Danner AJ
Journal of Vacuum Science & Technology B, 28(2), 316, 2010
2 Effects of focused MeV ion beam irradiation on the roughness of electrochemically micromachined silicon surfaces
Ow YS, Azimi S, Breese MBH, Teo EJ, Mangaiyarkarasi D
Journal of Vacuum Science & Technology B, 28(3), 500, 2010
3 Potentiostatic formation of porous silicon in dilute HF: Evidence that nanocrystal size is not restricted by quantum confinement
Wijesinghe TLSL, Teo EJ, Blackwood DJ
Electrochimica Acta, 53(13), 4381, 2008
4 Multicolor photoluminescence from porous silicon using focused, high-energy helium ions
Teo EJ, Breese MBH, Bettiol AA, Mangaiyarkarasi D, Champeaux F, Watt F, Blackwood DJ
Advanced Materials, 18(1), 51, 2006
5 Controlled shift in emission wavelength from patterned porous silicon using focused ion beam irradiation
Mangaiyarkarasi D, Teo EJ, Breese MBH, Bettiol AA, Blackwood DJ
Journal of the Electrochemical Society, 152(10), D173, 2005
6 Depth-resolved luminescence imaging of epitaxial lateral overgrown GaN using ionoluminescence
Teo EJ, Bettiol AA, Osipowicz T, Hao M, Chua SJ, Liu YY
Journal of Crystal Growth, 268(3-4), 494, 2004
7 High quality ion-induced secondary electron imaging for MeV nuclear microprobe applications
Teo EJ, Breese MBH, Bettiol AA, Watt F, Alves LC
Journal of Vacuum Science & Technology B, 22(2), 560, 2004
8 Focusing of MeV ion beams by means of tapered glass capillary optics
Nebiki T, Yamamoto T, Narusawa T, Breese MBH, Teo EJ, Watt F
Journal of Vacuum Science & Technology A, 21(5), 1671, 2003
9 2 MeV proton channeling contrast microscopy of LEO GaN thin film structures
Osipowicz T, Teo EJ, Bettiol AA, Watt F, Hao MS, Chua SJ
Thin Solid Films, 424(1), 139, 2003
10 Investigation of tungsten incorporated amorphous carbon film
Rusli, Yoon SF, Yang H, Ahn J, Huang QF, Zhang Q, Guo YP, Yang CY, Teo EJ, Wee ATS, Huan ACH
Thin Solid Films, 355-356, 174, 1999