검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Evidence for Nonuniform Trap Distributions in Thin Oxides After High-Voltage Stressing Dumin DJ, Vanchinathan S, Mopuri S, Subramoniam R Journal of the Electrochemical Society, 142(6), 2055, 1995 |
| 2 |
Characterizing Wearout, Breakdown, and Trap Generation in Thin Silicon-Oxide Dumin DJ, Maddux JR, Subramoniam R, Scott RS, Vanchinathan S, Dumin NA, Dickerson KJ, Mopuri S, Gladstone SM, Hughes TW Journal of Vacuum Science & Technology B, 13(4), 1780, 1995 |