검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Study of temperature-dependent charge conduction in silicon-nanocrystal/SiO2 multilayers Mavilla NR, Chavan V, Solanki CS, Vasi J Thin Solid Films, 612, 41, 2016 |
| 2 |
A CAD-compatible closed form approximation for the inversion charge areal density in double-gate MOSFETs Hariharan V, Vasi J, Rao VR Solid-State Electronics, 53(2), 218, 2009 |
| 3 |
Drain current model for nanoscale double-gate MOSFETs Hariharan V, Thakker R, Singh K, Sachid AB, Patil MB, Vasi J, Rao VR Solid-State Electronics, 53(9), 1001, 2009 |
| 4 |
A study of hot-carrier induced interface-trap profiles in lateral asymmetric channel MOSFETs using a novel charge pumping technique Mahapatra S, Rao VR, Vasi J, Cheng B, Woo JCS Solid-State Electronics, 45(10), 1717, 2001 |
| 5 |
Charge Trapping Behavior in Deposited and Grown Thin Metal-Oxide-Semiconductor Gate Dielectrics Rao VR, Hansch W, Baumgartner H, Eisele I, Sharma DK, Vasi J, Grabolla T Thin Solid Films, 296(1-2), 37, 1997 |