화학공학소재연구정보센터
검색결과 : 28건
No. Article
1 Gate-based high fidelity spin readout in a CMOS device
Urdampilleta M, Niegemann DJ, Chanrion E, Jadot B, Spence C, Mortemousque PA, Bauerle C, Hutin L, Bertrand B, Barraud S, Maurand R, Sanquer M, Jehl X, De Franceschi S, Vinet M, Meunier T
Nature Nanotechnology, 14(8), 737, 2019
2 New prospects on high on-current and steep subthreshold slope for innovative Tunnel FET architectures
Llorente CD, Colinge JP, Martinie S, Cristoloveanu S, Wan J, Le Royer C, Ghibaudo G, Vinet M
Solid-State Electronics, 159, 26, 2019
3 Low temperature influence on performance and transport of Omega-gate p-type SiGe-on-insulator nanowire MOSFETs
Paz BC, Casse M, Barraud S, Reimbold G, Vinet M, Faynot O, Pavanello MA
Solid-State Electronics, 159, 83, 2019
4 GDNMOS and GDBIMOS devices for high voltage ESD protection in thin film advanced FD-SOI technology
De Conti L, Bedecarrats T, Cristoloveanu S, Vinet M, Galy P
Solid-State Electronics, 159, 90, 2019
5 New insights on SOI Tunnel FETs with low-temperature process flow for CoolCube (TM) integration
Llorente CD, Le Royer C, Batude P, Fenouillet-Beranger C, Martinie S, Lu CMV, Allain F, Colinge JP, Cristoloveanu S, Ghibaudo G, Vinet M
Solid-State Electronics, 144, 78, 2018
6 Electrical characterization of vertically stacked p-FET SOI nanowires
Paz BC, Casse M, Barraud S, Reimbold G, Vinet M, Faynot O, Pavanello MA
Solid-State Electronics, 141, 84, 2018
7 Methodology to separate channel conductions of two level vertically stacked SOI nanowire MOSFETs
Paz BC, Casse M, Barraud S, Reimbold G, Vinet M, Faynot O, Pavanello MA
Solid-State Electronics, 149, 62, 2018
8 Study of silicon n- and p-FET SOI nanowires concerning analog performance down to 100 K
Paz BC, Casse M, Barraud S, Reimbold G, Vinet M, Faynot O, Pavanello MA
Solid-State Electronics, 128, 60, 2017
9 Reconfigurable field effect transistor for advanced CMOS: Advantages and limitations
Navarro C, Barraud S, Martinie S, Lacord J, Jaud MA, Vinet M
Solid-State Electronics, 128, 155, 2017
10 Investigation of ambipolar signature in SiGeOI homojunction tunnel FETs
Hutin L, Oeflein RP, Borrel J, Martinie S, Tabone C, Le Royer C, Vinet M
Solid-State Electronics, 115, 160, 2016