1 |
Tunable chiroptical response of chiral system composed of a nanorod coupled with a nanosurface Ullah H, Qu Y, Wang TK, Wang YK, Jing ZM, Zhang ZY Applied Surface Science, 467, 684, 2019 |
2 |
Critical Role of Tricyclic Bridges Including Neighboring Rings for Understanding Raman Spectra of Zeolites Wang TK, Luo S, Tompsett GA, Timko MT, Fan W, Auerbach SM Journal of the American Chemical Society, 141(51), 20318, 2019 |
3 |
Facile fabrication of superhydrophobic hybrid nanotip and nanopore arrays as surface-enhanced Raman spectroscopy substrates Li YX, Li J, Wang TK, Zhang ZY, Bai Y, Hao CC, Feng CC, Ma YJ, Sun RG Applied Surface Science, 443, 138, 2018 |
4 |
Electrically Controllable Actuators Based on Supramolecular Peptide Hydrogels Xue B, Qin M, Wang TK, Wu JH, Luo DJ, Jiang Q, Li Y, Cao Y, Wang W Advanced Functional Materials, 26(48), 9053, 2016 |
5 |
Low inversion equivalent oxide thickness and enhanced mobility in MOSFETs with chlorine plasma interface engineering Li CC, Chang-Liao KS, Chen LT, Fu CH, Hong HZ, Li MC, Chi WF, Lu CC, Ye ZH, Wang TK Solid-State Electronics, 101, 33, 2014 |
6 |
Performance enhancement in p-channel charge-trapping flash memory devices with Si/Ge super-lattice channel and band-to-band tunneling induced hot-electron injection Liu LJ, Chang-Liao KS, Jian YC, Wang TK, Tsai MJ Thin Solid Films, 533, 1, 2013 |
7 |
Electrical characteristics of SiGe pMOSFET devices with tantalum or titanium oxide higher-k dielectric stack Li CC, Chang-Liao KS, Fu CH, Tzeng TH, Lu CC, Hong HZ, Chen TC, Wang TK, Tsai WF, Ai CF Solid-State Electronics, 78, 17, 2012 |
8 |
Improved programming/erasing speed of charge-trapping flash device with tunneling layer formed by low temperature nitrogen-rich SiN/SiO2 stack Chen CY, Chang-Liao KS, Ho JJ, Wang TK Solid-State Electronics, 78, 22, 2012 |
9 |
Electrical characteristics of SiGe channel MOS devices with high-k/metal gate incorporated with nitrogen by plasma immersion ion implantation Fu CH, Chang-Liao KS, Du LW, Wang TK, Tsai WF, Ai CF Solid-State Electronics, 54(10), 1094, 2010 |
10 |
Improvement on programming and erasing speeds for charge-trapping flash memory device with SiGe buried channel Liu LJ, Chang-Liao KS, Keng WC, Wang TK Solid-State Electronics, 54(10), 1113, 2010 |