검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Secondary-Ion Mass-Spectroscopy Ultrashallow Depth Profiling for Si/Si1-xGex/Si Heterojunction Bipolar-Transistors Kruger D, Kurps R, Heinemann B, Herzel F, Zeindl HP Journal of Vacuum Science & Technology B, 14(1), 287, 1996 |
| 2 |
Characterization of B and Sb Delta-Doping Profiles in Si and Si1-xGex Alloys Grown by Molecular-Beam Epitaxy Kruger D, Gaworzewski P, Kurps R, Zeindl HP Journal of Vacuum Science & Technology B, 14(1), 341, 1996 |