검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Hard X-ray photoelectron spectroscopy investigation of annealing effects on buried oxide in GaAs/Si junctions by surface-activated bonding Yamajo S, Yoon S, Liang J, Sodabanlu H, Watanabe K, Sugiyama M, Yasui A, Ikenaga E, Shigekawa N Applied Surface Science, 473, 627, 2019 |
| 2 |
Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample Zborowski C, Renault O, Torres A, Yamashita Y, Grenet G, Tougaard S Applied Surface Science, 432, 60, 2018 |
| 3 |
Correlating the interface resistance and surface adhesion of the Li metal-solid electrolyte interface Wang M, Sakamoto J Journal of Power Sources, 377, 7, 2018 |
| 4 |
Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers Risterucci P, Renault O, Zborowski C, Bertrand D, Torres A, Rueff JP, Ceolin D, Grenet G, Tougaard S Applied Surface Science, 402, 78, 2017 |
| 5 |
Hydrogen Permeation as a Tool for Quantitative Characterization of Oxygen Reduction Kinetics at Buried Metal-Coating Interfaces Vijayshankar D, Tran TH, Bashir A, Evers S, Rohwerder M Electrochimica Acta, 189, 111, 2016 |
| 6 |
In situ chemical state analysis of buried polymer/metal adhesive interface by hard X-ray photoelectron spectroscopy Ozawa K, Kakubo T, Shimizu K, Amino N, Mase K, Ikenaga E, Nakamura T, Kinoshita T, Oji H Applied Surface Science, 320, 177, 2014 |
| 7 |
Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry Marzec MM, Bernasik A, Rysz J, Luzny W, Budkowski A Electrochimica Acta, 104, 462, 2013 |
| 8 |
Buried polymer/metal interfaces examined with Kelvin Probe Force Microscopy Marzec MM, Awsiuk K, Bernasik A, Rysz J, Haberko J, Luzny W, Budkowski A Thin Solid Films, 531, 271, 2013 |
| 9 |
In situ observation of a Au (111) electrode surface using the X-ray reciprocal-lattice space imaging method Sakata O, Nakamura M Applied Surface Science, 256(4), 1144, 2009 |
| 10 |
Study of buried Si(111)-5x2-Au by surface X-ray diffraction Iwasawa Y, Voegeli W, Shirasawa T, Sekiguchi K, Nojima T, Yoshida R, Takahashi T, Matsumoto M, Okano T, Akimoto K, Kawata H, Sugiyama H Applied Surface Science, 254(23), 7803, 2008 |