| 1 |
Mechanical stress dependence of the Fermi level pinning on an oxidized silicon surface
Li H, Martinelli L, Cadiz F, Bendounan A, Arscott S, Sirotti F, Rowe ACH
Applied Surface Science, 478, 284, 2019 |
| 2 |
Enhanced red photoluminescence of quartz by silicon nanocrystals thin film deposition
Momeni A, Pourgolestani M, Taheri M, Mansour N
Applied Surface Science, 434, 674, 2018 |
| 3 |
Influence of defect states and fixed charges located at the a-Si:H/c-Si interface on the performance of HIT solar cells
Oppong-Antwi L, Huang SH, Li QN, Chi D, Meng XQ, He L
Solar Energy, 141, 222, 2017 |
| 4 |
Silicon surface passivation using thin HfO2 films by atomic layer deposition
Gope J, Vandana, Batra N, Panigrahi J, Singh R, Maurya KK, Srivastava R, Singh PK
Applied Surface Science, 357, 635, 2015 |
| 5 |
Properties of HfO2/ultrathin SiO2/Si structures and their comparison with Si MOS structures passivated in KCN solution
Pincik E, Kobayashi H, Matsumoto T, Takahashi M, Mikula M, Brunner R
Applied Surface Science, 301, 34, 2014 |
| 6 |
Work function tuning of an ultrathin MgO film on an Ag substrate by generating oxygen impurities at the interface
Cho SB, Yun KH, Yoo DS, Ahn K, Chung YC
Thin Solid Films, 544, 541, 2013 |
| 7 |
Further work function and interface quality improvement on Al2O3 capped high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors by incorporation of fluorine
Chen YW, Lai CM, Cheng LW, Hsu CH, Hsu CW
Thin Solid Films, 520(13), 4482, 2012 |
| 8 |
Performance of organic field effect transistors with high-k gate oxide after application of consecutive bias stress
Lee S, Choi C, Lee K, Cho JH, Ko KY, Ahn J
Thin Solid Films, 521, 30, 2012 |
| 9 |
Observation of a paramagnetic defect at the epitaxial Ge3N4/(111)Ge interface by electron spin resonance
Nguyen APD, Stesmans A, Afanas'ev VV, Lieten RR, Borghs G
Thin Solid Films, 518(9), 2361, 2010 |
| 10 |
Effect of substrate surface defects and Te dopant concentration on crystalline quality and electrical characteristics of AlGaAsSb epitaxial layers
Ehsani H, Lewis N, Nichols GJ, Danielson L, Dashiell MW, Shellenbarger ZA, Wang CA
Journal of Crystal Growth, 291(1), 77, 2006 |
