| 1 |
Local monitoring of atomic steps on GaAs(001) surface under oxidation, wet removal of oxides and thermal smoothing
Akhundov IO, Kazantsev DM, Alperovich VL, Sheglov DV, Kozhukhov AS, Latyshev AV
Applied Surface Science, 406, 307, 2017 |
| 2 |
Nanopatterning of Anionic Nanoparticles based on Magnetic Prussian-Blue Analogues
Coronado E, Forment-Aliaga A, Pinilla-Cienfuegos E, Tatay S, Catala L, Plaza JA
Advanced Functional Materials, 22(17), 3625, 2012 |
| 3 |
A simple, effective NADH sensor constructed with phenothiazine via AFM tip-induced oxidative polymerization
Chiang YM, Huang HY, Wang CM
Journal of Electroanalytical Chemistry, 677, 78, 2012 |
| 4 |
Controlling dislocation positions in silicon germanium (SiGe) buffer layers by local oxidation
Hu Q, Seo I, Zhang ZN, Lee SH, Kim HM, Kim SH, Kim YS, Lee HH, Xie YH, Kim KB, Yoon TS
Thin Solid Films, 518, S217, 2010 |
| 5 |
Localized oxidation influence from conductive atomic force microscope measurement on nano-scale I-V characterization of silicon thin film solar cells
Shen ZH, Eguchi M, Gotoh T, Yoshida N, Roh T, Nonornura S
Thin Solid Films, 516(5), 588, 2008 |
| 6 |
Silicon nitride deposited by ECR-CVD at room temperature for LOCOS isolation technology
Pereira MA, Diniz JA, Doi I, Swart JW
Applied Surface Science, 212, 388, 2003 |
| 7 |
Feasibility of an isolation by local oxidation of silicon without field implant
Fay JL, Beluch J, Despax B, Sarrabayrouse G
Solid-State Electronics, 45(8), 1257, 2001 |
| 8 |
Local lattice strain measurements in semiconductor devices by using convergent-beam electron diffraction
Toda A, Ikarashi N, Ono H
Journal of Crystal Growth, 210(1-3), 341, 2000 |
| 9 |
Atomic force microscope tip-induced anodization of titanium film for nanofabrication of oxide patterns
Huh C, Park SJ
Journal of Vacuum Science & Technology B, 18(1), 55, 2000 |
| 10 |
Capacitance-voltage study of single-crystalline Si dots on ultrathin buried SiO2 formed by nanometer-scale local oxidation
Ishikawa Y, Kosugi M, Kumezawa M, Tsuchiya T, Tabe M
Thin Solid Films, 369(1-2), 69, 2000 |
