| 1 |
Electron back-scattered diffraction of crystallized vanadium dioxide thin films on amorphous silicon dioxide
Rivera F, Burk L, Davis R, Vanfleet R
Thin Solid Films, 520(7), 2461, 2012 |
| 2 |
Influence of processing parameters on texture and microstructure in aluminum after ECAP
Zhilyaev AP, Oh-ishi K, Raab GI, McNelley TR
Materials Science Forum, 503-504, 65, 2006 |
| 3 |
Grain refinement by high temperature plane-strain compression of Fe-2%Si steel
Calvillo PR, Reis ACC, Kestens L, Houbaert Y
Materials Science Forum, 503-504, 977, 2006 |
| 4 |
EDS assisted phase differentiation in Orientation Imaging Microscopy
Wright SI, Nowell MM
Materials Science Forum, 509, 11, 2006 |
| 5 |
The influence of grain structures on the electrical conductivity of a BaZr0.95Y0.05O3 proton conductor
Iguchi F, Yamada T, Sata N, Tsurui T, Yugami H
Solid State Ionics, 177(26-32), 2381, 2006 |
| 6 |
Textural and microstructural inhomogeneities in drawn and annealed OFHC copper wire
Waryoba DR, Kalu PN
Materials Science Forum, 495-497, 895, 2005 |
| 7 |
Dynamic twin nucleation at triple junctions in Fe-32%Ni stainless steel
Miura H, Andiarwanto S, Sakai T, Jonas JJ
Materials Science Forum, 495-497, 1159, 2005 |
| 8 |
Orientation and microstructure dependence of electromigration damage in damascene Cu interconnect lines
Mirpuri KK, Szpunar J
Materials Science Forum, 495-497, 1443, 2005 |
| 9 |
New interpretation of the influence of various parameters on texture evolution in damascene Cu interconnect lines
Mirpuri KK, Szpunar J
Materials Science Forum, 495-497, 1449, 2005 |
| 10 |
Recrystallisation nucleation during annealing of Ti-Sulc steel
Van-Haaften WM, Bi Y, van Leeuwen Y, Colijn J, Howe A
Materials Science Forum, 426-4, 1163, 2003 |
