화학공학소재연구정보센터
검색결과 : 21건
No. Article
1 Influence of oxygen concentration on the optoelectronic properties of hydrogenated polymorphous silicon thin films
Escobar-Carrasquilla JD, Alvarez-Macias C, Dutt A, Mon-Perez E, Huerta L, Santana G
Thin Solid Films, 638, 389, 2017
2 Chemical and structural properties of polymorphous silicon thin films grown from dichlorosilane
Alvarez-Macias C, Monroy BM, Huerta L, Canseco-Martinez MA, Picquart M, Santoyo-Salazar J, Sanchez MFG, Santana G
Applied Surface Science, 285, 431, 2013
3 High deposition rate hydrogenated polymorphous silicon characterized by different capacitance techniques
Darwich R, Cabarrocas PRI
Thin Solid Films, 519(16), 5364, 2011
4 Temperature dependence of pin solar cell parameters with intrinsic layers made of pm-Si:H and low crystalline volume fraction mu C-Si:H
Hamadeh H
Renewable Energy, 35(7), 1419, 2010
5 Polymorphous silicon thin films deposited at high rate: Transport properties and density of states
Soro YM, Abramov A, Gueunier-Farret ME, Johnson EV, Longeaud C, Cabarrocas PRI, Kleider JP
Thin Solid Films, 516(20), 6888, 2008
6 Influence of deposition parameters on hole mobility in polymorphous silicon
Brinza M, Adriaenssens GJ, Abramov A, Cabarrocas RRI
Thin Solid Films, 515(19), 7504, 2007
7 3 dimensional polymorphous silicon based metal-insulator-semiconductor position sensitive detectors
Aguas H, Pereira S, Costa D, Barquinha P, Pereira L, Fortunato E, Martins R
Thin Solid Films, 515(19), 7530, 2007
8 MIS photodiodes of polyrnorphous silicon deposited at higher growth rates by 27.12 MHz PECVD discharge
Aguas H, Pereira L, Raniero L, Fortunato E, Martins R
Materials Science Forum, 455-456, 73, 2004
9 Characterization of polymorphous silicon thin film and solar cells
Zhang S, Xu Y, Liao X, Martins R, Fortunato E, Hu Z, Kong G
Materials Science Forum, 455-456, 77, 2004
10 Effect of dopants on the dynamics of powder formation and the properties of polymorphous silicon thin films
Kharchenko A, Suendo V, Daineka D, Cabarrocas PRI
Materials Science Forum, 455-456, 536, 2004