화학공학소재연구정보센터
검색결과 : 25건
No. Article
1 Enhanced electron transport in rutile TiO2 nanowires via H2S-assisted incorporation of dissolved silicon for solar-driven water splitting
Lu Y, Wei Z, Salke NP, Yu L, Yan H
Applied Catalysis B: Environmental, 244, 767, 2019
2 Silicon- and oxygen-codoped graphene from polycarbosilane and its application in graphene/n-type silicon photodetectors
Guo HA, Jou S, Mao TZ, Huang BR, Huang YT, Yu HC, Hsieh YF, Chen CC
Applied Surface Science, 464, 125, 2019
3 Chemical speciation and mapping of the Si in Si doped LFP ingot with synchrotron radiation technique
Banis MN, Wang ZQ, Rousselot S, Liu YL, Hu YF, Talebi-Esfandarani M, Bibienne T, Gauthier M, Li RY, Liang GX, Dolle M, Sauriol P, Sham TK, Sun XL
Canadian Journal of Chemical Engineering, 97(8), 2211, 2019
4 Effect of Ti- or Si-doping on nanostructure and photo-electro-chemical activity of electro-spun iron oxide fibres
Santangelo S, Frontera P, Panto F, Stelitano S, Marelli M, Patane S, Malaya F, Dal Santo V, Antonucci P
International Journal of Hydrogen Energy, 42(46), 28070, 2017
5 Behavior of volatile dopants (P, Sb) in Czochralski silicon growth
Porrini M, Scala R, Voronkov VV
Journal of Crystal Growth, 460, 13, 2017
6 Morphology controlled Si-modified LiNi0.5Mn1.5O4 microspheres as high performance high voltage cathode materials in lithium ion batteries
Nageswaran S, Keppeler M, Kim SJ, Srinivasan M
Journal of Power Sources, 346, 89, 2017
7 Silicon Doping of High Voltage Spinel LiNi0.5Mn1.5O4 towards Superior Electrochemical Performance of Lithium Ion Batteries
Keppeler M, Nageswaran S, Kim SJ, Srinivasan M
Electrochimica Acta, 213, 904, 2016
8 The effect of doping on the combustion and reaction kinetics of silicon reactives
Yarrington CD, Groven LJ, Reeves RV, Son SF
Combustion and Flame, 160(9), 1835, 2013
9 Characterization and analysis of epitaxial silicon phosphorus alloys for use in n-channel transistors
Weeks KD, Thomas SG, Dholabhai P, Adams J
Thin Solid Films, 520(8), 3158, 2012
10 Doping effects on the stability of stacking faults in silicon crystals
Ohno Y, Tokumoto Y, Yonenaga I
Thin Solid Films, 520(8), 3296, 2012