검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Reliability implications in advanced embedded two-transistor-Fowler-Nordheim-NOR flash memory devices Scarpa A, Tao G, Dijkstra J, Kuper FG Solid-State Electronics, 46(11), 1765, 2002 |
| No. | Article |
|---|---|
| 1 |
Reliability implications in advanced embedded two-transistor-Fowler-Nordheim-NOR flash memory devices Scarpa A, Tao G, Dijkstra J, Kuper FG Solid-State Electronics, 46(11), 1765, 2002 |