| 1 |
EFFECTS OF PARTICLE OVERLAPPING ON TRANSMISSION FLUCTUATION SPECTROMETRY WITH TEMPORAL CORRELATION
Yu B, Shen JQ, Xu YM, Wang HR, Wei YH, Yu HT
Chemical Engineering Communications, 197(2), 134, 2010 |
| 2 |
Measurements on particle size distribution and concentration by transmission fluctuation spectrometry with temporal correlation
Yu B, Shen JQ, Xu YM, Riebel U, Guo XA
Particle & Particle Systems Characterization, 25(3), 231, 2008 |
| 3 |
Locally resolving measurements of PSD, particle concentration and particle velocity by means of TFS with dual beams
Guo XA, Riebel U
Particle & Particle Systems Characterization, 25(3), 244, 2008 |
| 4 |
Transmission fluctuation spectrometry in concentrated suspensions part one: Effects of the monolayer structure
Shen JQ, Riebel U
Particle & Particle Systems Characterization, 21(6), 429, 2005 |
| 5 |
Transmission fluctuation spectrometry in concentrated suspensions part two: Particle overlapping
Riebel U, Shen JQ
Particle & Particle Systems Characterization, 21(6), 440, 2005 |
| 6 |
Transmission fluctuation spectrometry in concentrated suspensions. Part three: Measurements
Shen JQ, Riebel U
Particle & Particle Systems Characterization, 22(1), 14, 2005 |
| 7 |
Transmission fluctuation spectrometry with spatial correlation
Shen JQ, Riebel U, Guo X
Particle & Particle Systems Characterization, 22(1), 24, 2005 |
| 8 |
Experimental study on particle size distribution and concentration using transmission fluctuation spectrometry with the autocorrelation technique
Guo XA, Riebel U
Particle & Particle Systems Characterization, 22(3), 161, 2005 |
| 9 |
The fundamentals of particle size analysis by transmission fluctuation spectrometry. Part 3: A theory on transmission fluctuations in a gaussian beam and with signal filtering
Shen JQ, Riebel U
Particle & Particle Systems Characterization, 20(2), 94, 2003 |
| 10 |
Particle size analysis by transmission fluctuation spectrometry: Experimental results obtained with a Gaussian beam and analog signal processing
Shen JQ, Riebel U
Particle & Particle Systems Characterization, 20(4), 250, 2003 |
