검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Electron-beam-induced-current study of artificial twist boundaries in bonded Si wafers Ikeda K, Sekiguchi T, Ito S, Takebe M, Suezawa M Journal of Crystal Growth, 210(1-3), 90, 2000 |
| 2 |
Nanometric patterning with ultrathin twist bonded silicon wafers Fournel F, Moriceau H, Magnea N, Eymery J, Buttard D, Rouviere JL, Rousseau K, Aspar B Thin Solid Films, 380(1-2), 10, 2000 |