1 - 5 |
GaAs/Ga0.89In0.11N0.02As0.98/GaAs NpN double heterojunction bipolar transistor with low turn-on voltage Welty RJ, Xin HP, Mochizuki K, Tu CW, Asbeck PM |
7 - 17 |
Modeling thermal resistance in trench-isolated bipolar technologies including trench heat flow Walkey DJ, Smy TJ, Reimer C, Schroter M, Tran H, Marchesan D |
19 - 28 |
Dimensional effects in CMOS photodiodes Brouk I, Nemirovsky Y |
29 - 33 |
Quantum efficiency in GaAs Schottky photodetectors with enhancement due to surface plasmon excitations Sellai A, Dawson P |
35 - 38 |
Properties of AlGaAs/GaAs heterojunction bipolar transistor with AlGaAs ledge bypass capacitor Oh TK, Lee JG, Yi KH, Baek CH, Ihn BU, Kang BK |
39 - 44 |
Analysis of Si/SiGe channel pMOSFETs for deep-submicron scaling Li PW, Liao WM |
45 - 48 |
Characteristics of InGaP/GaAs co-integrated delta-doped heterojunction bipolar transistor and doped-channel field effect transistor Tsai JH |
49 - 52 |
Analysis of I-V measurements on Ag/p-SnS and Ag/p-SnSe Schottky barriers Safak H, Sahin M, Yuksel OF |
53 - 59 |
Characterization of crosstalk between CMOS photodiodes Brouk I, Nemirovsky Y, Lachowicz S, Gluszak EA, Hinckley S, Eshraghian K |
61 - 68 |
Carrier transport and luminescence in composite organic-inorganic light-emitting devices Shik A, Yu S, Johnson E, Ruda H, Sargent EH |
69 - 73 |
Low-frequency noise characteristics of metamorphic In0.52Al0.48As/In0.60Ga0.40As double-heterostructure pseudomorphic high electron mobility transistors grown on a GaAs substrate Kim JH, Yoon HS, Lee JH, Chang WJ, Shim JY, Lee KH, Song JI |
75 - 81 |
Analysis of lifetime control in high-voltage IGBTs Yuan X, Udrea F, Coulbeck L, Waind PR, Amaratunga GAJ |
83 - 87 |
Recombination properties of electronic states in porous silicon Brodovoy OV, Skryshevsky VA, Brodovoy VA |
89 - 96 |
Extended eigenfunctions in asymmetric double triangular quantum wells in weak electric fields Santiago RB, Guimaraes LG |
97 - 101 |
Research on n+p type oxygen sensor Wu XH, Wu XJ, Tian M, Zhang S, Wang YD |
103 - 108 |
New method for determination of harmonic distortion in SOIFD transistors Cerdeira A, Estrada M, Quintero R, Flandre D, Ortiz-Conde A, Sanchez FJG |
109 - 113 |
Finding the optimum Al-Ti alloy composition for use as an ohmic contact to p-type SiC Crofton J, Mohney SE, Williams JR, Isaacs-Smith T |
115 - 121 |
An analytical expression for predicting wearout lifetime of thin gate and tunneling oxide Xu MZ, Tan CH |
123 - 131 |
Transient thermal simulations of a three-dimensional unit cell in power control systems and high-power microwave devices Buot FA, Mittereder JA, Anderson WT, Ioannou DE |
133 - 138 |
Plasma extraction transit time oscillations in bipolar power devices Gutsmann B, Mourick P, Silber D |
139 - 143 |
A novel double heterojunction bipolar with composite collector Hsin YM, Lin CH, Fan CC, Huang MF, Lin KC |
145 - 151 |
A delay model for DRAM bit lines with step and ramp word line signals Lin HC, Sha CH, Wong SC |
153 - 156 |
Modeling inversion-layer carrier mobilities in all regions of MOSFET operation Remashan K, Wong NA, Chan K, Sim SP, Yang CY |