1 - 3 |
Improvement of the Crystallinity of AlAs/GaAs Super-Lattices Grown on Si Substrates by Rapid Thermal Annealing Woo YD, Lee HI, Kang TW, Kim TW |
4 - 10 |
Microstructural Evolution and Epitaxial Alignment of Thin-Films of Lithium-Niobate Deposited Onto Sapphire by Metalloorganic Decomposition Braunstein G, Pazpujalt GR, Blanton TN |
11 - 17 |
Hydrogenated Amorphous-Silicon Films Prepared at Low Substrate-Temperature on a Cathode of an Asymmetric RF Plasma CVD System Seth T, Dixit PN, Mukherjee C, Anandan C, Bhattacharyya R |
18 - 24 |
Preparation and Characterization of Thin Co3O4 and Mnco2O4 Films Prepared on Glass SnO2-F by Spray-Pyrolysis at 150-Degrees-C for the Oxygen-Electrode Rios E, Poillerat G, Koenig JF, Gautier JL, Chartier P |
25 - 27 |
Fabrication of Ultrafine SnO2 Thin-Films by the Hydrothermal Method Chen QW, Qian YT, Chen ZY, Zhou GE, Zhang YH |
28 - 39 |
Strain Relaxation in Ultrathin Epitaxial-Films of Beta-Fesi2 on Unstrained and Strained Si(100) Surfaces Peale DR, Haight R, Legoues FK |
40 - 45 |
Plasma-Assisted Deposition of Tungsten-Containing Siloxane Thin-Films Fracassi F, Dagostino R, Palumbo F, Bellucci F, Monetta T |
46 - 51 |
Influence of Adsorbed Gases on the Surface-Energy of Graphite - Consequences on the Friction Behavior Zaidi H, Robert F, Paulmier D |
52 - 58 |
Tribological Properties of Tin and TiC Films in Vacuum at High-Temperature Yu ZM, Inagawa K, Jin ZJ |
59 - 71 |
Hardness Measurements of Thin Films-Determining the Critical Ratio of Depth to Thickness Using FEM Cai X, Bangert H |
72 - 81 |
Thin-Oxide MOS Damage Caused by Wafer Charging in Magnetized Helium Plasma Atanassova E |
82 - 88 |
Orientation of Poly(Gamma-Benzyl L-Glutamate)/Poly(Ethylene Oxide)/Poly(Gamma-Benzyl L-Glutamate) Triblock Copolymer Langmuir-Blodgett-Films Cho CS, Kobayashi A, Goto M, Akaike T |
89 - 93 |
Electron-Diffraction Study on Monolayer lb Films of Liquid-Crystalline Polyacrylate Containing Para-Nitro Azobenzene Li M, Zhou EL, Wang XP, Xu JP |
94 - 103 |
Long-Range Tilt Orientational Order in Phospholipid Monolayers - The Inner Structure of Dimyristoyl-Phosphatidyl-Ethanolamine Domains Weidemann G, Vollhardt D |
104 - 108 |
UV Laser-Induced Transformation of Thin Evaporated CdTe-Films in Air Artemyev MV, Gurin VS |
109 - 114 |
Characterization of YSZ Films by Means of C-V Measurements and TEM Observations Bagnoli PE, Ciofi C, Diligenti A, Innamorato A, Nannini A |
115 - 119 |
Attenuated Total-Reflection Spectroscopy of Ag-SiO2 Composite Films Kume T, Amano T, Hayashi S, Yamamoto K |
120 - 134 |
EXAFS of Sputter-Deposited MoS2 Films Lince JR, Hilton MR, Bommannavar AS |