1 - 6 |
Raman scattering study of photoluminescent spark-processed porous InP Rojas-Lopez M, Nieto-Navarro J, Rosendo E, Navarro-Contreras H, Vidal MA |
7 - 14 |
Effect of surface structure on photocatalytic activity of TiO2 thin films prepared by sol-gel method Yu JG, Zhao XJ, Zhao QN |
15 - 22 |
Sensitivity analysis of ellipsometry applied to uniaxial optical films Flueraru C, Schrader S, Motschmann H, Zauls V |
23 - 27 |
Structural and optical properties of CeO2 thin films prepared by spray pyrolysis Elidrissi B, Addou M, Regragui M, Monty C, Bougrine A, Kachouane A |
28 - 36 |
Vibrational properties and structure of undoped and Al-doped ZnO films deposited by RF magnetron sputtering Tzolov M, Tzenov N, Dimova-Malinovska D, Kalitzova M, Pizzuto C, Vitali G, Zollo G, Ivanov I |
37 - 44 |
Diborane nitrogen/ammonia plasma chemistry investigated by infrared absorption spectroscopy Franz D, Hollenstein M, Hollenstein C |
45 - 49 |
Characterization of TiAlN films deposited by reactive pulsed laser ablation Acquaviva S, D'Anna E, Elia L, Fernandez M, Leggieri G, Luches A, Martino M, Mengucci P, Zocco A |
50 - 56 |
Promoted hydroxyapatite nucleation on titanium ion-implanted with sodium Pham MT, Maitz MF, Matz W, Reuther H, Richter E, Steiner G |
57 - 63 |
Oxygen diffusion in silicon oxide films produced by different methods Perez-Bueno JJ, Ramirez-Bon R, Vorobiev YV, Espinoza-Beltran F, Gonzalez-Hernandez J |
64 - 71 |
Optimization of the growth of epitaxial SrBi2Ta2O9 thin films by pulsed laser deposition Lettieri J, Jia Y, Fulk SJ, Schlom DG, Hawley ME, Brown GW |
72 - 75 |
PZT thin films with preferred-orientation induced by external stress Qin HX, Zhu JS, Jin ZQ, Wang Y |
76 - 82 |
Deposition of (Ti, Al)N films by filtered cathodic vacuum arc Cheng YH, Tay BK, Lau SP, Shi X, Chua HC |
83 - 88 |
Preparation of iron oxide thin film by metal organic deposition from Fe(III)-acetylacetonate: a study of photocatalytic properties Pal B, Sharon M |
89 - 93 |
Randomly oriented Bi4Ti3O12 thin films derived from a hybrid sol-gel process Kong LB, Ma J |
94 - 100 |
Controlling amine receptor group density on aluminum oxide surfaces by mixed silane self assembly Lee I, Wool RP |
101 - 106 |
Low temperature process for nano-structure formation with Si films Nam HG, Koo KH |
107 - 113 |
Abrasion and dissolution interaction of Al in a phosphoric acid solution Tsai WT, Huang TM |
114 - 121 |
A study of structure and mixing at the interface between Fe and AlGaAs (100) Monteverde F, Michel A, Kherici A, Eymery JP |
122 - 127 |
Structural characterization of ZrO2 thin films produced via self-assembled monolayer-mediated deposition from aqueous dispersions Polli AD, Wagner T, Fischer A, Weinberg G, Jentoft FC, Schlogl R, Ruhle M |
128 - 132 |
Effect of CeO2 on microstructure and corrosive wear behavior of laser-cladded Ni/WC coating Zhao T, Cai X, Wang SX, Zheng S |
133 - 138 |
TEM annealing study of normal grain growth in silver thin films Dannenberg R, Stach E, Groza JR, Dresser BJ |
139 - 146 |
Oxidation of phosphated iron powders Rebeyrat S, Grosseau-Poussard JL, Dinhut JF, Renault PO |
147 - 155 |
Limits of using bilinear stress-strain curve for finite element modeling of nanoindentation response on bulk materials Pelletier H, Krier J, Cornet A, Mille P |
156 - 165 |
Analysis of the mechanical behavior of shape memory polymer membranes by nanoindentation, bulging and point membrane deflection tests Poilane C, Delobelle P, Lexcellent C, Hayashi S, Tobushi H |
166 - 172 |
Hardness measurements at shallow depths on ultra-thin amorphous carbon films deposited onto silicon and Al2O3-TiC substrates Lemoine P, Zhao JF, Quinn JP, McLaughlin JA, Maguire P |
173 - 175 |
Extraordinary damping of Ni-Ti double layer films Craciunescu C, Wuttig M |
176 - 182 |
The effect of annealing on the photoluminescence of epitaxial DMe-PTCDI multilayers on Ag(110) Schafer AH, Seidel C, Fuchs H |
183 - 187 |
Ferroelectric characteristics of liquid source misted chemical deposition (LSMCD)-derived SrBi2.4Ta2O9 thin films with thickness variation Park JD, Oh TS, Lee JH, Park JY |
188 - 194 |
Effect of added ionic salt on the quantum efficiency of self-assembled films prepared with poly( p-phenylene vinylene) Cho J, Char K, Kim SY, Hong JD, Lee SK, Kim DY |
195 - 198 |
A low reflectivity multilayer cathode for organic light-emitting diodes Renault O, Salata OV, Etchells M, Dobson PJ, Christou V |
199 - 202 |
Optical constants of zinc sulfide films determined from transmittance measurements Durrani SMA, Al-Shukri AM, Iob A, Khawaja EE |
203 - 212 |
Additive channel-constrained metallization of high-resolution features Chen MS, Brandow SL, Dressick WJ |
213 - 217 |
Plasma effects of fluorine implantation on As+-doped polycrystalline silicon thin films of various thicknesses Liou BW, Lee CL |
218 - 223 |
Preparation of titanium dioxide and barium titanate nanothick film by Langmuir-Blodgett technique Jin J, Li LS, Li Y, Chen X, Jiang L, Zhao YY, Li TJ |
224 - 229 |
Vectorially oriented purple membrane: characterization by photocurrent measurement and polarized-Fourier transform infrared spectroscopy Wang JP |
230 - 239 |
A study on structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes using infrared spectroscopy and atomic force microscopy Iimura K, Nakajima Y, Kato T |
240 - 252 |
Gas permeability of Langmuir-Blodgett (LB) films: characterisation and application Riedl T, Nitsch W, Michel T |
253 - 258 |
Piezoelectric films for 100-MHz ultrasonic transducers Martin PM, Good MS, Johnston JW, Posakony GJ, Bond LJ, Crawford SL |
259 - 264 |
The origin of intrinsic stress and its relaxation for SiOF thin films deposited by electron cyclotron resonance plasma-enhanced chemical vapor deposition Kim SP, Choi SK |
265 - 271 |
The growth of CoSi2 through an oxide layer: dependence on Si(100) surface structure Heo J, Jeon H |
272 - 278 |
Electrical characteristics of W/P3MT/Pt diodes Tagmouti S, Outzourhit A, Oueriagli A, Khaidar M, Elyacoubi M, Evrard R, Ameziane EL |
279 - 286 |
A physical insight into the gas-sensing properties of copper(II) tetra-(tert-butyl)-5,10,15,20-tetraazaporphyrin Langmuir-Blodgett films Ding HM, Erokhin V, Ram MK, Paddeu S, Valkova L, Nicolini C |
287 - 291 |
Characterization and fabrication of ZnSe epilayer on porous silicon substrate Chang CC, Lee CH |
292 - 296 |
Hydrogen bonding properties in nitrogen doped microcrystalline silicon and amorphous silicon prepared using highly diluted silane Ehara T |
297 - 307 |
Monte Carlo simulation of mixed multilayer adsorption: layering transitions and wetting phenomena in non-ideal mixtures Grabowski K, Patrykiejew A, Sokolowski S |
308 - 312 |
Thermal stability of Mo/SiO2 multilayers Wang FP, Cheng LS, Wang PX, Lu KQ |
313 - 313 |
Critical dimensions for the formation of interfacial misfit dislocations of In0.6Ga0.4As islands on GaAs (001)' (vol 368, pg 93, 2000) Tillmann K, Forster A |