1 - 3 |
Reactive sputter deposition of epitaxial (001)CeO2 on (001)Ge Patel M, Kim K, Ivill M, Budai JD, Norton DP |
4 - 7 |
Preparation of Co3O4 thin films by a modified chemical-bath method Unuma H, Saito Y, Watanabe K, Sugawara M |
8 - 11 |
Structural electrical transport and magnetic properties of the Co-doped La0.5Sr0.5TiO3 at high temperatures Qiao PT, Zhao ZH, Zhao YG, Zhang XP, Zhang WY, Ogale SB, Shinde SR, Venkatesan T, Lofland SE, Lanci C |
12 - 16 |
Correlation of the hydroxyl bond and wettability characteristics of a magnesia partially stabilised zirconia following CO2 laser irradiation Hao L, Lawrence J, Low DKY, Lim GC, Zheng HY |
17 - 22 |
Morphology and conductivity in poly(ortho-anisidine)/carbon nanotubes nanocomposite films Bavastrello V, Erokhin V, Carrara S, Sbrana F, Ricci D, Nicolini C |
23 - 27 |
Ferroelectric lanthanum-substituted Bi4Ti3O12 thin films fabricated on p-type Si(100) substrates by a sol-gel method Bae JC, Kim SS, Kim WJ, Choi EK, Song TK |
28 - 31 |
Optical properties and microstructure of CeO2-SiO2 composite thin films Koo WH, Jeoung SM, Choi SH, Jo SJ, Baik HK, Lee SJ, Song KM |
32 - 42 |
Electrodeposited tungsten oxide films: annealing effects on structure and electrochromic performance Deepa M, Kar M, Agnihotry SA |
43 - 47 |
Morphology and optical properties of amorphous ZnS films deposited by ultrasonic-assisted successive ionic layer adsorption and reaction method Gao XD, Li XM, Yu WD |
48 - 56 |
Effect of heat treatment on structural, optical and mechanical properties of sputtered TiOxNy films Mohamed SH, Kappertz O, Niemeier T, Drese R, Wakkad MM, Wuttig M |
57 - 64 |
Growth and structure of silver and silver oxide thin films on sapphire Bock FX, Christensen TM, Rivers SB, Doucette LD, Lad RJ |
65 - 74 |
Effect of substrate on the characteristics of manganese(IV) oxide thin films prepared by atomic layer deposition Nilsen O, Foss S, Fjellvag H, Kjekshus A |
75 - 78 |
Ag-doped La2CuO4 thin films grown on SrTiO3 substrate by laser ablation Wang CC, Zhu J |
79 - 83 |
Growth of bismuth oxide films by direct liquid injection-metal organic chemical vapor deposition with Bi(tmhd)(3) (tmhd : 2,2,6,6-tetramethyl-3,5-heptanedione) Kang SW, Rhee SW |
84 - 92 |
Optomechanical characterisation of compressively prestressed silicon oxynitride films deposited by plasma-enhanced chemical vapour deposition on silicon membranes Jozwik M, Delobelle P, Gorecki C, Sabac A, Nieradko L, Meunier C, Munnik F |
93 - 99 |
Scaling behavior near transition temperature in Al-doped YBa2Cu3O7 superconducting thin films Saleh AM, Abu-Samreh MM, Soliman MH, Leghrouz AA, Ketaneh RML, Darwish S, Abu Taha MI |
100 - 104 |
Thickness effect of Pb2Ru2O7-x conductive interfacial layers on ferroelectric properties of Pt/Pb(Zr0.35Ti0.65)O-3/Pt capacitors Seong NJ, Choi KJ, Yoon SG |
105 - 108 |
Properties Of SiO2-like barrier layers on polyethersulfone substrates by low-temperature plasma-enhanced chemical vapor deposition Wuu DS, Lo WC, Chang LS, Horng RH |
109 - 112 |
XPS characterization of anodic titanium oxide films grown in phosphate buffer solutions Marino CEB, Nascente PAP, Biaggio SR, Rocha RC, Bocchi N |
113 - 119 |
Substrate melting during thermal spray splat quenching Li L, Wang XY, Wei G, Vaidya A, Zhang H, Sampath S |
120 - 124 |
Influences of current density on structure and corrosion resistance of ceramic coatings on Ti-6Al-4V alloy by micro-plasma oxidation Yao ZP, Jiang ZH, Sun XT, Xin SG, Li YP |
125 - 133 |
Room temperature pulsed laser deposited (Ti,Al)CxN1-x coatings -chemical, structural, mechanical and tribological properties Lackner JM, Waldhauser W, Ebner R, Bakker RJ, Schober T, Major B |
134 - 141 |
Stability under temperature of expanded austenite developed on stainless steel AISI 316L by ion nitriding Nosei L, Avalos M, Gomez BJ, Nachez L, Feugeas J |
142 - 148 |
Ion nitriding of zirconia coated on stainless steel: structure and mechanical properties Caruso R, Gomez BJ, de Sanctis O, Feugeas J, Diaz-Parralejo A, Sanchez-Bajo F |
149 - 154 |
Effect of target self-bias voltage on the mechanical properties of diamond-like carbon films deposited by RF magnetron sputtering Chowdhury S, Laugier MT, Rahman IZ |
155 - 160 |
Preparation and properties of sputtered nitrogen-doped cobalt silicide film Ting JH, Shiau SH, Chen YJ, Pan FM, Wong H, Pu GM, Kung CY |
161 - 166 |
Hardening mechanisms of nanocrystalline Ti-Al-N solid solution films Liu ZJ, Shum PW, Shen YG |
167 - 173 |
Evaluation of fracture properties of silicon by combining resonance frequency and microtensile methods Son D, Kim JJ, Lim TW, Kwon D |
174 - 182 |
CoSi2 formation in the presence of Ti, Ta or W Detavernier C, Lavoie C, Van Meirhaeghe RL |
183 - 192 |
Influence of nitrogen content on the crystallization behavior of thin Ta-Si-N diffusion barriers Hubner R, Hecker M, Mattern N, Voss A, Acker J, Hoffmann V, Wetzig K, Engelmann HJ, Zschech E, Heuer H, Wenzel C |
193 - 202 |
Optical properties of ZnTe films prepared by molecular beam epitaxy Franta D, Ohlidal I, Klapetek P, Montaigne-Ramil A, Bonanni A, Stifter D, Sitter H |
203 - 207 |
The characterization of Zr-Si-N diffusion barrier films with different sputtering bias voltage Song ZX, Xu KW, Chen H |
208 - 215 |
Photovoltaic properties of Schottky device based on dye sensitized poly (3-phenyl azo methine thiophene) thin film Sharma GD, Sharma SK, Roy MS |
216 - 221 |
Diffusion barrier of sputtered W film for Cu Schottky contacts on InGaP layer Lee CT, Liu DS, Deng RW |
222 - 225 |
Reduction of the boron cross-contamination for plasma deposition of p-i-n devices in a single-chamber large area radio-frequency reactor Ballutaud J, Bucher C, Hollenstein C, Howling AA, Kroll U, Benagli S, Shah A, Buechel A |
226 - 233 |
Electrophosphorescence from substituted poly(thiophene) doped with iridium or platinum complex Wang XJ, Andersson MR, Thompson ME, Ingandas O |
234 - 239 |
Highly stable hydrogenated gallium-doped zinc oxide thin films grown by DC magnetron sputtering using H-2/Ar gas Takeda S, Fukawa M |
240 - 243 |
Formation of electric paths in a chemically adsorbed monomolecular layer containing pyrrolyl groups Ogawa K, Mino N, Yamamoto S |
244 - 249 |
Enantioselective recognition of calix[4]arene derivatives bearing chiral bicyclic guanidinium for D/L-phenylalanine zwitterions at the air-water interface Liu F, Lu GY, He WJ, Liu MH, Zhu LG |
250 - 254 |
Effect of urea on sodium bis(2-ethylhexyl) sulfosuccinate thin films on solid substrates Amaral CLC, Politi MJ |
255 - 261 |
A self-assembled molecular rectifier: two-dimensional crystals of cytochrome c formed on a flavolipid monolayer Isoda S, Miyamoto M, Inatomi K, Ueyama S |
262 - 267 |
Pyroelectric effect in Langmuir-Blodgett films incorporating ions Capan R, Richardson TH, Lacey D |
268 - 272 |
Fabrication and characterization of Langmuir-Blodgett films based on rare earth beta-diketonate complexes Zou G, Zhang YZ, He PS |
273 - 279 |
Use of atomic force microscopy for imaging the initial stage of the nucleation of calcium phosphate in Langmuir-Blodgett films of stearic acid Zhang YJ, He P, Xu XD, Li JH |
280 - 284 |
Annealing effects on the gas sensing properties of copper phthalocyanine films Lee YL, Hsiao CY, Hsiao RH |
285 - 290 |
Bidirectional pumping properties of a peristaltic piezoelectric micropump with simple design and chemical resistance Lee DS, Ko JS, Kim YT |
291 - 297 |
The performances of the mercurochrome-sensitized composite semiconductor photoelectrochemical cells based on TiO2/SnO2 and ZnO/SnO2 composites Liu ZY, Pan K, Zhang QL, Liu M, Jia RK, Lu Q, Wang DJ, Bai YB, Li TJ |
298 - 302 |
Temperature dependence of the optical functions of amorphous silicon-based materials: application to in situ temperature measurements by spectroscopic ellipsometry Daineka D, Suendo V, Cabarrocas PRI |
303 - 309 |
Effects on surface morphology of epitaxial Y2O3 layers on Si(001) after postgrowth annealing Ioannou-Sougleridis V, Constantoudis V, Alexe M, Scholz R, Vellianitis G, Dimoulas A |
310 - 315 |
Characterization of surface morphology of copper tungsten thin film by surface fractal geometry and resistivity Wang Y, Xu KW |
316 - 321 |
Correlation between the dielectric constant and X-ray diffraction pattern of Si-O-C thin films with hydrogen bonds Oh T, Oh KS, Lee KM, Choi CK |
322 - 331 |
Stress compensation of a Mo/Si/C highly reflective multilayer by means of an optimised buffer layer and heat treatment Moss M, Bottger T, Braun S, Foltyn T, Leson A |
332 - 337 |
Holes in YBa2CU3O7-x thin films on vicinal strontium titanate substrates Jackson TJ, Abell JS, Chakalov R, Colclough MS, Darlington CNW, Jones IP, Kong G, Muirhead CM, Wellhofer F |
338 - 346 |
Spectroscopic ellipsometry and reflectometry from gratings (Scatterometry) for critical dimension measurement and in situ, real-time process monitoring (Vol 455, pg 828, 2004) Huang HT, Terry FL |