Thin Solid Films

Thin Solid Films, Vol.515, No.14 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (45 articles)

5529 - 5531	Proceedings of the Ninth International Conference on Surface X-ray and Neutton Scattering Taipei, Taiwan, July 16-20, 2006 - Preface Hsu CH, Liang KS, Felcher GP, Noh DY, Sinha SK
5532 - 5535	Surface XPCS on nanometer length scales - What can we expect from an X-ray free electron laser? Gutt C, Leupold O, Grubel G
5536 - 5540	Hydrodynamic surface fluctuations of polymer films by coherent X-ray scattering Kim H, Jiang Z, Lee H, Lee YJ, Jiao XS, Li CH, Lurio L, Rafailovich M, Sinha SK
5541 - 5545	Dynamic scaling in sputter grown tungsten thin films Peverini L, Ziegler E, Kozhevnikov I
5546 - 5552	Coherent X-ray imaging of individual islands in GISAXS geometry Vartanyants IA, Grigoniev D, Zozulya AV
5553 - 5556	Curved beam coherent diffractive imaging Williams GJ, Quiney HM, Dahl BB, Tran CQ, Peele AG, Nugent KA, De Jonge MD, Paterson D
5557 - 5562	Local strain in a 3D nano-crystal revealed by 2D coherent X-ray diffraction imaging Labat S, Chamard V, Thomas O
5563 - 5567	Coherence experiments at the white-beam beamline of BESSYII Panzner T, Gleber G, Sant T, Leitenberger W, Pietsch U
5568 - 5573	Phase retrieval from diffraction data utilizing pre-determined partial infon-nation Kim SS, Marathe S, Kim SN, Kang HC, Noh DY
5574 - 5580	In-situ X-ray diffraction study of the initial dealloying of Cu3Au(001) and Cu0.83Pd0.17(001) Renner FU, Grunder Y, Lyman PF, Zegenhagen J
5581 - 5586	Defining new frontiers in electronic devices with high kappa dielectrics and interfacial engineering Hong M, Lee WC, Huang ML, Chang YC, Lin TD, Lee YJ, Kwo J, Hsu CH, Lee HY
5587 - 5592	Composition and atomic ordering of Ge/Si(001) wetting layers Malachias A, Metzger TH, Stoffel M, Schmidt OG, Holy V
5593 - 5596	In situ X-ray studies of metal organic chemical vapor deposition of PbZ(x)Ti(1-x)O(3) Wang RV, Jiang F, Fong DD, Stephenson GB, Fuoss PH, Eastman JA, Streiffer SK, Latifi K, Thompson C
5597 - 5600	In-situ investigations of magnetron sputtering processes with laboratory X-ray equipment Ringpfeil C, Lutzenkirchen-Flecht D, Frahm R
5601 - 5605	Temperature treatment of semiconducting polymers: An X-ray reflectivity study Werzer O, Matoy K, Strohriegl P, Resel R
5606 - 5610	Energy-dispersive X-ray reflectivity and GID for real-time growth studies of pentacene thin films Kowarik S, Gerlach A, Leitenberger W, Hu J, Witte G, Woll C, Pietsch U, Schreiber F
5611 - 5614	Layer-by-layer growth of thin epitaxial Fe3Si films on GaAs(001) Jenichen B, Kaganer VM, Braun W, Herfort J, Shayduk R, Ploog KH
5615 - 5619	The influence of substrate morphology on the growth of thin silicon films: A GISAXS study Gracin D, Bernstoff S, Dubcek P, Gajovic A, Juraic K
5620 - 5623	Structural characterization of thin amorphous Si films Grozdanic D, Rakvin B, Pivac B, Dubcek P, Radic N, Bernstorff S
5624 - 5626	Nanostructured CeO2 thin films: A SAXS study of the interface between grains and pores Lavcevic ML, Turkovic A, Dubcek P, Bernstorff S
5627 - 5630	Pathways for oriented assembly of inorganic crystals at organic surfaces Kewalramani S, Kmetko J, Dommett G, Kim K, Evmenenko G, Mo H, Dutta P
5631 - 5636	Langmuir films of polycyclic molecules on mercury Tamam L, Kraack H, Sloutskin E, Ocko BM, Pershan PS, Deutsch M
5637 - 5640	Si nanocrystals in SiO2 films analyzed by small angle X-ray scattering Bernstoff S, Dubcek P, Kovacevic I, Radic N, Pivac B
5641 - 5644	High-Q X-ray scattering study of InxGa1-xN/GaN multi-quantum wells Lee YJ, Kim SS, Lee SP, Noh DY, Lee HH
5645 - 5653	Theory of X-ray scattering from a complex fluid confined by a nanocavity array Diaz A, van der Veen JF
5654 - 5659	Resonant anomalous X-ray reflectivity as a probe of ion adsorption at solid-liquid interfaces Fenter P, Park C, Nagy KL, Sturchio NC
5660 - 5663	Adsorption of thin isobutane films on silicon investigated by X-ray reflectivity measurements Shokuie K, Paulus M, Sternemann C, Fendt R, Tolan M
5664 - 5668	Freezing transition of Langmuir-Gibbs alkane films on water Sloutskin E, Sapir Z, Tamam L, Ocko BM, Bain CD, Deutsch M
5669 - 5673	Langmuir monolayers of gold nanoparticles Lin BH, Schultz DG, Lin XM, Li DX, Gebhardt J, Meron M, Viccaro PJ
5674 - 5677	Study of thermal degradation of organic light emitting device structures by X-ray scattering Lee YJ, Lee H, Byun Y, Song S, Kim JE, Eom D, Cha W, Park SS, Kim J, Kim H
5678 - 5682	X-ray scattering studies of molecular linkages in Zeolite microcrystal monolayers Lee H, Park JS, Yoon KB, Kim DH, Seo SH, Kang HC, Noh DY, Kim H
5683 - 5686	Additive-induced phase transition of a spin-coated lipid film Yamada NL, Torikai N
5687 - 5690	Studies of phospholipid monolayer at liquid/liquid interface in presence of an antimicrobial peptide Saint Martin E, Konovalov O, Daillant J
5691 - 5695	Grazing incidence X-ray diffraction study of the tilted phases of Langmuir films: Determination of molecular conformations using simulated annealing Pignat J, Daillant J, Cantin S, Perrot F, Konovalov O
5696 - 5699	Neutron science and technology on J-PARC Fujii Y
5700 - 5703	Transformation of X-ray Server from a set of WWW-accessed programs into WWW-based library for remote calls from X-ray data analysis software Stepanov S
5704 - 5706	Development of neutron supermirrors with large critical angle Maruyama R, Yamazaki D, Ebisawa T, Hino M, Soyama K
5707 - 5711	The HANARO neutron reflectometer with horizontal sample geometry; engineering designs and performance simulation Kwon OS, Shin K, Choi DJ, Hong KP, Moon MK, Cho SJ, Choi YH, Lee JS, Lee CH
5712 - 5715	Neutron reflectometery with ADAM at the ILL: Present status and future perspectives Wolff M, Zhernenkov K, Zabel H
5716 - 5723	Determination of three-dimensional interfacial strain - A novel method of probing interface structure with X-ray Bragg-surface diffraction Sun WC, Chu CH, Chang HC, Wu BK, Chen YR, Cheng CW, Chiu MS, Shen YC, Wu HH, Hung YS, Chang SL, Hong MH, Tang MT, Stetsko Y
5724 - 5727	NS-SANS for the investigation of micellar systems Wolff M, Magerl A, Zabel H
5728 - 5731	Monochromatization of characteristic X-rays using stepped X-ray waveguide Hayashi K, Sakai K, Takenaka H
5732 - 5735	Neutron spin-echo labelling at OffSpec, an ISIS second target station project Plomp J, de Haan VO, Dalgliesh RM, Langridge S, van Well AA
5736 - 5740	Photochemical wet etching of silicon by synchrotron white X-ray radiation Cho IH, Kim DH, Ha SB, Noh DY
5741 - 5743	X-ray investigation of cleavage plane of single layered manganite La0.5Sr1.5MnO4 Wakabayashi Y, Upton MH, Grenier S, Hill JP, Nelson CS, Zheng H, Mitchell JF