1 - 5 |
Dependence of stresses on grain orientations in thin polycrystalline films on substrates: an explanation of the relationship between preferred orientations and stresses Zhang JM, Xu KW, Ji V |
6 - 13 |
The influence of chemical treatments on tungsten films found in integrated circuits Perry SS, Galloway HC, Cao P, Mitchell EJR, Koeck DC, Smith CL, Lim MS |
14 - 26 |
The role of impurities in bubble formation during directed light processing of tantalum Taylor TN, Lewis GK, Wayne DM, Fonseca JC, Dickerson PG |
27 - 35 |
The water formation rate on platinum and palladium as a function of the surface hydrogen pressure from three-dimensional hydrogen pressure distributions Johansson M, Ekedahl LG |
36 - 41 |
Polythiophene - O-3 surface reactions studied by XPS Heeg J, Kramer C, Wolter M, Michaelis S, Plieth W, Fischer WJ |
42 - 56 |
Ultra-short pulsed laser ablation of polymers Serafetinides AA, Makropoulou MI, Skordoulis CD, Kar AK |
57 - 64 |
Determination of Auger sensitivity factors for Al-rich quasicrystals Jenks CJ, Bloomer TE, Kramer MJ, Lograsso TA, Delaney DW, Ross AR, Sordelet DJ, Besser MF, Thiel PA |
65 - 72 |
Strain in coherent cobalt silicide islands formed by reactive epitaxy Bennett PA, Smith DJ, Robinson IK |
73 - 80 |
Properties of copper-doped ZnTe thin films by immersion in Cu solution Aqili AKS, Maqsood A, Ali Z |
81 - 86 |
The origins of the DX center formation in unintentionally doped GaN epilayers grown on sapphire substrates Kang TW, Park CS, Kim TW |
87 - 91 |
Microstructure and photoluminescence properties of as-deposited and annealed Si-rich a-Si1-xCx : H films Wang Y, Yue RF, Li GH, Han HX, Liao XB |
92 - 101 |
Laser-induced surface drilling of silicon carbide Sciti D, Bellosi A |
102 - 118 |
In situ Raman spectroscopic investigation of chromium surfaces under hydrothermal conditions Maslar JE, Hurst WS, Bowers WJ, Hendricks JH, Aquino MI, Levin I |
119 - 125 |
Nanoindentation studies of (111) GaAs/InP epilayers Navamathavan R, Arivuoli D, Attolini G, Pelosi C |
126 - 137 |
Effect of oxygen radical and oxygen ion irradiation on biaxially stretched poly(ethylene terephthalate) surface studied by sum-frequency generation Miyamae T, Yamada Y, Uyama H, Nozoye H |
138 - 161 |
A comparison of mode I fracture behavior of fcc and bcc metallic materials: a discrete dislocation analysis Columbus D, Grujicic M |
162 - 167 |
Microstructural and electrical properties of MgO thin films grown on p-InP (100) substrates at low temperature Kim TW, You YS |
168 - 172 |
Oxygen partial pressure dependence of suppressing oxidation-induced stacking fault generation in argon ambient annealing including oxygen and HCl Suzuki T |
173 - 183 |
Adsorption of small molecules on the Pt(100) single crystal surface studied by Disappearance Potential Spectroscopy Cholach AR, Tapilin VM |
184 - 184 |
Electroreflectance study of macroporous silicon surfaces (vol 172, pg 214, 2001) Holiney RY, Matveeva LA, Venger EF, Litvinenko OA, Karachevtseva LA |