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Proceedings of the 9th International Workshop on Slow Positron Beam Techniques for Solids and Surfaces, Dresden 2001 Brauer G, Anwand W |
2 - 3 |
Shoichiro Tanigawa (1943-2000) - In memoriam Fujinami M |
4 - 12 |
Positron beam development and design Zecca A |
13 - 15 |
A high-efficiency positron moderator using electro-polished tungsten meshes Saito F, Nagashima Y, Wei L, Itoh Y, Goto A, Hyodo T |
16 - 19 |
Improved tungsten moderator structures for slow positron beams Liszkay L, Kajcsos Z, Barthe MF, Henry L, Duplatre G, Nagy A |
20 - 23 |
Re-emission of slow positrons from tungsten at elevated temperatures Al-Qaradawi IY, Coleman PG |
24 - 28 |
A compact mono-energetic positron beam for re-emitted positron measurement Weng HM, Ling CC, Hui IP, Beling CD, Fung S |
29 - 31 |
Tests of a diamond field-assisted positron moderator Al-Qaradawi IY, Sellin PA, Coleman PG |
32 - 37 |
Submillimeter focusing of the University of Hong Kong positron beam Kwan PY, Fung S, Beling CD |
38 - 42 |
Target chamber for a slow positron beam: optimization of count rate and minimization of backscattering effects Oila J, Ranki V, Kivioja J, Saarinen K, Hautojarvi P |
43 - 46 |
Improvement of the electrostatic positron beam apparatus and observation system for RHEPD experiment Ishimoto T, Kawasuso A, Itoh H |
47 - 51 |
The design of an electrostatic variable energy positron beam for studies of defects in ceramic coatings and polymer films Abadjieva E, Schut H, Garcia AA, Galindo RE, van Veen A, Pimblott SM |
52 - 55 |
Development and application of the Ghent pulsed positron beam De Baerdemaeker J, Dauwe C |
56 - 60 |
Trap-based positron beams Greaves RG, Gilbert SJ, Surko CM |
61 - 70 |
Positron-defect interactions in complex systems Kuriplach J |
71 - 75 |
Atomic-based calculations of two-detector Doppler-broadening spectra Sterne PA, Asoka-Kumar P, Howell RH |
76 - 83 |
Positron lifetime and coincidence Doppler broadening study of vacancy-oxygen complexes in Si: experiments and first-principles calculations Hasegawa M, Tang Z, Nagai Y, Nonaka T, Nakamura K |
84 - 88 |
Positron characteristics of various SiO2 polymorphs Kuriplach J, Anwand W, Brauer G, Skorupa W |
89 - 96 |
Positron annihilation in SiO2-Si studied by a pulsed slow positron beam Suzuki R, Ohdaira T, Uedono A, Kobayashi Y |
97 - 100 |
Characterization of superlattices using positron annihilation Dekker J, Aavikko R, Saarinen K |
101 - 105 |
Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy Revesz AG, Anwand W, Brauer G, Hughes HL, Skorupa W |
106 - 111 |
Study of precipitate in Si-rich SiO2 films Brusa RS, Deng W, Karwasz GP, Zecca A, Mariotto G, Folegati P, Ferragut R, Dupasquier A |
112 - 115 |
Oxygen-related defects and their annealing behavior in low-dose Separation-by-IMplanted OXygen (SIMOX) wafers studied by slow positron beams Chen ZQ, Uedono A, Ogura A, Ono H, Suzuki R, Ohdaira T, Mikado T |
116 - 121 |
Defect study on ion-implanted Si by coincidence Doppler broadening measurements Akahane T, Fujinami A, Sawada T |
122 - 126 |
Shallow traps and positron dynamics in epitaxial silicon carbide Britton DT, Barthe MF, Corbel C, Desgardin P, Egger W, Sperr P, Kogel G, Triftshauser W |
127 - 130 |
The influence of substrate temperature on the evolution of ion implantation-induced defects in epitaxial 6H-SiC Anwand W, Brauer G, Wirth H, Skorupa W, Coleman PG |
131 - 135 |
Vacancy-type defects in 6H-SiC caused by N+ and Al+ high fluence co-implantation Anwand W, Brauer G, Skorupa W |
136 - 139 |
Strain relaxation induced by He-implantation at the Si1-xGex/Si(100) interface investigated by positron annihilation Liszkay L, Kajcsos Z, Barthe MF, Desgardin P, Hackbarth T, Herzog HJ, Hollander B, Mantl S |
140 - 144 |
Investigation of spatial distribution of defects in ultra-fine grained copper Cizek J, Prochazka I, Melikhova O, Brauer G, Anwand W, Kuzel R, Cieslar M, Islamgaliev RK |
145 - 149 |
The migration of defects and nitrogen atoms in nitrided surface layers of austenitic stainless steel followed by microscopic methods Jiraskova Y, Brauer G, Schneeweiss O, Blawert C, Anwand W, Coleman PG |
150 - 154 |
Investigation of defect distributions in neutron-irradiated and thermally treated reactor steels by positron annihilation Slugen V, Kogel G, Sperr P, Triftshauser W |
155 - 159 |
Positron diffusion in icosahedarl quasicrystals Sato K, Uchiyama H, Kanazawa I, Tamura R, Kimura K, Takeuchi S, Takeuchi T, Mizutani U |
160 - 167 |
Opportunities for materials characterization using high-energy positron beams Asoka-Kumar P, Howell R, Nieh TG, Sterne PA, Wirth BD, Dauskardt RH, Flores KM, Suh D, Odette GR |
168 - 175 |
Mechanical durability of polymeric coatings studied by positron annihilation spectroscopy: correlation between cyclic loading and free volumes Chen H, Peng Q, Huang YY, Zhang R, Mallon PE, Zhang J, Li Y, Wu Y, Richardson JR, Sandreczki TC, Jean YC, Suzuki R, Ohdaira T |
176 - 181 |
Durability of polymeric coatings: effects of natural and artificial weathering Mallon PE, Li Y, Zhang R, Chen H, Wu Y, Sandreczki TC, Jean YC, Suzuki R, Ohdaira T |
182 - 188 |
Study of interfaces in polymer bilayers using slow positron beam Tashiro M, Honda Y, Terashima Y, Watanabe M, Pujari PK, Tagawa S |
189 - 194 |
Porosity in porous methyl-silsesquioxane (MSQ) films Xu J, Moxom J, Yang S, Suzuki R, Ohdaira T |
195 - 199 |
Structural modification in electron-irradiated polyetherurethane Desgardin P, Barthe MF, Blondiaux G, Oudot B, Ravat B, Grivet M, Liszkay L |
200 - 209 |
Microscopes/microprobes Kogel G |
210 - 213 |
Improved defect profiling with slow positrons Krause-Rehberg R, Borner F, Redmann F, Egger W, Kogel G, Sperr P, Triftshauser W |
214 - 217 |
Vacancy clusters close to a fatigue crack observed with the Munchen scanning positron microscope Egger W, Kogel G, Sperr P, Triftshauser W, Rodling S, Bar J, Gudladt HJ |
218 - 223 |
Remodeling design of commercial transmission electron microscopes to positron-electron transmission microscopes Doyama M, Inoue M, Kogure Y, Hayashi Y, Yoshiie T, Kurihara T, Tsuno K |
224 - 233 |
New defect spectroscopies Beling CD |
234 - 238 |
Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR Eijt SWH, Falub CV, van Veen A, Schut H, Mijnarends PE |
239 - 244 |
In situ mechanical, temperature and gas exposure treatments of materials combined with variable energy positron beam techniques Schut H, van Veen A, Rivera A, van Huis MA, Garcia AA, Galindo RE |
245 - 249 |
In situ positron annihilation analysis produced by high energy photon-induced neutron deficient positron emitting nuclei Akers DW, Denison AB, Harmon F |
250 - 254 |
Electronic stability and noise reduction in Doppler broadening spectroscopy systems Ching HM, Zhang JD, Beling CD, Fung S |
255 - 259 |
Optimization of measurement parameters in Doppler broadening spectroscopy Pi XD, Burrows CP, Coleman PG |
260 - 263 |
Digital measurement of positron lifetime Rytsola K, Nissila J, Kokkonen J, Laakso A, Aavikko R, Saarinen K |
264 - 270 |
Surface physics with slow positron beams Coleman PG |
271 - 277 |
Desorption of protons from Ni and oxidized Ni surfaces with positron-induced ion-desorption spectroscopy Terashima Y, Arai R, Wada T, Kanazawa I, Ito Y, Fukutani K, Murata Y, Komori F |
278 - 282 |
Bi-directional phase transition of Cu/6H-SiC(0001) system discovered by positron beam study Zhang JD, Weng HM, Shan YY, Ching HM, Beling CD, Fung S, Ling CC |
283 - 286 |
Investigation of positron work function and moderation efficiency of Ni, Ta, Pt and W(100) Hugenschmidt C, Strasser B, Schreckenbach K |
287 - 290 |
Reflection high-energy positron diffraction at solid surfaces by improved electrostatic positron beam Kawasuso A, Ishimoto T, Okada S, Itoh H, Ichimiya A |
291 - 295 |
Surface analysis of a well-aligned carbon nanotube film by positron-annihilation induced Auger-electron spectroscopy Ohdaira T, Suzuki R, Kobayashi Y, Akahane T, Dai L |
296 - 300 |
The development of the intense positron beam at Washington State University Hunt AW, Pilant L, Cassidy DB, Tjossem R, Shurtliff M, Weber MH, Lynn KG |
301 - 306 |
Atomic physics of positronium with intense slow positron beams Ley R |
307 - 311 |
Precision study of positronium and precision tests of the bound state quantum electrodynamics Karshenboim SG |
312 - 316 |
The ATHENA positron accumulator van der Werf DP, Jorgensen LV, Watson TL, Charlton M, Collier MJT, Doser M, Funakoshi R |
317 - 324 |
Development of a position-sensitive gamma-ray detector to measure annihilation points of ortho-positronium Mondal NN, Hirose T |