Applied Surface Science

Applied Surface Science, Vol.171, No.3-4 Entire volume, number list

ISSN: 0169-4332 (Print)

In this Issue (16 articles)

175 - 188	Magnetite scale cluster adhesion on metal oxides surfaces: atomistic simulation study Ohira T, Inoue Y, Murata K, Murayama J
189 - 196	Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements Arnault JC, Knoll A, Smigiel E, Cornet A
197 - 206	Secondary electron emission data of cesiated oxygen free high conductivity copper(II) Hopman HJ, Zeijlemaker H, Verhoeven J
207 - 212	Capacitance-voltage characteristic of anisotype heterojunction in the presence of interface states and series resistance Chattopadhyay P, Haldar DP
213 - 225	Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces Basnar B, Friedbacher G, Brunner H, Vallant T, Mayer U, Hoffmann H
226 - 230	Surface modification of oxide thin film and its gas-sensing properties Tong MS, Dai GR, Gao DS
231 - 241	Reversible phase change in BixSe100-x chalcogenide thin films for using as optical recording medium Hafiz MM, El-Shazly O, Kinawy N
242 - 251	Discoloration of marble during laser cleaning by Nd : YAG laser wavelengths Klein S, Fekrsanati F, Hildenhagen J, Dickmann K, Uphoff H, Marakis Y, Zafiropulos V
252 - 256	An organic functional group introduced to Si(111) via silicon-carbon bond: a liquid-phase approach Okubo T, Tsuchiya H, Sadakata M, Yasuda T, Tanaka K
257 - 264	Evaporation of silver thin films on mica Levlin M, Laakso A
265 - 274	Spectromicroscopy of interfacial interactions between thin Ni films and a Au-Si surface Gregoratti L, Barinov A, Casalis L, Kiskinova M
275 - 282	Cu wetting and interfacial stability on clean and nitrided tungsten surfaces Ekstrom BM, Lee S, Magtoto N, Kelber JA
283 - 287	HREELS study of electron irradiation effects on ammonia adsorbed on the Ge (100) surface Sanders M, Craig JH
288 - 305	Characterisation of surface processes on metals under pulsed picosecond laser irradiation by photoelectric work function measurements Vouagner D, Beleznai C, Girardeau-Montaut JP
306 - 313	The cadmium seleniophosphate (CdPSe3) XPS and XAES spectra Calareso C, Grasso V, Silipigni L
314 - 327	Energy loss spectra of thin films of aluminum on niobium Wu ZB, Dickey JM