179 - 184 |
Fabrication and characterization of GaAs MIS devices with N-rich PECVD SixNy dielectric Pal S, Bose DN |
185 - 190 |
Composition structure and magnetisation of rf plasma nitrided 304 stainless steel El-Hossary FM, Negm NZ |
191 - 195 |
XPS and AES investigation of nanometer composite coatings of Ni-P-ZnX on steel surface (ZnX = ZnSnO3, Zn-3(PO4)(2), ZnSiO3) Pan T, Ma MH, Xin FB, Xin XQ |
196 - 200 |
Fabrication of chromium oxide nanoparticles by laser-induced deposition from solution Zhong ZC, Cheng RH, Bosley J, Dowben PA, Sellmyer DJ |
201 - 210 |
In situ XPS studies of thermally deposited potassium on poly (p-phenylene vinylene) and its ring-substituted derivatives Li S, Kang ET, Neoh KG, Ma ZH, Tan KL, Huang W |
211 - 224 |
Characterization of uranium oxide thin films grown from solution onto Fe surfaces Qiu SR, Amrhein C, Hunt ML, Pfeffer R, Yakshinskiy B, Zhang L, Madey TE, Yarmoff JA |
225 - 233 |
Laser-induced breakdown spectroscopy for on-line control of selective removal of cobalt binder from tungsten carbide hardmetal by pulsed UV laser surface ablation Li TJ, Lou QH, Wei YR, Huang F, Dong JX, Liu JR |
234 - 238 |
Synthesis of well-aligned carbon nanotube network on a gold-patterned quartz substrate Cao AY, Zhang XF, Xu CL, Liang J, Wu DH, Wei BQ |
239 - 247 |
Observation of short-wavelength recorded marks in TeOx thin film by atomic force microscopy Li QH, Gan FX |
248 - 254 |
Controlled synthesis of aligned carbon nanotube arrays on catalyst patterned silicon substrates by plasma-enhanced chemical vapor deposition Wang H, Lin J, Huan CHA, Dong P, He J, Tang SH, Eng WK, Thong TLJ |
255 - 264 |
Electrical conductivity of gamma-Al2O3 at atmospheric pressure under dehydrating/hydrating conditions Caldararu M, Postole G, Hornoiu C, Bratan V, Dragan M, Ionescu NI |
265 - 276 |
Adsorption and dissociation reaction of carbon dioxide on Ni(111) surface: molecular orbital study Choe SJ, Kang HJ, Park DH, Huh DS, Park J |
277 - 282 |
Some structural studies on successive ionic layer adsorption and reaction (SILAR)-deposited US thin films Lokhande CD, Sankapal BR, Pathan HM, Muller M, Giersig M, Tributsch H |
283 - 295 |
Development of a technique to prevent radiation damage of chromate conversion coatings during X-ray photoelectron spectroscopic analysis Chidambaram D, Halada GP, Clayton CR |
296 - 306 |
The chemisorption of organophosphorus compounds at an Al(111) surface Davies PR, Newton NG |
307 - 316 |
Structure and morphology of self-assembled 3-mercaptopropyltrimethoxysilane layers on silicon oxide Hu MH, Noda S, Okubo T, Yamaguchi Y, Komiyama H |
317 - 326 |
Determination of pyrrole-aniline copolymer compositions by X-ray photoelectron spectroscopy Lim VWL, Kang ET, Neoh KG, Ma ZH, Tan KL |
327 - 330 |
The fractal dimension of boron-doped diamond films Silva LLG, Ferreira NG, Dotto MER, Kleinke MU |
331 - 338 |
The effect of postdeposition annealing on chemical bonding in amorphous carbon nitride films prepared by dc magnetron sputtering Jiang LD, Fitzgerald AG, Rose MJ |
339 - 348 |
Influence of structure development on atomic layer deposition of TiO2 thin films Aarik J, Karlis J, Mandar H, Uustare T, Sammelselg V |