Applied Surface Science

Applied Surface Science, Vol.239, No.3-4 Entire volume, number list

ISSN: 0169-4332 (Print)

In this Issue (31 articles)

255 - 258	Study of well adherent DLC film deposited on piezoelectric LiTaO3 substrate Tian J, Zhang Q, Zhou Q, Yoon SF, Ahn J, Wang SG, Li JQ, Yang DJ
259 - 261	The critical layer number of epitaxially grown Cu and Ni films with strained structure Li JC, Liu W, Jiang Q
262 - 267	Metal-based transparent heat mirror for ultraviolet curing applications Wang ZG, Chen QL, Cai X
268 - 272	Wirelike growth of self-assembled hafnium silicides: oxide mediated epitaxy Lee JH
273 - 278	Calculation of the surface binding energy for ion sputtered particles Kudriavtsev Y, Villegas A, Godines A, Asomoza R
279 - 284	Magnetic domain structure in small diameter magnetic nanowire arrays Qin DH, Zhang HL, Xu CL, Xu T, Li HL
285 - 291	Synthesis and characterization of nanostructured titania film for photocatalysis Zhao L, Yu Y, Song LX, Hu XF, Larbot A
292 - 301	Preparation and characterization of alkyl sulfate and alkylbenzene sulfonate surfactants/TiO2 hybrid thin films by the liquid phase deposition (LPD) method Li L, Mizuhata M, Deki S
302 - 310	Evaluation of phase, composition, microstructure and properties in TiC/a-C : H thin films deposited by magnetron sputtering Gulbinski W, Mathur S, Shen H, Suszko T, Gilewicz A, Warcholinski B
311 - 319	Influence of atomic-scale irregularities in fractal analysis of electrode surfaces Eftekhari A, Kazemzad M, Keyanpour-Rad M
320 - 326	Preparation and modification of well-aligned CNTs grown on AAO template Xu JM, Zhang XB, Fei C, Li T, Li Y, Tao XY, Wang YW, Wu XJ
327 - 334	AIN thin films fabricated by ultra-high vacuum electron-beam evaporation with ammonia for silicon-on-insulator application Zhu M, Chen P, Fu RKY, Liu WL, Lin CL, Chu PK
335 - 341	Fabrication of contact electrodes in Si for nanoelectronic devices using ion implantation Kim JC, Kline JS, Tucker JR
342 - 352	Corrosion behavior of tin ions implanted zirconium in 1N H2SO4 Peng DQ, Bai XD, Chen XW, Zhou QG, Liu XY, Yu RH, Deng PY
353 - 366	Monte Carlo simulations of controlled rate thermal analysis spectra -The influence of surface energetic heterogeneity and lateral interactions between adsorbed molecules Panczyk T, Villieras F
367 - 375	Chemical alteration of poly(vinyl fluoride) Tedlar by hyperthermal atomic oxygen Hoflund GB, Everett ML
376 - 380	A modified Stillinger-Weber empirical potential for boron nitride Moon WH, Hwang HJ
381 - 386	Heat affected zone in aluminum single crystals submitted to femtosecond laser irradiations Valette S, Audouard E, Le Harzic R, Huot N, Laporte P, Fortunier R
387 - 393	Some anomalies in the regularities of the SER spectra of benzene and hexafluorobenzene Polubotko AM
394 - 397	Room temperature near-field photoluminescence of zinc-blend and wurtzite ZnO structures Lee GH, Kawazoe T, Ohtsu M
398 - 409	Electrochemical synthesis of polythiophene on nickel coated mild steel and corrosion performance Tuken T, Yazici B, Erbil M
410 - 423	Hydrophobic recovery of UV/ozone treated poly(dimethylsiloxane): adhesion studies by contact mechanics and mechanism of surface modification Olah A, Hillborg H, Vancso GJ
424 - 431	Bistable mean-field kinetics of CO oxidation on Pt with oxide formation Carlsson PA, Zhdanov VP, Kasemo B
432 - 436	Influence of heat treatment on field emission characteristics of boron nitride thin films Li WQ, Gu GR, Li YG, He Z, Feng W, Liu LH, Zhao CH, Zhao YN
437 - 444	Study on electron emission suppression characteristic of molybdenum grid coated with Hf film by ion beam assisted deposition Jiang J, Jiang BY, Ren C, Feng T, Wang X, Liu XH, Zou SC
445 - 450	Direct measurement of sidewall roughness of polymeric optical waveguides Pani SK, Wong CC, Sudharsanam K, Lim V
451 - 457	Epitaxial growth of well-ordered ultra-thin Al2O3 film on NiA1 (110) by a single-step oxidation Lay TT, Yoshitake M, Song W
458 - 463	A novel gate structure in large diagonal size printable CNT-FED Wang QL, Lei W, Zhang XB, Wang BP, Liu M, Zhou XD, Di YS, Ma XY
464 - 469	Photoemission study of interfacial reactions during annealing of ultrathin yttrium on SiO2/Si(100) 0 0) Wang ZM, Wu JX, Fang Q, Zhang JY
470 - 480	Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy Powell CJ, Jablonski A, Werner WSM, Smekal W
481 - 489	Effect of series resistance on the performance of silicon Schottky diode in the presence of tin oxide layer Tugluoglu N, Karadeniz S, Altindal S