219 - 219 |
Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy (vol 239, pg 470, 2005) Powell CJ, Jablonski A, Werner WSM, Smekal W |
220 - 235 |
Monte Carlo simulations of electron transport in solids: applications to electron backscattering from surfaces Jablonski A, Powell CJ |
236 - 244 |
Structural evolution in films of alloy Zn70Al27Cu3 (ZA27) Zhu YH, Lee WB, Mei Z, To S, Sze YK |
245 - 250 |
AFM surface imaging of AISI D2 tool steel machined by the EDM process Guu YH |
251 - 255 |
Influence of nanoscale topography on the hydrophobicity of fluoro-based polymer thin films Gerbig YB, Phani AR, Haefke H |
256 - 260 |
Defect-related photoluminescence of silicon nanoparticles produced by pulsed ion-beam ablation in vacuum Zhu XP, Yukawa T, Hirai M, Suzuki T, Suematsu H, Jiang WH, Yatsui K |
261 - 269 |
Structure and properties of diamond-like carbon nanocomposite films containing copper nanoparticles Chen CC, Hong FCN |
270 - 275 |
Initial adsorption and C-incorporation of organosilanes at Si(001) investigated by temperature-programmed desorption Senthil K, Suemitsu M |
276 - 280 |
Synchrotron radiation stimulated etching SiO2 thin films with a contact cobalt mask Wang CS, Urisu T |
281 - 286 |
Preparation of silica encapsulated CdSe quantum dots in aqueous solution with the improved optical properties Zhou XP, Kobayashi Y, Romanyuk V, Ochuchi N, Takeda M, Tsunekawa S, Kasuya A |
287 - 294 |
Tribological behavior of self-assembled double layer measured by a pin-on-plate method Nakano M, Ishida T, Numata T, Ando Y, Sasaki S |
295 - 303 |
Direct growth of CdTe(100) epilayers on Si(100) substrate by hot wall epitaxy Lalev GM, Wang JF, Lim JW, Abe S, Masumoto K, Isshiki M |
304 - 312 |
Investigation of lattice defects in the early stage of fatigue in iron by positron annihilation techniques Hori F, Koike K, Oshima R |
313 - 317 |
Electrical and reliability characteristics of HfO2 gate dielectric treated in N-2 and NH3 plasma atmosphere Kim JH, Choi KJ, Yoon SG |
318 - 325 |
X-ray photoelectron spectroscopy study on Ba(1-x)EuxTiO(3) Lu DY, Sugano M, Sun XY, Su WH |
326 - 332 |
Microstructure and tribological properties of electrodepo sited Ni-Co alloy deposits Wang LP, Gao Y, Xue QJ, Liu HW, Xu T |
333 - 338 |
Analysis of porous oxide film growth on aluminum in phosphoric acid using re-anodizing technique Vrublevsky I, Parkoun V, Schreckenbach J |
339 - 345 |
Wettability of porous polydimethylsiloxane surface: morphology study Khorasani MT, Mirzadeh H, Kermani Z |
346 - 352 |
Influence of different post-treatments on the structure and optical properties of zinc oxide thin films Hong RJ, Huang JB, He HB, Fan ZX, Shao JD |
353 - 361 |
Water formation on Pt(111) surfaces at high temperatures studied by kinetic Monte Carlo simulations Hu R, Huang SP, Liu ZP, Wang WC |
362 - 368 |
CO2 laser cutting of advanced high strength steels (AHSS) Lamikiz A, de Lacalle LNL, Sanchez JA, del Pozo D, Etayo JM, Lopez JM |
369 - 374 |
A simple diffusion model for the growth kinetics of gamma' iron nitride on the pure iron substrate Keddam M, Djeghlal ME, Barrallier L |
375 - 379 |
Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness Barna A, Menyhard A, Zalar A, Panjan P |
380 - 391 |
AuPd alloy formation in Au-Pd/Al2O3 catalysts and its role on aromatics hydrogenation Pawelec B, Venezia AM, La Parola V, Cano-Serrano E, Campos-Martin JM, Fierro JLG |
392 - 398 |
In-situ monitoring and analysis of GaSb(100) substrate deoxidation Moller K, Toben L, Kollonitsch Z, Giesen C, Heuken M, Willig F, Hannappel T |
399 - 406 |
A pyrazine derivative as corrosion inhibitor for steel in sulphuric acid solution Bouklah M, Attayibat A, Kertit S, Ramdani A, Hammouti B |
407 - 411 |
Field emission from hafnium oxynitride films prepared by ion beam-assisted deposition Wang YJ, Zhang JH, Zhang FM, Zhang F, Zou SC |
412 - 418 |
Temperature dependence of current-voltage characteristics of Ag/p-SnS Schottky barrier diodes Sahin M, Safak H, Tugluoglu N, Karadeniz S |
419 - 427 |
Microscale chemical and electrostatic surface patterning of Dow Cyclotene by N-2 plasma Yang DQ, Poulin S, Martinu L, Klemberg-Sapieha JE, Zabeida O, Sacher E |
428 - 436 |
Photo-electron emission and atomic force microscopies of the hydrogen etched 6H-SiC(0001) surface and the initial growth of GaN and AlN Hartman JD, Naniwae K, Petrich C, Nemanich R, Davis RF |
437 - 442 |
Annealing effects on electron-beam evaporated Al2O3 films Shang SZ, Lei C, Hou HH, Yi K, Fan ZX, Shao JD |