3093 - 3093 |
Special issue - SLOPOS-10 - Proceedings of the Tenth International Workshop on Slow Positron Beam Techniques for Solids and Surfaces -Doha, Qatar, March 19-25, 2005 - Preface Al-Qaradawi I, Coleman P |
3094 - 3097 |
In memory of Tom van Veen (1942-2004) Schut H, Jorgensen LV |
3098 - 3105 |
First positron experiments at NEPOMUC Hugenschmidt C, Schreckenbach K, Stadlbauer M, Strasser B |
3106 - 3110 |
EPOS - An intense positron beam project at the ELBE radiation source in Rossendorf Krause-Rehberg R, Sachert S, Brauer G, Rogov A, Noack K |
3111 - 3120 |
Planned positron experiments at FRM-II Kogel G, Dollinger G |
3121 - 3125 |
Design of a new type positron beam system Wu YC, Wang B, Wang SJ |
3126 - 3131 |
Transmission positron microscopes Doyama M, Kogure Y, Inoue M, Kurihara T, Yoshiie T, Oshima R, Matsuya M |
3132 - 3137 |
Performance of a slow positron beam using a hybrid lens design Cheung CK, Naik PS, Beling CD, Fung S, Weng HM |
3138 - 3142 |
Preliminary studies on a variable energy positron annihilation lifetime spectroscopy system Kwan PY, Cheung CK, Beling CD, Fung S |
3143 - 3147 |
The design of the main accelerator for a pulsed positron beam Pelli A, Laakso A, Rytsola K, Saarinen K |
3148 - 3153 |
Determination of the timing properties of a pulsed positron lifetime beam by the application of an electron gun and a fast microchannel plate Laakso A, Pelli A, Rytsola K, Saarinen K, Hautojarvi P |
3154 - 3158 |
Compact positron beam for measurement of transmission moderator efficiencies and positron yields of encapsulated sources Reurings F, Laakso A, Rytsola K, Pelli A, Saarinen K |
3159 - 3165 |
Intense slow positron production at the 15 MeV LINAC at Argonne National Laboratory Chen HM, Jean YC, Jonah CD, Chemerisov S, Wagner AF, Schrader DM, Hunt AW |
3166 - 3171 |
Applications of slow positrons to cancer research: Search for selectivity of positron annihilation to skin cancer Jean YC, Li Y, Liu G, Chen HM, Zhang JJ, Gadzia JE |
3172 - 3182 |
Positron beam studies of transients in semiconductors Beling CD, Ling CC, Cheung CK, Naik PS, Zhang JD, Fung S |
3183 - 3187 |
Real-time full spectrum fitting of beam-based Doppler broadening data Coleman PG, Burrows CP, Mason RE |
3188 - 3193 |
Positron lifetime and microstructural characterisation of a-Si : H deposited by low temperature HW-CVD on paper substrates Harting A, Britton DT, Knoesen D, Egger W |
3194 - 3200 |
Local structure reconstruction in hydrogenated amorphous silicon from angular correlation and synchrotron diffraction studies Britton DT, Minani E, Knoesen D, Schut H, Eijt SWH, Furlan F, Giles C, Harting M |
3201 - 3208 |
Electrical properties of MOS structures on nitrogen-doped Czochralski-grown silicon: A positron annihilation study Slugen V, Harmatha L, Tapaina M, Ballo P, Pisecny P, Sik J, Kogel G, Krsjak V |
3209 - 3214 |
Self-implantation of Cz-Si: Clustering and annealing of defects Abdulmalik DA, Coleman PG, Al-Qaradawi IY |
3215 - 3220 |
Investigations of He+ implantation and subsequent annealing effects in InP Al-Qaradawi IY |
3221 - 3227 |
Positron annihilation studies of mesoporous silica films using a slow positron beam He CQ, Muramatsu M, Ohdaira T, Kinomura A, Suzuki R, Ito K, Kabayashi Y |
3228 - 3230 |
A technique for positron spectroscopy of monovacancies formed by low-temperature ion implantation of silicon Mason RE, Coleman PG |
3231 - 3236 |
Modifications of He implantation induced cavities in silicon by MeV silicon implantation Desgardin P, Barthe MF, Ntsoenzok E, Liu CL |
3237 - 3244 |
Defect studies of hydrogen-loaded thin Nb films Cizek J, Prochazka I, Brauer G, Anwand W, Mucklich A, Kirchheim R, Pundt A, Bahtz D, Knapp M |
3245 - 3251 |
Defects in nanocrystalline Nb films: Effect of sputtering temperature Cizek J, Melikhova O, Prochazka I, Brauer G, Anwand W, Mucklich A, Kirchheim R, Pundt A |
3252 - 3255 |
Positron and deuteron depth profiling in helium-3-implanted electrum-like alloy Grynszpan RI, Baclet N, Darque A, Flament JL, Zielinski F, Anwand W, Brauer G |
3256 - 3261 |
Vacancy defects induced in sintered polished UO2 disks by helium implantation Labrim H, Barthe MF, Desgardin P, Sauvage T, Blondiaux G, Corbel C, Piron JP |
3262 - 3268 |
Thermal evolution of vacancy defects induced in sintered UO2 disks by helium implantation Labrim H, Barthe MF, Desgardin P, Sauvage T, Blondiaux G, Corbel C, Piron JP |
3269 - 3273 |
Spatially resolved investigation of thermally treated brass with a coincidence Doppler spectrometer Stadlbauer M, Hugenschmidt C, Piochacz C, Strasser B, Schreckenbach K |
3274 - 3277 |
Slow positron beam study of corrosion-related defects in pure iron Wu YC, Chen YQ, Wang B, Wang SJ, Jean YC, Suzuki R, Ohdaira T |
3278 - 3284 |
Hydrogen damage in AISI 304 stainless steel studied by Doppler broadening Wu YC, Jean YC |
3285 - 3289 |
Vacancy-solute complexes in aluminum Melikhova O, Kuriplach J, Cizek J, Prochazka I |
3290 - 3296 |
Assessment of the correlation between mechanical testing and positron annihilation outcomes for RPV model alloys Zeman A, Debarberis L, Slugen V, Acosta B |
3297 - 3302 |
Studying the recovery of as-received industrial Al alloys by positron annihilation spectroscopy Abdel-Hady EE, Ashry A, Ismail H, El-Gamal S |
3303 - 3308 |
Vacancy-solute complexes and their clusters in iron Kuriplach J, Melikhova O, Domain C, Becquart CS, Kulikov D, Malerba L, Hou M, Almazouzi A, Duque CA, Morales AL |
3309 - 3315 |
Positron study of radiation embrittlement of steels used in water cooled, water moderated energy reactors Slugen V, Zeman A, Petriska M, Krsjak V |
3316 - 3322 |
The effect of gamma irradiation and shelf aging in air on the oxidation of ultra-high molecular weight polyethylene Al-Ma'adeed MA, Al-Quadawi IY, Madi N, Al-Thani NJ |
3323 - 3326 |
Effect of rare earth substitutions on some physical properties of Mn-Zn ferrite studied by positron annihilation lifetime spectroscopy Samy AM, Mostafa N, Gomaa E |
3327 - 3332 |
Positron trapping at quantum-dot-like particles on metal surfaces Fazleev NG, Fry JL, Nadesalingam MP, Weiss AH |
3333 - 3341 |
Surface states and annihilation characteristics of positrons trapped at reconstructed semiconductor surfaces Fazleev NG |
3342 - 3351 |
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies Brauer G, Anwand W, Eichhorn F, Skorupa W, Hofer C, Teichert C, Kuriplach J, Cizek J, Prochazka I, Coleman PG, Nozawa T, Kohyama A |
3352 - 3361 |
Relevance of slow positron beam research to astrophysical studies of positron interactions and annihilation in the interstellar medium Guessoum N, Jean P, Gillard W |
3362 - 3367 |
Analytic simulation of the backscattering of hundreds eV positrons from elemental solids Chaoui Z |
3368 - 3371 |
Further indication of a low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy Brauer G, Becvar F, Anwand W, Skorupa W |
3372 - 3374 |
Positron beam studies of solids and surfaces: A summary Coleman PG |