In this paper, a Schottky barrier polycrystalline silicon thin-film transistor (SB TFT) with erbium silicide source/drain is demonstrated using low temperature processes. A low temperature oxide is used for a gate dielectric and the transistor channel is crystallized by a metal-induced lateral crystallization process. An n-type SB TFT shows a normal electrical performance with subthreshold slope of 239 mV/dec, I(ON)/I(OFF) ratio of 5.8 x 10(4) and I(ON) of 2 mu A/mu m at V(G)=3 V, V(D) = 2.5 V for 0.1 mu m device. A process temperature is maintained at less than 600 degrees C throughout the whole processes. The SB TFT is expected to be a promising candidate for a next system-on-glass technology and an alternative 3D integration technology. (C) 2008 Elsevier B.V. All rights reserved.