Solid Immersion Facilitates Fluorescence Microscopy with Nanometer Resolution and Sub-Angstrom Emitter Localization

Wildanger D; Patton BR; Schill H; Marseglia L; Hadden JP; Knauer S; Schonle A; Rarity JG; O'Brien JL; Hell SW; Smith JM

Advanced Materials, Vol.24, No.44, OP309-OP309, 2012

DOI10.1002/adma.201203033 Export Citation

Solid Immersion Facilitates Fluorescence Microscopy with Nanometer Resolution and Sub-Angstrom Emitter Localization

Wildanger D, Patton BR, Schill H, Marseglia L, Hadden JP, Knauer S, Schonle A, Rarity JG, O'Brien JL, Hell SW, Smith JM

Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 +/- 0.3 nm and with a localization precision of 0.09 nm.