Journal of Crystal Growth, Vol.401, 547-549, 2014
High-temperature growth and characterization of (Er,Yb):YAI(3)(BO3)(4) and NdAl3(BO3)(4) epitaxial layers
Er0.04Y0.96,Al-3(BO3)(4), Er0.015Yb0.11Y0.575Al3(BO3)(4) and NdAl3(BO3)(4) epitaxial layers were grown from K2Mo3010-based fluxed melts by an LPE method. SGDS grown YAI(3)(BO3)(4) and NdAl3(BO3)(4) single crystals were used as substrates. Growth kinetics, homogeneity and micromorphology of (Er,Yb):YAI(3)(BO3)(4) (Er,Yb): YAI(3)(BO3)(4) and NdAl3(BO3)(4) thin films were investigated. (C) 2014 Elsevier B.V. All rights reserved.