은 나노입자가 함침된 Poly (3, 4-ethylenedioxythiphene) : poly (styrenesulfonate)필름의 전자 구조상태에 미치는 열처리효과 연구

왕석주; 이초영; 박형호; Seok-Joo Wang; Cho-Young Lee; Hyung-Ho Park

Korean Journal of Materials Research, Vol.18, No.9, 503-506, September, 2008

DOI10.3740/MRSK.2008.18.9.503 Export Citation

은 나노입자가 함침된 Poly (3, 4-ethylenedioxythiphene) : poly (styrenesulfonate)필름의 전자 구조상태에 미치는 열처리효과 연구

Effect of Annealing Temperature with Silver Nanoparticles Incorporation on the Electronic Structure of Poly (3, 4-ethylenedioxythiphene) : poly (styrenesulfonate) Film

왕석주, 이초영, 박형호^†

연세대학교 신소재공학과

Seok-Joo Wang, Cho-Young Lee, and Hyung-Ho Park^†

Department of Ceramic Engineering, Yonsei University, 134 Shinchon-dong, Seodaemun-gu, Seoul 120-749, Korea

E-mail:

The effect of silver nanoparticles (NPs) incorporation on the electronic properties of poly (3, 4- ethylenedioxythiphene) : poly(styrenesulfonate) (PEDOT : PSS) films was investigated. The surface of silver NPs was stabilized with trisodium citrate to control the size of silver NPs and prevent their aggregation. We obtained ca. 5 nm sized silver NPs and dispersed NPs in PEDOT : PSS solution. Sheet resistance, surface morphology, bonding state, and work function values of the PEDOT : PSS films were modified by silver NPs incorporation as well as annealing temperature. Sodium in silver NPs solution could lead to a decrease of work function of PEDOT : PSS; however, large content of silver NPs have an effect on the increase in work function, resulting from charge localization on the silver NPs and a decrease in the number of charge-trapping-related defects by chemical bond formation.

Keywords:PEDOT : PSS;silver;nanoparticle;work function;charge localization

[References]

Friend RH, Gymer RW, Holmes AB, Burroughes JH, Marks RN, Taliani C, Bradley DDC, Dos Santos DA, Bredas JL, Logdlund M, Salaneck WR, Nature, 397(6715), 121 (1999)
Dimitrakopoulos CD, Malenfant PRL, Adv. Mater., 14(2), 99 (2002)
Kim JS, Friend RH, Cacialli F, Appl. Phys. Lett., 74, 3084 (1999)
Lin YJ, Chou WY, Lin ST, Appl. Phys. Lett., 88, 071108 (2006)
Lu J, Pinto NJ, MacDiarmid AG, J. Appl. Phys., 92, 6033 (2002)
Koch N, Ghijsen J, Pireaux JJ, Schwartz J, Johnson RL, Elschaner A, Kahn A, Appl. Phys. Lett., 82, 70 (2003)
Koch N, Vollmer A, Appl. Phys. Lett., 89, 162107 (2006)
Mock JJ, Smith DR, Schultz S, Nano. Lett., 3, 485 (2003)
Murphy CJ, Jana NR, Adv. Mater., 14(1), 80 (2002)
Stott TL, Wolf MO, Coordin, Coordin. Chem. Rev., 246, 89 (2003)
Stott TL, Wolf MO, Coord. Chem. Rev., 246, 89 (2003)
Rodriguez-Gattorno G, Diaz D, Rendon L, Hernandez-Segura GO, J. Phys. Chem. B, 106(10), 2482 (2002)
Schnabel W, Polymer degradation: Principles and Practical Applications, p. 25-63, Macmillan Publishing Co. Inc., New York (1981). (1981)
Greczynski G, Kugler T, Salaneck WR, Thin Solid Films, 354(1-2), 129 (1999)
Kim WH, Kushto GP, Kim H, Kafafi ZH, J. Polym. Sci. B: Polym. Phys., 41(21), 2522 (2003)
Weijtens CHL, Van Elsbergen V, De Kok MM, De Winter SHPM, Org. Electron., 6, 97 (2005)

[Referenced By]

[1] Friend RH, Gymer RW, Holmes AB, Burroughes JH, Marks RN, Taliani C, Bradley DDC, Dos Santos DA, Bredas JL, Logdlund M, Salaneck WR, Nature, 397(6715), 121 (1999)

[2] Dimitrakopoulos CD, Malenfant PRL, Adv. Mater., 14(2), 99 (2002)

[3] Kim JS, Friend RH, Cacialli F, Appl. Phys. Lett., 74, 3084 (1999)

[4] Lin YJ, Chou WY, Lin ST, Appl. Phys. Lett., 88, 071108 (2006)

[5] Lu J, Pinto NJ, MacDiarmid AG, J. Appl. Phys., 92, 6033 (2002)

[6] Koch N, Ghijsen J, Pireaux JJ, Schwartz J, Johnson RL, Elschaner A, Kahn A, Appl. Phys. Lett., 82, 70 (2003)

[7] Koch N, Vollmer A, Appl. Phys. Lett., 89, 162107 (2006)

[8] Mock JJ, Smith DR, Schultz S, Nano. Lett., 3, 485 (2003)

[9] Murphy CJ, Jana NR, Adv. Mater., 14(1), 80 (2002)

[10] Stott TL, Wolf MO, Coordin, Coordin. Chem. Rev., 246, 89 (2003)

[11] Stott TL, Wolf MO, Coord. Chem. Rev., 246, 89 (2003)

[12] Rodriguez-Gattorno G, Diaz D, Rendon L, Hernandez-Segura GO, J. Phys. Chem. B, 106(10), 2482 (2002)

[13] Schnabel W, Polymer degradation: Principles and Practical Applications, p. 25-63, Macmillan Publishing Co. Inc., New York (1981). (1981)

[14] Greczynski G, Kugler T, Salaneck WR, Thin Solid Films, 354(1-2), 129 (1999)

[15] Kim WH, Kushto GP, Kim H, Kafafi ZH, J. Polym. Sci. B: Polym. Phys., 41(21), 2522 (2003)

[16] Weijtens CHL, Van Elsbergen V, De Kok MM, De Winter SHPM, Org. Electron., 6, 97 (2005)