X선 조사에 의해 (Ba, Sr) FBr : Eu 형광 물질에 생성되는 결함 특성

신중기; 이종용; 배석환; 김재홍; 권준현; Jung-Ki Shin; Chong-Yong Lee; Seok Hwan Bae; Jae-Hong Kim; Jun-Hyun Kwon

Korean Journal of Materials Research, Vol.18, No.8, 427-431, August, 2008

DOI10.3740/MRSK.2008.18.8.427 Export Citation

X선 조사에 의해 (Ba, Sr) FBr : Eu 형광 물질에 생성되는 결함 특성

Defect Analysis of Phospher (Ba, Sr) FBr : Eu by X-Ray Irradiation

신중기, 이종용^†, 배석환¹, 김재홍², 권준현³

한남대학교 이과대학 물리학과
¹건양대학교 병원 영상의학과
²한국원자력의학원 방사선물리공학부
³한국원자력연구소 원자력 재료기술개발부

Jung-Ki Shin, Chong-Yong Lee^†, Seok Hwan Bae¹, Jae-Hong Kim², and Jun-Hyun Kwon³

Department of Physics, Hannam University, Korea
¹Department of Radiology, Konyang University Hospital, Korea
²Division of Radiation Physical Engineering, KIRAM, Seoul, Korea
³Nuclear Materials Technology Division, KAERI, Korea

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The mechanical property of a phosphore layer was investigated by measuring the resolution (LP/mm) and by positron annihilation spectroscopy and SEM. Image plate samples containing the phosphore layer were irradiated by X-rays in a hospital numerous times over a course of several years. The LP/mm values of a (Ba,Sr)FBr : Eu image plate irradiated by X-rays varied between 2.2 and 2.0 over a period of four years. Coincidence Doppler Broadening (CDB) positron annihilation spectroscopy was used to analyze defect structures. The S parameters of the samples from hospital use varied from 0.6219 to 0.6232. There was a positive relationship between the time of exposure to the X-rays and the S parameters. Most of the defects were found to have been generated by X-rays.

Keywords:(Ba,Sr)FBr : Eu;image plate;Phosphor;S parameters defect

[References]

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Miyahara J, Science and Technology of Japan, 26, 28 (1985)
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Lee CY, Kim CG, Song GY, Kim JH, Korean J. Mater. Res., 15(6), 370 (2005)
Lee CY, Bae SH, Kim JH, Kwon JH, Korean J. Mater. Res., 16(7), 455 (2006)
Lee CY, Kwon JH, Kim HH, Jeong JM, J. Kor. Phys. Soc., 51, 1172 (2007)
Dietze C, Hangleiter T, Willems P, Lebians PJR, Struye L, Spaeth JM, J. Appl. Phys., 80, 1074 (1996)
Hackenschmied P, Zeitler G, Batentschuk M, Hell E, Knupfer W, Nucl. Instru. Meth. Phys. Res., 191, 163 (2002)
Schweizer S, Willeme P, Leblans PJR, Struye L, Spaeth JM, J. Appl. Phys., 79, 4157 (1996)
Koschnick FK, Hangleiter T, Spaeth JM, Eachus RS, J. Phys. Condens. Matter, 4, 3001 (1992)

[Referenced By]

[1] Ko SK, Medical-Radiation. Imaging & Information, Ko SK, Medical-Radiation. Imaging & Information. Technology, p.239-276, Komoonsa, Korea, (2002). (2002)

[2] Miyahara J, Science and Technology of Japan, 26, 28 (1985)

[3] Amemiya Y, Miyahara J, Nature, (London), 336, 89 (1988)

[4] Sonoda M, Takano M, Miyahara J, Kato H, Radiology, 148, 833 (1983)

[5] Lee CY, Kim CG, Song GY, Kim JH, Korean J. Mater. Res., 15(6), 370 (2005)

[6] Lee CY, Bae SH, Kim JH, Kwon JH, Korean J. Mater. Res., 16(7), 455 (2006)

[7] Lee CY, Kwon JH, Kim HH, Jeong JM, J. Kor. Phys. Soc., 51, 1172 (2007)

[8] Dietze C, Hangleiter T, Willems P, Lebians PJR, Struye L, Spaeth JM, J. Appl. Phys., 80, 1074 (1996)

[9] Hackenschmied P, Zeitler G, Batentschuk M, Hell E, Knupfer W, Nucl. Instru. Meth. Phys. Res., 191, 163 (2002)

[10] Schweizer S, Willeme P, Leblans PJR, Struye L, Spaeth JM, J. Appl. Phys., 79, 4157 (1996)

[11] Koschnick FK, Hangleiter T, Spaeth JM, Eachus RS, J. Phys. Condens. Matter, 4, 3001 (1992)