Gd2O2S:Tb의 동시 계수 도플러 양전자 소멸법에 의한 결함 특성

이종용; 배석환; 김재홍; 권준현; C.Y. Lee; S.H. Bae; J.H. Kim; J.H. Kwon

Korean Journal of Materials Research, Vol.16, No.7, 455-460, July, 2006

DOI10.3740/MRSK.2006.16.7.455 Export Citation

Gd2O2S:Tb의 동시 계수 도플러 양전자 소멸법에 의한 결함 특성

Defect Analysis of Gd2O2S : Tb Using Coincidence Doppler Broadening Positron Annihilation Spectroscopy

이종용^†, 배석환¹, 김재홍², 권준현³

한남대학교 이과대학 물리학과
¹건양대학교 병원 진단방사선과
²원자력의학원 RI 및 방사성의약품개발실
³한국원자력연구소 원자력 재료기술개발부

C.Y. Lee^†, S.H. Bae¹, J.H. Kim², and J.H. Kwon³

Department of Physics, Hannam University, Korea
¹Department of Radiology, Konyang University Hostpital, Korea
²Radiopharmaceuticals Lab, KIRAMS, Seoul, Korea
³Nuclear Materials Technology Division, KAERI, Korea

E-mail:

Coincidence Doppler Broadening (CDB) of positron annihilation spectroscopy was applied to analyze defects in the chemical state of Department of Physics, :Tb intensifying screens. The screen samples were irradiated by 80 MV X-rays in hospital and were used for 0, 2, 4, and 6 years respectively. There was a positive relationship between the S-parameter values and time of exposure to X-rays. Most of the defects were indicated to have been generated by X-rays. A 1D CDB was developed in order to reduce the background noise, and the S-parameter values of the :Tb intensifying screens, using the 1D CDB, varied between 0.4974 and 0.4991.

Keywords:Coincidence;Positron;Gd2O2S:Tb;defect;S-parameter

[References]

Nielson B, Holland OW, Leung TC, Lynn KG, J. Appl. Phys., 74, 1636 (1993)
Schaffer JP, Gupta TK, Rohatgi A, J. Elec. Mat., 18, 737 (1989)
Mantl B, Triftshauser W, Appl. Phys., 5, 177 (1974)
Druzhkov AP, Yeshchenko RN, Klotsman SM, Martem'Yanov AN, Taluts GG, Phys. Met. Metall., 66, 117 (1988)
Lee JL, Waber JT, Meta. Trans., 21a, 2037 (1990)
Kim CG, Ahn CM, Song GY, Lee CY, Korean J. Mater. Res., 12(5), 359 (2002)
Lynn KG, MacDonald JR, Boie RA, Feldman LC, Gabbe JD, Robbins MF, Phy. Rev. Lett., 38, 241 (1977)
Lynn KG, Dickman JE, Brown WL, Robbins MF, Phy. Rev. B, 20, 3566 (1978)
Huh J, Choi JH, Medical Radio. Photo., 100 (2001)
Medical Radiation Imaging & Information Technology, Komoonsa, Ch. 8 (2002) (2002)
Gupta TK, Straub WD, Ramanachalam MS, Schaffer JP, Rohatgi A, J. Appl. Phys., 66, 6132 (1989)
Fujinami M, Sawada T, Akahane T, Rad. Phys. Chem., 68, 631 (2003)
Onitsuka T, Takenaka M, Abe H, Kuramoto E, Ohkubo H, Nagai Y, Hasegawa M, Mater. Sci. Forum, 445-446, 168 (2004)
Petegem S, Waeyenberge B, Segers E, Dauwe C, Nuclear Instru. Met. Phys. Res., 513, 622 (2003)
Lee CY, Kim CG, Song GY, Kim JH, Korean J. Mater. Res., 15(6), 370 (2005)
Nagai Y, Hasegawa M, Tang Z, Hempel A, Yubata K, Shimamura T, Kano F, Phys. Rev. B, 61, 6574 (2000)

[Referenced By]

[1] Nielson B, Holland OW, Leung TC, Lynn KG, J. Appl. Phys., 74, 1636 (1993)

[2] Schaffer JP, Gupta TK, Rohatgi A, J. Elec. Mat., 18, 737 (1989)

[3] Mantl B, Triftshauser W, Appl. Phys., 5, 177 (1974)

[4] Druzhkov AP, Yeshchenko RN, Klotsman SM, Martem'Yanov AN, Taluts GG, Phys. Met. Metall., 66, 117 (1988)

[5] Lee JL, Waber JT, Meta. Trans., 21a, 2037 (1990)

[6] Kim CG, Ahn CM, Song GY, Lee CY, Korean J. Mater. Res., 12(5), 359 (2002)

[7] Lynn KG, MacDonald JR, Boie RA, Feldman LC, Gabbe JD, Robbins MF, Phy. Rev. Lett., 38, 241 (1977)

[8] Lynn KG, Dickman JE, Brown WL, Robbins MF, Phy. Rev. B, 20, 3566 (1978)

[9] Huh J, Choi JH, Medical Radio. Photo., 100 (2001)

[10] Medical Radiation Imaging & Information Technology, Komoonsa, Ch. 8 (2002) (2002)

[11] Gupta TK, Straub WD, Ramanachalam MS, Schaffer JP, Rohatgi A, J. Appl. Phys., 66, 6132 (1989)

[12] Fujinami M, Sawada T, Akahane T, Rad. Phys. Chem., 68, 631 (2003)

[13] Onitsuka T, Takenaka M, Abe H, Kuramoto E, Ohkubo H, Nagai Y, Hasegawa M, Mater. Sci. Forum, 445-446, 168 (2004)

[14] Petegem S, Waeyenberge B, Segers E, Dauwe C, Nuclear Instru. Met. Phys. Res., 513, 622 (2003)

[15] Lee CY, Kim CG, Song GY, Kim JH, Korean J. Mater. Res., 15(6), 370 (2005)

[16] Nagai Y, Hasegawa M, Tang Z, Hempel A, Yubata K, Shimamura T, Kano F, Phys. Rev. B, 61, 6574 (2000)