Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.19, No.9, 767-769, 2000 DOI10.1023/A:1006752321075 Export Citation Stress analysis of B doped silicon bridges and cantilever structures by Raman spectroscopy Lourenco MA, Gardiner DJ, Bowden M, Hedley J, Wood D Please enable JavaScript to view the comments powered by Disqus.
