Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.19, No.9, 771-773, 2000 DOI10.1023/A:1006764605146 Export Citation Alleviation of temperature effects in the Raman micro-spectroscopy of boron doped silicon microstructures Lourenco MA, Gardiner DJ, Gouvernayre V, Bowden M, Hedley J, Wood D Keywords:STRESS Please enable JavaScript to view the comments powered by Disqus.
