Electrical transport and dielectric modulus formalism of CuO doped ZrO2 partially stabilized solid solution

Saha S; Nandy A; Pradhan SK; Meikap AK

Materials Research Bulletin, Vol.88, 272-280, 2017

DOI10.1016/j.materresbull.2017.01.003 Export Citation

Electrical transport and dielectric modulus formalism of CuO doped ZrO2 partially stabilized solid solution

We have investigated the dielectric behavior and electrical transport property of partially stabilized nanocrystalline zirconia doped with copper oxide in the temperature range 373 K

Keywords:Nanostructures;Ball-milling;X-ray diffraction;Dielectric permittivity;Electrical properties