송전선로 ACSR 케이블의 산화에 따른 결빙 특성 평가

조희재; 김유섭; 정용찬; 이수열; Hui Jae Cho; You Sub Kim; Yong Chan Jung; Soo Yeol Lee

Korean Journal of Materials Research, Vol.29, No.6, 378-384, June, 2019

DOI10.3740/MRSK.2019.29.6.378 Export Citation

송전선로 ACSR 케이블의 산화에 따른 결빙 특성 평가

Evaluation of Ice Adhesion Strength on the Oxidation of Transmission Line ACSR Cable

조희재, 김유섭, 정용찬¹, 이수열^†

충남대학교 신소재공학과
¹전력연구원 창의미래연구소

Hui Jae Cho, You Sub Kim, Yong Chan Jung¹, and Soo Yeol Lee^†

Department of Materials Science and Engineering, Chungnam National University, Daejeon 34134, Republic of Korea
¹Creative Future Laboratory, KEPCO Research Institute, Daejeon 34056, Republic of Korea

E-mail:

Ice accumulation on Aluminum Conductor Steel Reinforced(ACSR) cable during winter is an important matter in terms of safety, economy, and efficient power supply. In this work, the ice adhesion strengths of ACSR cable oxidized during different periods(7 years oxidized and 15 years oxidized) are evaluated. At first, a plate type dry oxidation standard specimen, whose surface characteristics are similar to those of ACSR cable, is prepared. Dry oxidation standard specimens are heat-treated at 500 °C for 20, 60, and 120 minutes in order to obtain different degrees of oxidation. After the dry oxidation, surface properties are analyzed using contact angle analyzer, atomic force microscopy, spectrophotometer, and gloss meter. The ice adhesion strengths are measured using an ice pull-off tester. Correlations between the surface properties and the ice adhesion strength are obtained through a regression analysis indicating a Boltzmann equation. It is revealed that the ice adhesion strength of 15- year oxidized ACSR cable is approximately 8 times higher than that of ACSR-bare.

Keywords:ACSR cable;ice adhesion strength;roughness;surface energy;regression analysis

[References]

Fikke SM, Kristjansson JE, Nygaard BEK, Atmospheric Icing of Power Networks, p.2, M. Farzaneh, Springer Science & Business Media, Germany (2008).
Lee JH, Jung HY, Koo JR, Yoon YJ, Jung HJ, J. Electr. Eng. Technol., 12, 969 (2017)
Larforte JL, Allaire MA, Laflamme J, Atmos. Res., 46, 143 (1998)
Zhu KJ, Fu DJ, Wang JC, Sun N, Electrical Equipment, 6, 969 (2008)
Kim WK, Cho SJ, Shim JH, The Korean Inst. of Electr. Eng., 36, 673 (2005).
Ayres J, Simendinger WH, Balik CM, J. Coat. Technol. Res., 4, 463 (2007)
Tak Y, Kang J, Choi J, J. Korean Ind. Eng. Chem., 17(4), 335 (2006)
Azevedo CRF, Cescon T, Eng. Failure Anal., 9, 645 (2002)
Zhang JK, Chen GH, Wang JQ, Corros. Prot., 31, 581 (2010)
Zhang JK, Chen GH, Wang JQ, Chin. J. Nonferrous Met., 21, 411 (2011)
Cao LL, Jones AK, Sikka VK, Wu JZ, Gao D, Langmuir, 25(21), 12444 (2009)
Bharathidasan T, Kumar SV, Bobji MS, Chakradhar RPS, Basu BJ, Appl. Surf. Sci., 314, 241 (2014)
Chen J, Liu J, He M, Li K, Cui D, Zhang Q, Zeng X, Zhang Y, Wang J, Song Y, Appl. Phys. Lett., 101, 111603 (2012)
Kulinich SA, Farhadi S, Nose K, Du XW, Langmuir, 27(1), 25 (2011)
Schrader ME, Langmuir, 11(9), 3585 (1995)

[Referenced By]

[1] Fikke SM, Kristjansson JE, Nygaard BEK, Atmospheric Icing of Power Networks, p.2, M. Farzaneh, Springer Science & Business Media, Germany (2008).

[2] Lee JH, Jung HY, Koo JR, Yoon YJ, Jung HJ, J. Electr. Eng. Technol., 12, 969 (2017)

[3] Larforte JL, Allaire MA, Laflamme J, Atmos. Res., 46, 143 (1998)

[4] Zhu KJ, Fu DJ, Wang JC, Sun N, Electrical Equipment, 6, 969 (2008)

[5] Kim WK, Cho SJ, Shim JH, The Korean Inst. of Electr. Eng., 36, 673 (2005).

[6] Ayres J, Simendinger WH, Balik CM, J. Coat. Technol. Res., 4, 463 (2007)

[7] Tak Y, Kang J, Choi J, J. Korean Ind. Eng. Chem., 17(4), 335 (2006)

[8] Azevedo CRF, Cescon T, Eng. Failure Anal., 9, 645 (2002)

[9] Zhang JK, Chen GH, Wang JQ, Corros. Prot., 31, 581 (2010)

[10] Zhang JK, Chen GH, Wang JQ, Chin. J. Nonferrous Met., 21, 411 (2011)

[11] Cao LL, Jones AK, Sikka VK, Wu JZ, Gao D, Langmuir, 25(21), 12444 (2009)

[12] Bharathidasan T, Kumar SV, Bobji MS, Chakradhar RPS, Basu BJ, Appl. Surf. Sci., 314, 241 (2014)

[13] Chen J, Liu J, He M, Li K, Cui D, Zhang Q, Zeng X, Zhang Y, Wang J, Song Y, Appl. Phys. Lett., 101, 111603 (2012)

[14] Kulinich SA, Farhadi S, Nose K, Du XW, Langmuir, 27(1), 25 (2011)

[15] Schrader ME, Langmuir, 11(9), 3585 (1995)