In this work we report the synthesis procedure, the structural, and magnetic characterization of Zn4Ni3Sb2O12 thin films grown on Si and Pt/TiO2/SiO2/Si substrates deposited by spin coating. The crystallographic phases of the films were determined by Xray diffraction and the morphological structure was analyzed by atomic force microscopy and scanning electron microscopy. The grain and crystallite sizes, the thickness of the films and the surface roughness were also investigated. Magnetic measurements, performed using a SQUID magnetometer, showed an antiferromagnetic transition of approximately 5 K.