ZnSe and ZnTe bulk crystals were studied using X-ray scattering topography, which enabled us to take topographic observations for any kind of materials. We presented not only X-ray scattering topographs but also orientation topographs and two-dimensional reconstruction orientation topographs. The results showed the degree of orientation distribution and domain size and so on. Comparing the topographs of them, in ZnTe specimen some smaller grains were included and the spread of orientation distribution was wider than ZnSe one.