Double-crystal X-ray diffractometry (DCD) with conventional and synchrotron radiation was utilized to study the quality of Bridgman-grown CdTe single crystals. The FWHM of the CdTe crystals have been investigated on various parts of the grown crystal. The (II 1)CdTe rocking curve obtained by DCD showed an FWHM value of around 72 arcsec for the outer edge of the grown crystal. Also, the rocking curve analysis was carried out by using synchrotron radiation. At the core of the grown crystal, the lowest FWHM value of 17 arcsec was measured, which exhibited the good quality of the crystal. The quality of the crystal at various parts was ascertained by means of a rocking curve FWHM profile.