화학공학소재연구정보센터
검색결과 : 37건
No. Article
1 RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers
Esfeh BK, Makovejev S, Basso D, Desbonnets E, Kilchytska V, Flandre D, Raskin JP
Solid-State Electronics, 128, 121, 2017
2 Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature
Theodorou CG, Ioannidis EG, Haendler S, Josse E, Dimitriadis CA, Ghibaudo G
Solid-State Electronics, 117, 88, 2016
3 Back-gate effects and mobility characterization in junctionless transistor
Parihar MS, Liu FY, Navarro C, Barraud S, Bawedin M, Ionica I, Kranti A, Cristoloveanu S
Solid-State Electronics, 125, 154, 2016
4 Effect of parasitic elements on UTBB FD SOI MOSFETs RF figures of merit
Arshad MKM, Kilchytska V, Emam M, Andrieu F, Flandre D, Raskin JP
Solid-State Electronics, 97, 38, 2014
5 Quasi-double gate regime to boost UTBB SO MOSFET performance in analog and sleep transistor applications
Kilchytska V, Bol D, De Vos J, Andrieu F, Flandre D
Solid-State Electronics, 84, 28, 2013
6 Scaling of high-kappa/metal-gate TriGate SOI nanowire transistors down to 10 nm width
Coquand R, Barraud S, Casse M, Leroux P, Vizioz C, Comboroure C, Perreau P, Ernst E, Samson MP, Maffini-Alvaro V, Tabone C, Barnola S, Munteanu D, Ghibaudo G, Monfray S, Boeuf F, Poiroux T
Solid-State Electronics, 88, 32, 2013
7 UTBB SOI MOSFETs analog figures of merit: Effects of ground plane and asymmetric double-gate regime
Arshad MKM, Makovejev S, Olsen S, Andrieu F, Raskin JP, Flandre D, Kilchytska V
Solid-State Electronics, 90, 56, 2013
8 Modeling of low frequency noise in FD SOI MOSFETs
El Husseini J, Martinez F, Valenza M, Ritzenthaler R, Lime F, Iniguez B, Faynot O, Le Royer C, Andrieu F
Solid-State Electronics, 90, 116, 2013
9 Ultra-thin body and thin-BOX SOI CMOS technology analog figures of merit
Kilchytska V, Arshad MKM, Makovejev S, Olsen S, Andrieu F, Poiroux T, Faynot O, Raskin JP, Flandre D
Solid-State Electronics, 70, 50, 2012
10 Impact of self-heating and substrate effects on small-signal output conductance in UTBB SOI MOSFETs
Makovejev S, Raskin JP, Arshad MKM, Flandre D, Olsen S, Andrieu F, Kilchytska V
Solid-State Electronics, 71, 93, 2012