1 - 5 |
Solution processed Ag electrode for organic thin-film transistors Lee SH, Kim SH, Choi MH, Choo DJ, Jang J |
6 - 12 |
On the research of lead-free material challengers for PZT replacement Fasquelle D, Mascot M, Carru JC |
13 - 15 |
Evaluation of variability performance of junctionless and conventional Trigate transistors Ghibaudo G |
16 - 21 |
Modeling of phosphorus deactivation in polysilicon for simulation of memory process in nanometer era Chang RD, Lin CH, Ma CC, Tsai JR |
22 - 27 |
Gate leakage current partitioning in nanoscale double gate MOSFETs, using compact analytical model Darbandy G, Lime F, Cerdeira A, Estrada M, Garduno SI, Iniguez B |
28 - 32 |
Resistive switching characteristics of ZnO based ReRAMs with different annealing temperatures Li HX, Niu B, Mao QN, Xi JH, Ke WQ, Ji ZG |
33 - 36 |
Feasibility and limitations of anti-fuses based on bistable non-volatile switches for power electronic applications Erlbacher T, Huerner A, Bauer AJ, Frey L |
37 - 42 |
Electrostatics analysis of two Hall measurement configurations Weiss JD |
43 - 47 |
Hopping and trap controlled conduction in Cr-doped SrTiO3 thin films Phan BT, Choi T, Romanenko A, Lee J |
48 - 54 |
On the investigation of electronic defect states in ZnO thin films by space charge spectroscopy with optical excitation Schmidt M, von Wenckstern H, Pickenhain R, Grundmann M |
55 - 62 |
A low leakage 500 MHz 2T embedded dynamic memory with integrated semi-transparent refresh Vignon A, Cosemans S, Maex K, Dehaene W |
63 - 68 |
Influence of interlayer properties on the characteristics of high-k gate stacks Engstrom O, Mitrovic IZ, Hall S |
69 - 73 |
New determination method of arbitrary energy distribution of traps in metal-oxide-semiconductor field effect transistor Yonamoto Y, Akamatsu N |
74 - 76 |
Maximum applied voltage detector using amorphous In-Ga-Zn-O thin-film transistor exposed to ozone annealing Kimura M, Hasegawa T, Ide K, Nomura K, Kamiya T, Hosono H |
77 - 80 |
Approximate closed-form solution of ambipolar input voltage equation for the common-gate symmetric FinFET Dessai G, Gildenblat G |
81 - 85 |
A complete SPICE subcircuit-based model library for organic photodiodes Daami A, Vaillant J, Gwoziecki R, Serbutoviez C |
86 - 92 |
Effect of carbon doping on crystal quality, electrical isolation and electron trapping in GaN based structures grown silicon substrates Ramdani MR, Chmielowska M, Cordier Y, Chenot S, Semond F |
93 - 96 |
Investigation on the relationship between channel resistance and subgap density of states of amorphous InGaZnO thin film transistors Park S, Cho EN, Yun I |
97 - 101 |
High performance of ultralow temperature polycrystalline silicon thin film transistor on plastic substrate Park DJ, Kim YH, Park BO |
102 - 106 |
Life prediction for white OLED based on LSM under lognormal distribution Zhang JP, Liu F, Liu Y, Wu HL, Zhu WQ, Wu WL, Wu L |