1 - 1 |
Untitled Calleja E, Cristoloveanu S, Kuk Y, Zaslavsky A |
2 - 6 |
A simple shift register circuit for depletion-mode oxide TFTs Pi JE, Ryu MK, Hwang CS, Park SHK, Yoon SM, Lym H, Kim Y, Oh H, Park K |
7 - 10 |
Investigation of gate length and fringing field effects for program and erase efficiency in gate-all-around SONOS memory cells Kim MS, Choi SJ, Moon DI, Duarte JP, Kim S, Choi YK |
11 - 13 |
Hot-electron induced defect generation in AlGaN/GaN high electron mobility transistors Rao H, Bosman G |
14 - 17 |
Thermal sensor employing ring oscillator composed of poly-Si thin-film transistors Taya J, Nakashima A, Kimura M |
18 - 21 |
On performance scaling and speed of junctionless transistors Koukab A, Jazaeri F, Sallese JM |
22 - 25 |
A precise physics-based compact model for 2-DEG charge density in GaAs HEMTs applicable in all regions of device operation Khandelwal S, Goyal N, Fjeldly TA |
26 - 30 |
Quasi-vertical multi-tooth thin film transistors based on low-temperature technology (T <= 600 degrees C) Zhang P, Jacques E, Rogel R, Coulon N, Bonnaud O |
31 - 36 |
Nanoscale CMOSFET performance improvement and reliability study for local strain techniques Huang HL, Chen JK, Houng MP |
37 - 44 |
Wafer scale thin-film transistors using different semiconducting purity nanotubes, dielectric materials and gate control Narasimhamurthy KC, Paily R |
45 - 49 |
Post-annealing effect on the interface morphology and current efficiency of organic light-emitting diodes Yoon Y, Lee H, Kim T, Kim K, Choi S, Yoo HK, Friedman B, Lee K |
50 - 55 |
On the temperature-dependent characteristics of a Pd/InAlAs based electroless-plating gate metamorphic heterostructure field-effect transistor (MHFET) Huang CC, Chen HI, Chen TY, Hsu CS, Chen CC, Chang HS, Liu WC |
56 - 59 |
Ambipolar characteristics of the polyaniline-poly(styrene sulfonic acid)-based organic thin film transistor via poly(vinyl alcohol) interface modification Li YC, Lin YJ, Wei CY, Wang YH |
60 - 64 |
Observation and study of the negative magnetoresistance in porous silicon Chouaibi B, Benfredj A, Romdhane S, Bouaicha M, Bouchriha H |
65 - 74 |
2 MeV electron irradiation effects on the electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al2O3, HfO2 and nanolaminated dielectrics Rafi JM, Campabadal F, Ohyama H, Takakura K, Tsunoda I, Zabala M, Beldarrain O, Gonzalez MB, Garcia H, Castan H, Gomez A, Duenas S |
75 - 78 |
Improved performances of organic light-emitting diodes with mixed layer and metal oxide as anode buffer Xue Q, Liu SY, Zhang SM, Chen P, Zhao Y, Liu SY |
79 - 86 |
60-GHz transmit/receive switch using a p-n diode and MOS transistors in 130-nm CMOS Mao CY, Kenneth KO |
87 - 91 |
Synthesis and gas sensing characteristics of LaxSr1-xFeO3 nanofibers via electrospinning Liu H, Fan HT, Xu XJ, Lu HX, Zhang T |
92 - 97 |
An in-depth Monte Carlo study of low-field mobility in ultra-thin body DGMOSFETs for modeling purposes Roldan JB, Jimenez-Molinos F, Balaguer M, Gamiz F |
98 - 103 |
Deposition rate dependent mobility of an organic transistor with an anisotropic polymeric insulator Bae JH, Lee SD, Yu CJ |
104 - 110 |
Analysis of mode-hopping effect in Fabry-Perot multiple-quantum well laser diodes via low frequency noise investigation Pralgauskaite S, Palenskis V, Matukas J, Saulys B, Kornijcuk V, Verdingovas V |
111 - 116 |
Characteristics and reliabilities on the Dicing before Grinding (DBG) process in nMOSFETs Kao HL, Yeh CS, Chen MT, Chiu HC, Chang LC |
117 - 124 |
Modeling the geometric effects on programming characteristics for the TANOS device by developing a 3D self-consistent simulation Jeon KS, Choe KS, Choi S, Park SY, Park YJ |
125 - 129 |
The electrical, optical, and structural properties of amorphous indium gallium zinc oxide films and channel thin-film transistors Jung CH, Kang HI, Yoon DH |
130 - 132 |
Effect of post-annealing treatment on silicon dioxide films for passivating flexible organic light-emitting diode Chou DW, Chen KL, Huang CJ, Chen WR, Meen TH |
133 - 137 |
Modeling of the effect of uniaxial mechanical strain on drain current and threshold voltage of an n-type MOSFET Chaudhry A, Sangwan S |
138 - 141 |
Investigation on nitrogen-doped Ge2Sb2Te5 material for phase-change memory application Yao DN, Zhou XL, Wu LC, Song ZT, Cheng LM, Rao F, Liu B, Feng SL |
142 - 146 |
Effects of mechanical-bending and process-induced stresses on metal effective work function Yang XD, Chu M, Huang AP, Thompson S |
147 - 151 |
Electrical properties of transparent CNT and ITO coatings on PET substrate including nano-structural aspects Park JM, Wang ZJ, Kwon DJ, Gu GY, DeVries KL |
152 - 158 |
Phase noise calculation and variability analysis of RFCMOS LC oscillator based on physics-based mixed-mode simulation Hong SM, Oh Y, Kim N, Rieh JS |
159 - 165 |
Ge2Sb2Te5 layer used as solid electrolyte in conductive-bridge memory devices fabricated on flexible substrate Deleruyelle D, Putero M, Ouled-Khachroum T, Bocquet M, Coulet MV, Boddaert X, Calmes C, Muller C |
166 - 171 |
A novel three-dimensional dual control-gate with surrounding floating-gate (DC-SF) NAND flash cell Aritome S, Whang S, Lee K, Shin D, Kim B, Kim M, Bin J, Han J, Kim S, Lee B, Jung Y, Cho S, Shin C, Yoo H, Choi S, Hong K, Park S, Hong S |
172 - 178 |
Simulation of low Schottky barrier MOSFETs using an improved Multi-subband Monte Carlo model Gudmundsson V, Palestri P, Hellstrom PE, Selmi L, Ostling M |
179 - 184 |
In-depth analysis and modelling of self-heating effects in nanometric DGMOSFETs Roldan JB, Gonzalez B, Iniguez B, Roldan AM, Lazaro A, Cerdeira A |
185 - 191 |
An equivalent doping profile for CMOS substrate characterization Quaresma HJ, dos Santos PM, Serra AC |
192 - 195 |
The thermal properties of AlGaAs/GaAs laser diode bars analyzed by the transient thermal technique Qiao YB, Feng SW, Xiong C, Ma XY, Zhu H, Guo CS, Wei GH |
196 - 200 |
Phonon-assisted Zener tunneling in a p-n diode silicon nanowire Carrillo-Nunez H, Magnus W, Vandenberghe WG, Soree B, Peeters FM |
201 - 205 |
Carrier recombination flux in bulk heterojunction polymer:fullerene solar cells: Effect of energy disorder on ideality factor Garcia-Belmonte G |
206 - 209 |
A unified analytical continuous current model applicable to accumulation mode (junctionless) and inversion mode MOSFETs with symmetric and asymmetric double-gate structures Jin XS, Liu X, Wu ML, Chuai RY, Lee JH, Lee JH |
210 - 217 |
Push the flash floating gate memories toward the future low energy application Della Marca V, Just G, Regnier A, Ogier JL, Simola R, Niel S, Postel-Pellerin J, Lalande F, Masoero L, Molas G |
218 - 222 |
Characterization of Al2O3-HfO2-Al2O3 sandwiched MIM capacitor under DC and AC stresses Kwak HY, Kwon HM, Jung YJ, Kwon SK, Jang JH, Choi WI, Ha ML, Lee JI, Lee SJ, Lee HD |
223 - 226 |
ZnO-based resonant cavity enhanced metal-semiconductor-metal ultraviolet photodetectors Lee HY, Hsu YT, Lee CT |
227 - 232 |
Addition of HfO2 interface layer for improved synaptic performance of phase change memory (PCM) devices Suri M, Bichler O, Hubert Q, Perniola L, Sousa V, Jahan C, Vuillaume D, Gamrat C, DeSalvo B |
233 - 237 |
An energy harvesting system surveyed for a variety of unattended electronic applications Zhao W, Choi K, Bauman S, Salter T, Lowy DA, Peckerar M, Khandani MK |
238 - 243 |
HVPE GaN for high power electronic Schottky diodes Tompkins RP, Walsh TA, Derenge MA, Kirchner KW, Zhou S, Nguyen CB, Jones KA, Mulholland G, Metzger R, Leach JH, Suvarna P, Tungare M, Shahedipour-Sandvik F |
244 - 247 |
The fabrication and the reliability of poly-Si MOSFETs using ultra-thin high-K/metal-gate stack Lee MH, Chen KJ |
248 - 252 |
Resistive switching in zinc-tin-oxide Murali S, Rajachidambaram JS, Han SY, Chang CH, Herman GS, Conley JF |
253 - 257 |
A comparative study on hot carrier effects in inversion-mode and junctionless MuGFETs Lee SM, Kim JY, Yu CG, Park JT |
258 - 261 |
Analytical model for quasi-static C-V characteristics of strained-Si/SiGe pMOS capacitor Wang B, Zhang HM, Hu HY, Shu B, Zhou CY, Li YC |
262 - 267 |
Electrical conductivity of PFPA functionalized graphene Plachinda P, Evans D, Solanki R |
268 - 273 |
True planar InAs/AlSb HEMTs with ion-implantation technique for low-power cryogenic applications Moschetti G, Abbasi M, Nilsson PA, Hallen A, Desplanque L, Wallart X, Grahn J |
274 - 280 |
Enhanced hole mobility and density in GaSb quantum wells Bennett BR, Chick TF, Ancona MG, Boos JB |
281 - 284 |
Large energy band-gap tuning of 980 nm InGaAs/InGaAsP quantum well structure via quantum well intermixing Qiao ZL, Tang XH, Kenneth LEK, Huei LP, Bo BX |
285 - 289 |
BaTiO3 as charge-trapping layer for nonvolatile memory applications Huang XD, Sin JKO, Lai PT |
290 - 292 |
An efficient heat-spreader design: First demonstration on InGaP/graded InGaAs base/GaAs collector-up HBTs Tseng HC, Chu WJ |