화학공학소재연구정보센터

Journal of Vacuum Science & Technology A

Journal of Vacuum Science & Technology A, Vol.12, No.3 Entire volume, number list
ISSN: 0734-2101 (Print) 

In this Issue (46 articles)

607 - 616 Rational Pattern Design for in-Vitro Cellular Networks Using Surface Photochemistry
Hickman JJ, Bhatia SK, Quong JN, Shoen P, Stenger DA, Pike CJ, Cotman CW
617 - 619 Chlorine-Enhanced F-Atom Etching of Silicon
Coburn JW
620 - 635 Simulation of Surface-Topography Evolution During Plasma-Etching by the Method of Characteristics
Arnold JC, Sawin HH, Dalvie M, Hamaguchi S
636 - 647 Dynamics of Ion-Assisted Etching in the Si(100)/Xef2/Ar+ System on a Time-Scale 100-Mu-S-1000-S
Joosten GJ, Vugts MJ, Spruijt HJ, Senhorst HA, Beijerinck HC
648 - 657 Etching of Si Surfaces with Hot Chlorine Beams - Translational and Vibrational-Excitation of the Incident Chlorine Particles
Szabo A, Engel T
658 - 664 Fluorocarbon High-Density Plasma .5. Influence of Aspect Ratio on the Etch Rate of Silicon Dioxide in an Electron-Cyclotron-Resonance Plasma
Joubert O, Oehrlein GS, Zhang Y
665 - 670 Fluorocarbon High-Density Plasma .6. Reactive Ion Etching Lag Model for Contact Hole Silicon Dioxide Etching in an Electron-Cyclotron-Resonance Plasma
Joubert O, Oehrlein GS, Surendra M
671 - 676 Combined Instrument for the Online Investigation of Plasma-Deposited or Etched Surfaces by Monochromatized X-Ray Photoelectron-Spectroscopy and Time-of-Flight Secondary-Ion Mass-Spectrometry
Jahn PW, Petrat FM, Wolany D, Deimel M, Gantenfort T, Schmerling C, Wensing H, Wiedmann L, Benninghoven A
677 - 680 Adverse-Effects on Plasma-Polymerized Films Due to Previous Oxygen Etching in an Electrodeless Reactor
Wymore T, Nichols MF
681 - 689 Synchrotron-Radiation (5-50 eV) Induced Degradation of Fluorinated Polymers
Simons JK, Frigo SP, Taylor JW, Rosenberg RA
690 - 698 Study of the NF3 Plasma Cleaning of Reactors for Amorphous-Silicon Deposition
Bruno G, Capezzuto P, Cicala G, Manodoro P
699 - 706 Chemical and Morphological-Changes on Silver Surfaces Produced by Microwave Generated Atomic Oxygen
Bhan MK, Nag PK, Miller GP, Gregory JC
707 - 713 Characterization of Silver Films Deposited by Radio-Frequency Magnetron Sputtering
Marechal N, Quesnel E, Pauleau Y
714 - 717 CdTe Oxide-Films Grown by Radio-Frequency Sputtering Utilizing Argon Nitrous-Oxide Plasma
Zapatanavarro A, Zapatatorres M, Sosa V, Bartoloperez P, Pena JL
718 - 722 Study of the Time-Dependence of Differentially Sputtered Currents from Multiphase Powder Targets
Cohen Y, Riess I
723 - 726 Planar Magnetron Glow-Discharge on Copper - Empirical and Semiempirical Relations
Escrivao ML, Moutinho AM, Maneira MJ
727 - 732 Thickness-Dependent Stress in Sputtered Carbon-Films
Puchert MK, Timbrell PY, Lamb RN, Mckenzie DR
733 - 736 Properties of Ticn Coatings Prepared by Magnetron Sputtering
Deng JG, Braun M, Gudowska I
737 - 745 Loss of Selectivity During W-Chemical Vapor-Deposition on Si Using the Wf6/SiH4 Process
Groenen PA, Tekcan OF, Holscher JG, Brongersma HH
746 - 750 Adhesion Between Polycarbonate Substrate and SiO2 Film Formed from Silane and Nitrous-Oxide by Plasma-Enhanced Chemical-Vapor-Deposition
Shinoda M, Nishide T, Shichi Y
751 - 753 Preparation of Amorphous BaTiO3 Thin-Films on Indium Tin Oxide-Coated Soda Lime Glass by Metalorganic Chemical-Vapor-Deposition
Yoon YS, Lee DH, Kim TS, Oh MH, Yom SS
754 - 759 Deposition of Amorphous Hydrogenated Silicon-Carbide Films Using Organosilanes in an Argon Hydrogen Plasma
Maya L
760 - 768 Comparison of Argon Electron-Cyclotron-Resonance Plasmas in 3 Magnetic-Field Configurations .2. Energy-Distribution of Argon Ions
Junck KL, Getty WD
769 - 771 Electric-Field in Surface-Wave-Produced Plasmas
Komachi K
772 - 782 Valence-Band Structure of Pmda-Oda Polyimide Studied by X-Ray Photoelectron-Spectroscopy and Theoretical Calculations
Nakayama Y, Baltzer P, Wannberg B, Gelius U, Stafstrom S, Lunell S
783 - 789 Characterization by Auger-Spectroscopy of Niobium Aluminum-Oxide Niobium Sandwiches for Josephson-Junctions
Lacquaniti V, Bergoglio M, Steni R
790 - 793 Depth Profile Optimization
Naumkin AV, Vasilyev LA
794 - 801 Dependence of Resolution on Sample Material in Rotational Auger Depth Profiling
Tanemura M, Okuyama F
802 - 806 Core-Valence Auger-Spectra of Lial Zintl Intermetallic Compound
Jang GE, Curelaru IM, Kim HG
807 - 812 Metallization of Teflon PFA .2. Interactions of Ti, Ag, and Au Measured by X-Ray Photoelectron-Spectroscopy
Shi MK, Lamontagne B, Selmani A, Martinu L, Sacher E, Wertheimer MR, Yelon A
813 - 819 Thin Gold Film Strain-Gauges
Li CS, Hesketh PJ, Maclay GJ
820 - 825 Atomic Release of Hydrogen from Pure and Boronized Graphites
Franzen P, Vietzke E
826 - 830 Reduction of Photodesorption Yield by Oxygen Discharge Cleaning
Ota N, Saitoh M, Kanazawa K, Momose T, Ishimaru H
831 - 834 2-Photon Laser-Induced Fluorescence Measurements of Absolute Atomic-Hydrogen Densities and Powder Formation in a Silane Discharge
Czarnetzki U, Miyazaki K, Kajiwara T, Muraoka K, Okada T, Maeda M, Suzuki A, Matsuda A
835 - 838 Precise Property Determinations of Arsenosilicate Glass Thin-Films Using Infrared-Spectroscopy
Niemczyk TM, Wangmaneerat B, Haaland DM
839 - 845 Infrared-Absorption Spectroscopy for Monitoring Condensable Gases in Chemical-Vapor-Deposition Applications
Oneill JA, Passow ML, Cotler TJ
846 - 853 Gas Desorption from an Oxygen-Free High-Conductivity Copper Vacuum Chamber by Synchrotron-Radiation Photons
Grobner O, Mathewson AG, Marin PC
854 - 860 Small Ultrahigh-Vacuum Compatible Hyperthermal Oxygen-Atom Generator
Outlaw RA, Davidson MR
861 - 866 Pumping of Helium and Hydrogen by Sputter-Ion Pumps .2. Hydrogen Pumping
Welch KM, Pate DJ, Todd RJ
867 - 872 Thermal Outgassing Behavior and Photoemission-Studies of Haynes Alloy-214
Sharma PK, Hickey GS
873 - 875 Reaction-Mechanism Between BN-Sprayed Graphite and Molten Al in Vacuum, and Its Application to the Evaporation Source for Reactive Metals Including Al
Jeong JI, Lim BM, Moon JH, Hong JH, Kang JS, Lee YP
876 - 878 New Technique for Coprecipitation of Organic-Dye with Polymer Under High-Vacuum
Hiraga T, Tanaka N, Takarada S, Hayamizu K, Kikuchi N, Moriya T
879 - 882 Vacuum-Ultraviolet Emission from Microwave Plasmas of Hydrogen and Its Mixtures with Helium and Oxygen
Hollander A, Wertheimer MR
883 - 885 In-Situ Bend Fixture for Deformation and Fracture Studies in the Environmental Scanning Electron-Microscope
Kalnas CE, Mansfield JF, Was GS, Jones JW
886 - 888 Effect of Anode Bias on Plasma-Confinement in Direct-Current Magnetron Discharges
Doyle JR, Nuruddin A, Abelson JR
889 - 891 Instrument for the Measurement of Adhesion Forces in Ultrahigh-Vacuum Surface-Analysis Apparatuses
Takahashi K, Iiyama T, Katoh N, Onzawa T