1 - 4 |
Structural characterization of nickel titanium oxide synthesized by sol-gel spin coating technique Phani AR, Santucci S |
5 - 8 |
Thermal stability of xerogel films Kumar A, Bakhru H, Fortin JB, Yang GR, Lu TM, Jin C, Lee WW |
9 - 15 |
Low temperature synthesis of dense SiO2 thin films by ion beam induced chemical vapor deposition Barranco A, Yubero F, Cotrino J, Espinos JP, Benitez J, Rojas TC, Allain J, Girardeau T, Reviere JP, Gonzalez-Elipe AR |
16 - 22 |
Structural characterization of TiCx films prepared by plasma based ion implantation Li G, Xia LF |
23 - 28 |
Low-temperature deposition of highly [100]-oriented MgO films using charged liquid cluster beam Rhee SH, Yang Y, Choi HS, Myoung JM, Kim K |
29 - 35 |
Structural and optical properties of silver thin films deposited by RF magnetron sputtering Rizzo A, Tagliente MA, Alvisi M, Scaglione S |
36 - 43 |
Surface studies of carbon films from pyrolyzed photoresist Kostecki R, Schnyder B, Alliata D, Song X, Kinoshita K, Kotz R |
44 - 52 |
Laser damage dependence on structural and optical properties of ion-assisted HfO2 thin films Alvisi M, De Tomasi F, Perrone MR, Protopapa ML, Rizzo A, Sarto F, Scaglione S |
53 - 61 |
Chemical vapour deposition of molybdenum carbides: aspects of nanocrystallinity Lu J, Jansson U |
62 - 68 |
Effect of process pressure on diamond-like carbon deposited using electron cyclotron resonance chemical vapor deposition Yoon SF, Tan KH, Ahn J, Huang QF |
69 - 77 |
Effect of crystallographic orientation on fretting wear behaviour of MoSx coatings in dry and humid air Zhang X, Vitchev RG, Lauwerens W, Stals L, He J, Celis JP |
78 - 83 |
Transmission electron microscopy investigation of Fe3O4 films grown on (111) Pt substrates Roddatis VV, Su DS, Kuhrs C, Ranke W, Schlogl R |
84 - 89 |
Dielectric and electrical properties of preferentially (111) oriented Zr-rich 0.1Pb(Mg1/3Nb2/3)O-3-0.9Pb(ZrxTi1-x)O-3 thin films by chemical solution deposition Park JH, Yoon KH, Kang DH |
90 - 96 |
Optical and structural properties of nanocrystalline copper oxide thin films prepared by activated reactive evaporation Balamurugan B, Mehta BR |
97 - 102 |
Fabrication of perovskite-based Pb(Zn1/3Nb2/3)O-3 (PZN) thin films using charged liquid cluster beam Yang Y, Kim K, Choi H |
103 - 108 |
Surface morphology of C-60 polycrystalline films from physical vapor deposition Chen RS, Lin YJ, Su YC, Chiu KC |
109 - 118 |
Photovoltaic junction properties of ultrathin films of phthalocyaninatooxovanadium (PcVO) on H-terminated n-Si(111) Trombach N, Tada H, Hiller S, Schlettwein D, Wohrle D |
119 - 125 |
Annealing behavior of electrical properties in plasma-exposed Ti/p-Si interfaces Yamaguchi T, Kato H, Fujimura N, Ito T |
126 - 130 |
Novel sol-gel process depositing alpha-Al2O3 for the improvement of graphite oxidation-resistance Bahlawane N |
131 - 137 |
Polymer sandwiches: polyaniline films deposited on thiol-coated gold by chemical in situ method Mazur M, Krysinski P |
138 - 144 |
Glass transition measurements on heterogeneous surfaces Dinelli F, Buenviaje C, Overney RM |
145 - 165 |
Low pressure microwave plasma assisted chemical vapor deposition (MPCVD) of diamond coatings on silicon nitride cutting tools Mallika K, Komanduri R |
166 - 172 |
Nanotribology of amorphous hydrogenated carbon films using scanning probe microscopy Fang TH, Weng CI, Chang JG, Hwang CC |
173 - 182 |
Young's modulus, hardness and scratch adhesion of Ni-P-W multilayered alloy coatings produced by pulse plating Papachristos VD, Panagopoulos CN, Christoffersen LW, Markaki A |
183 - 190 |
Thermally- and photo-induced changes in the structure and optical properties of amorphous As40S30Se30 films Marquez E, Gonzalez-Leal JM, Jimenez-Garay R, Vlcek M |
191 - 195 |
Electroluminescent properties of the Tris-(acetylsalicylate)-terbium (Tb(AS)(3)) Lin Q, Zhang HJ, Liang YJ, Zheng YX, Meng QG, Wang SB, Gou C |
196 - 200 |
The analysis of photoenhanced current in organic films: the influence of charge carrier diffusion Jarosz G, Signerski R, Godlewski J |
201 - 203 |
Er-doped oxidised porous silicon waveguides Balucani M, Bondarenko V, Lamedica G, Ferrari A, Dolgyi L, Vorozov N, Yakovtseva V, Volchek S, Petrovich V, Kazuchits N |
204 - 208 |
Thermal stability of Cu/TiN and Cu/Ti/TiN metallizations on silicon Chen JS, Lu KY |
209 - 212 |
DC conductivity of amorphous (GeS3)(100-x)Ga-x thin films Petkov P, Ivanova ZG, Vassilev V |
213 - 218 |
A relationship between driving voltage and the highest occupied molecular orbital level of hole-transporting metallophthalocyanine layer for organic electroluminescence devices Zhu LH, Tang HQ, Harima Y, Kunugi Y, Yamashita K, Ohshita J, Kunai A |
219 - 224 |
Commensurability oscillations on lateral surface superlattices with large periods Abd-El Mongy A, Long AR, Belal E, Ali K |
225 - 228 |
The preparation of double-sided YBCO thin films by simultaneous sputtering from single target Liu XZ, Tao BW, Luo A, He SM, Li YR |
229 - 234 |
Self-organized ring pattern of a samarium complex in Langmuir-Blodgett films Zhang RJ, Zheng SP, Wang MQ, Yang KZ, Li JB, Hu JF |
235 - 239 |
Optimization of the i-layer width of Cr-a-Si : H PIN X-ray detectors Estrada M, Cerdeira A, Leyva A, Carreno MNP, Pereyra I |
240 - 249 |
Field-induced anomalous changes in Cr/a-Si : H/V thin film structures Hu J, Snell AJ, Hajto J, Rose MJ, Edmiston W |
250 - 254 |
Electric poling in ultra-thin films of side group non-linear optical polymers studied by surface-enhanced Raman scattering Im JH, Kim JH, Jang J, Lee SH |
255 - 261 |
Study of electrical transport properties in polycrystalline CdTe thin films Jacome CE, Florez JM, Gordillo G |
262 - 273 |
Reflectance and transmittance of a slightly inhomogeneous thin film bounded by rough, unparallel interfaces Montecchi M, Montereali RM, Nichelatti E |
274 - 279 |
Modification of the structure of ZnO : Al films by control of the plasma parameters Tzolov M, Tzenov N, Dimova-Malinovska D, Kalitzova M, Pizzuto C, Vitali G, Zollo G, Ivanov I |
280 - 294 |
Identification of a new function model for the AC-impedance of thermally evaporated undoped selenium films using the Eigen-coordinates method Jafar MMAG, Nigmatullin RR |