1 - 8 |
Corrosion resistance of CrN/NbN superlattice coatings grown by various physical vapour deposition techniques Hovsepian PE, Lewis DB, Luo Q, Farinotti A |
9 - 14 |
Atomic layer deposition of TaSix, thin films on SiO2 using TaF5 and Si2H6 Lemonds AM, Bolom T, Ahearn WJ, Gay DC, White JM, Ekerdt JG |
15 - 19 |
Photoluminescene of chemical bath deposited ZnO : Al films treated by rapid thermal annealing Shishiyanu ST, Lupan OI, Monaico EV, Ursaki VV, Shishiyanu TS, Tiginyanu IM |
20 - 25 |
Formation of titanium nitride barrier layer in nickel-titanium shape memory alloys by nitrogen plasma immersion ion implantation for better corrosion resistance Poon RWY, Ho JPY, Liu XY, Chung CY, Chu PK, Yeung KWK, Lu WW, Cheung KA |
26 - 33 |
Growth and Rutherford backscattering spectrometry study of direct current sputtered indium oxide films Malar P, Mohanty BC, Kasiviswanathan S |
34 - 39 |
Preparation and characterization of molecular-material thin films containing diaqua tetrabenzo (b,f,j,n) {1,5,13} tetraazacyclohexadecine copper (II) and nickel (II) bisanthraflavates Sanchez-Vergara ME, Ortiz A, Alvarez-Toledano C, Alvarez JR |
40 - 44 |
Measurement of transverse electro-optic coefficient of Sr0.6Ba0.4Nb2O6 thin film grown on MgO substrate with different content of potassium ions Shen ZR, Ye H, Mak CL, Wong KH, Shen WD, Guo B |
45 - 55 |
Mechanism of formation of silica silicate thin films on zinc. Socha RP, Fransaer J |
56 - 61 |
Surfactant and impurity properties of antimony on GaAs and GaAs1-xNx on GaAs [100] by solid source molecular beam epitaxy Cheah WK, Fan WJ, Yoon SF, Tan KH, Liu R, Wee ATS |
62 - 67 |
Effect of deposition and annealing parameters on the properties of electrodeposited CuIn1-xGaxSe2 thin films Bouabid K, Ihial A, Manar A, Outzourhit A, Ameziane EL |
68 - 73 |
Improving the electrochemical properties of porous LiCoO2 films obtained by template synthesis Fonseca CP, Fantini MCA, Neves S |
74 - 81 |
Growth of Fe2O3 thin films by atomic layer deposition Lie M, Fjellvag H, Kjekshus A |
82 - 86 |
Growth of Pt clusters electrodeposited onto boron-doped diamond films Riedo B, Dietler G, Enea O |
87 - 92 |
Effects of hydrogen on film properties of diamond-like carbon films prepared by reactive radio-frequency magnetron sputtering using hydrogen gas Mikami T, Nakazawa H, Kudo M, Mashita M |
93 - 97 |
Space charge limited conduction in plasma polymerized N,N,3,5 tetramethylaniline thin films Akther H, Bhuiyan AH |
98 - 102 |
Field-induced resistance-switching of La0.7Ca0.3MnO3-delta films epitaxially grown on Ir/MgO buffered Si (001) substrates Chen TL, Li XM, Dong R, Wang Q, Chen LD |
103 - 110 |
Quartz crystal microbalance study of tungsten atomic layer deposition using WF6 and Si2H6 Fabreguette FH, Sechrist ZA, Elam JW, George SM |
111 - 115 |
Thermal annealing of InN films grown by metal-organic chemical vapor deposition Bi ZX, Zhang R, Xie ZL, Xiu XQ, Ye YD, Liu B, Gu SL, Shen B, Shi Y, Zheng YD |
116 - 123 |
Hydrodynamic particle removal from surfaces Burdick GM, Berman NS, Beaudoin SP |
124 - 131 |
Preparation of stacked organosiloxane bilayers on hydrophilic and hydrophobic silicon substrates by spin coating Franzka S, Dahlhaus D, Hartmann N |
132 - 139 |
Nanoscale multilayer WC/C coatings developed for nanopositioning: Part I. Microstructures and mechanical properties Gubisch M, Liu Y, Spiess L, Romanus H, Krischok S, Ecke G, Schaefer JA, Knedlik C |
140 - 148 |
Nanoscale multilayer WC/C coatings developed for nanopositioning, part II: Friction and wear Liu Y, Gubisch M, Hild W, Scherge M, Spiess L, Knedlik C, Schaefer JA |
149 - 152 |
Protecting conductive polymer wire from oxidation using an air-impenneable polyisobutylene coating Ji HF, Shaik ZH |
153 - 159 |
Sol-gel bonding of silicon wafers - Part 1: Influence of the processing temperature on final bond morphology and interfacial energy Barbe CJ, Cassidy DJ, Triani G, Latella BA, Mitchell DRG, Finnie KS, Short K, Bartlett JR, Woolfrey JL, Collins GA |
160 - 166 |
Sol-gel bonding of silicon wafers - Part 2. Influence of the sol-gel chemistry on bond morphology and interfacial energy Barbe CJ, Cassidy DJ, Triani G, Latella BA, Mitchell DRG, Finnie KS, Bartlett JR, Woolfrey JL, Collins GA |
167 - 172 |
An interfacial investigation of high-dielectric constant material hafnium oxide on Si substrate Chen SC, Lou JC, Chien CH, Liu PT, Chang TC |
173 - 177 |
Phase stability and orientation of SrCu2O2 films grown by pulsed laser deposition Varadarajan V, Norton DP, Budai JD |
178 - 184 |
Transfer of IV-VI multiple quantum well structures grown by molecular beam epitaxy from Si substrates to copper Li YF, Sow A, Yao C, McCann PJ |
185 - 188 |
Two dimensional photonic band gap pattering in thin chalcogenide glassy films Feigel A, Veinger M, Sfez B, Arsh A, Klebanov M, Lyubin V |
189 - 193 |
Evaluation of commercial ultra-thin Si-on-insulator wafers using laser confocal inspection system Ogura A, Okabayashi O |
194 - 199 |
Properties of anatase CoxTi1-xO2 thin films epitaxially grown by reactive sputtering Jeong BS, Heo YW, Norton DP, Hebard AF, Budai JD, Park YD |
200 - 203 |
Optical and magnetic properties of europium sulphide thin films grown by pulsed laser deposition O'Mahony D, Smith C, Budtz-Jorgensen C, Venkatesan M, Lunney JG, McGilp JF, Coey JMD |
204 - 210 |
Surface half-metallicity and interfacial mixing of (Cr, Mn, Fe)VAs/GaAs(001) Kang BS, Oh SK, Chung JS, Kang HJ |
211 - 216 |
The nitrogen doping effect on the properties of Ge-In-Sb-Te phase-change recording media investigated by blue-light laser Yeh TT, Hsieh TE, Shieh HPD |
217 - 222 |
Microstructure and current transport properties of single-layer YBa2Cu3O7-x and multiple-layer YBa2Cu3O7-x/(Ba-0.05, Sr-0.95)TiO3 superconductor films Luo Y, Hughes RA, Preston JS, Botton GA |
223 - 229 |
Human serum albumin-octadecylamine Langmuir-Blodgett film formed by spreading human serum albumin solution directly on subphase's interface covered with a layer of octadecylamine Yin F, Kafi AKM, Shin HK, Kwon YS |
230 - 235 |
Self-assembled monolayers of a thiol-derivatized porphyrin on gold electrode: Film formation and electrocatalytic dioxygen reaction Lu XQ, Lv BQ, Xue ZH, Li MR, Zhang LM, Kang JW |
236 - 241 |
Effects of laser irradiation and annealing on rhodium phthalocyanine Langmuir-Blodgett films Gaffo L, Brasil MJSP, Cerdeira F, Moreira WC |
242 - 246 |
Effect of heat treatment on the properties of non-stoichiometric p-type nickel oxide films deposited by reactive sputtering Yang JL, Lai YS, Chen JS |
247 - 253 |
Ellipsometric study of a phospholipid monolayer at the air-water interface in presence of large organic counter ions Perez-Morales M, Pedrosa JM, Munoz E, Martin-Romero MT, Mobius D, Camacho L |
254 - 257 |
Investigation of the recombination zone in the structure of red organic electroluminescent devices Tsou CC, Lu HT, Yokoyama M |
258 - 264 |
Effect of porosity on the ferroelectric properties of sol-gel prepared lead zirconate titanate thin films Zhang Q, Corkovic S, Shaw CP, Huang Z, Whatmore RW |
265 - 269 |
Efficient white organic light emitting devices with dual emitting layers Wu YS, Hwang SW, Chen HH, Lee MT, Shen WJ, Chen CH |
270 - 273 |
Monolayer passivation of the transparent electrode in organic solar cells Johnev B, Vogel M, Fostiropoulos K, Mertesacker B, Rusu M, Lux-Steiner MC, Weidinger A |
274 - 282 |
An analytical model for predicting thermal residual stresses in multilayer coating systems Zhang XC, Xu BS, Wua YX, Wu YX |
283 - 290 |
Electron energy loss spectroscopy of carbonaceous rnaterials Silva SRP, Stolojan V |
291 - 305 |
The growth of noble metals in (11(2)over-bar0)-oriented hexagonal close-packed nano-films by epitaxy on Nb(001) Huger E, Osuch K |
306 - 313 |
Suppression of dewetting phenomena during excimer laser melting of thin metal films on SiO2 Kline JE, Leonard JP |
314 - 320 |
Optical scattering characteristic of annealed niobium oxide films Lai FC, Li M, Wang HQ, Hu HL, Wang XP, Hou JG, Song YZ, Jiang YS |
321 - 328 |
Mechanism of galvanic metallization of CoS-activated insulating polymer surfaces Mai TT, Schultze JW, Staikov G, Munoz AG |
329 - 336 |
Perpendicular domains in poly(styrene-b-methyl methacrylate) block copolymer films on preferential surfaces Wang H, Djurisic AB, Xie MH, Chan WK, Kutsay O |
337 - 339 |
A new measurement technique for the characterization of carrier lifetime in thin SOI MOSFETs (vol 6, pg 462, 2004) Nakajima Y, Tomita H, Aoto K, Sasaki K, Hanajiri T, Toyabe T, Morikawa T, Sugano T |