4527 - 4537 |
Simulation of growth dynamics in atomic layer deposition. Part I. Amorphous films Nilsen O, Karlsen OB, Kjekshus A, Fjellvag H |
4538 - 4549 |
Simulation of growth dynamics in atomic layer deposition. Part II. Polycrystalline films from cubic crystallites Nilsen O, Karlsen OB, Kjekshus A, Fjellvag H |
4550 - 4558 |
Simulation of growth dynamics in atomic layer deposition. Part III. Polycrystalline films from tetragonal crystallites Nilsen O, Karlsen OB, Kjekshus A, Fjellvag H |
4559 - 4564 |
Electrochemical investigation and characterization of thin-film porosity Sittner F, Ensinger W |
4565 - 4569 |
Influence of aluminum nitride interlayers on crystal orientation and piezoelectric property of aluminum nitride thin films prepared on titanium electrodes Kamohara T, Akiyama M, Ueno N, Nonaka K, Kuwano N |
4570 - 4579 |
Characterization of asymmetric rhombohedral twin in epitaxial alpha-Cr2O3 thin films by X-ray and electron diffraction Mandar H, Uustare T, Aarik J, Tarre A, Rosental A |
4580 - 4587 |
Structural and electrical properties of room temperature pulsed laser deposited and post-annealed thin SrRuO3 films Gautreau O, Harnagea C, Normandin F, Veres T, Pignolet A |
4588 - 4595 |
Complex electrical (impedance/dielectric) properties of electroceramic thin films by impedance spectroscopy with interdigital electrodes Kidner NJ, Meier A, Homrighaus ZJ, Wessels BW, Mason TO, Garboczi EJ |
4596 - 4602 |
Characterization of the silicon oxide thin films deposited on polyethylene terephthalate substrates by radio frequency reactive magnetron sputtering Lin MC, Tseng CH, Chang LS, Wuu DS |
4603 - 4608 |
Preparation of micropatterned poly(silsesquioxane) thin films using adamantylphenol molecules Cha BJ, Choi YJ, Kim B, Kim H |
4609 - 4613 |
Crystallization of chemically vapor deposited molybdenum and mixed tungsten/molybdenum oxide films for electrochromic application Gesheva KA, Cziraki A, Ivanova T, Szekeres A |
4614 - 4618 |
Lithium cobalt oxide thin films deposited at low temperature by ionized magnetron sputtering Chiu KF |
4619 - 4623 |
Structural and optical properties of wurtzite InN grown on Si(111) Ji XH, Lau SP, Yang HY, Zhang QY |
4624 - 4628 |
Preparation and characterization of ultra-thin sol-gel films Shapiro L, Marx S, Mandler D |
4629 - 4635 |
Nanowire array fabricated by Al-Ge phase separation Fukutani K, Ishida Y, Tanji K, Den T |
4636 - 4639 |
Pulsed laser deposition of crystalline ZrC thin films Craciun V, Craciun D, Howard JM, Woo J |
4640 - 4648 |
Hemispherical and diffuse reflectance and transmittance of a slightly inhomogeneous film bounded by rough, unparallel interfaces Nichelatti E, Montecchi M, Montereali RM |
4649 - 4661 |
Bis-(4-(2-pyridylmethyleneiminophenyl))disulfide - A chelating ligand capable of self assembly on gold surface and its complexes with M(BF4)(2) and M(ClO4)(2); M=CO, Cu and Ni. Experimental and theoretical study Beloglazkina EK, Majouga AG, Zyk NV, Rakhimov RD, Yaminsky IV, Gorelkin PV, Kiselev GA, Kutateladze AG |
4662 - 4665 |
Screening effect in contactless electroreflectance spectroscopy observed for AlGaN/GaN heterostructures with two dimensional electron gas Motyka M, Kudrawiec R, Syperek M, Misiewicz J, Rudzinski M, Hageman PR, Larsen PK |
4666 - 4669 |
A modified Wenzel model for hydrophobic behavior of nanostructured surfaces Han TY, Shr JF, Wu CF, Hsieh CT |
4670 - 4680 |
Electronic and thermal reaction pathways in the synchrotron radiation-excited modification and epitaxy of silicon-based materials Akazawa H |
4681 - 4685 |
Argon ion beam and electron beam-induced damage in Cu(In,Ga)Se-2 thin films Yan YF, Jones KM, Noufi R, Al-Jassim MM |
4686 - 4690 |
Fabrication of super-hydrophobic film with dual-size roughness by silica sphere assembly Sun C, Ge LQ, Gu ZZ |
4691 - 4695 |
Oxidation study of polycrystalline InN film using in situ X-ray scattering and X-ray photoemission spectroscopy Lee IJ, Yu C, Shin HJ, Kim JY, Lee YP, Hur TB, Kim HK |
4696 - 4701 |
Immersion nickel deposition on blank silicon in aqueous solution containing ammonium fluoride Zhang X, Chen Z, Tu KN |
4702 - 4708 |
Initial reaction of HfO2 atomic layer deposition on silicon surfaces with different oxygen levels: A density functional theory study Ren H, Liu FY, Zhang YT, Zhang DW |
4709 - 4716 |
Fixtureless superlayer-driven delamination test for nanoscale thin-film interfaces Zheng HT, Sitaraman SK |
4717 - 4721 |
Electrochromism of the electroless deposited cuprous oxide films Neskovska R, Ristova M, Velevska J, Ristov M |
4722 - 4726 |
Characterization of TiCr(C,N)/amorphous carbon coatings synthesized by a cathodic arc deposition process Chang YY, Yang SJ, Wang DY |
4727 - 4737 |
Enhancement of corrosion resistance of a biomedical grade 316LVM stainless steel by potentiodynamic cyclic polarization Bou-Saleh Z, Shahryari A, Omanovic S |
4738 - 4744 |
Effect of pressure and substrate temperature on the deposition of nano-structured silicon-carbon-nitride superhard coatings by magnetron sputtering Mishra SK, Shekhar C, Rupa PKP, Pathak LC |
4745 - 4752 |
A method to evaluate mechanical performance of thin transparent films for flexible displays Grego S, Lewis J, Vick E, Temple D |
4753 - 4757 |
Photoelectrochemical properties of thin Bi2WO6 films Zhao X, Wu Y, Yao WQ, Zhu YF |
4758 - 4762 |
Thin film passivation of organic light emitting diodes by inductively coupled plasma chemical vapor deposition Kim HK, Kim SW, Kim DG, Kang JW, Kim MS, Cho WJ |
4763 - 4767 |
Determination of optical constants and inhomogeneity of optical films by two-step film envelope method Lai FC, Wang Y, Li M, Wang HQ, Song YZ, Jiang YS |
4768 - 4773 |
Ion beam deposition of alpha-Ta films by nitrogen addition and improvement of diffusion barrier property Bae JW, Lim JW, Mimura K, Isshiki M |
4774 - 4777 |
Thermally-induced optical property changes of sputtered PdOx films Arai T, Shima T, Nakano T, Tominaga J |
4778 - 4782 |
Preparation of CuIn1-xGaxSe2 films by metalorganic chemical vapor deposition using three precursors Choi IH, Lee DH |
4783 - 4787 |
Monitoring interface traps in operating organic light-emitting diodes using impedance spectroscopy Pingree LSC, Russell MT, Marks TJ, Hersam MC |
4788 - 4793 |
Dielectric properties of sol-gel derived high-k titanium silicate thin films Sarkar DK, Brassard D, El Khakani MA, Ouellet L |
4794 - 4800 |
Design of diffusion barriers Gill WN, Plawsky JL |
4801 - 4807 |
Influence of the glycosylphosphatidylinositol anchor in the morphology and roughness of Langmuir-Blodgett films of phospholipids containing alkaline phosphatases Caseli L, Masui DC, Prazeres R, Furriel M, Leone FA, Zaniquelli MED |
4808 - 4811 |
Degradation characteristics and light-induced effects of polymer thin-film transistors Liu YR, Peng JB, Laic PT, Yang K, Cao Y |
4812 - 4818 |
Influence of heat treatment on indium-tin-oxide anodes and copper phthalocyanine hole injection layers in organic light-emitting diodes Fenenko L, Adachi C |
4819 - 4825 |
Deposition characterization of reactive magnetron sputtered aluminum nitride thin films for film bulk acoustic wave resonator Chiu KH, Chen JH, Chenc HR, Huang RS |
4826 - 4833 |
Characteristic curves of hydrogenated amorphous silicon based solar cells modeled with the defect pool model Khmovsky E, Sturiale A, Rubinelli FA |
4834 - 4837 |
Influence of thermal annealing on photoluminescence and structural properties of N,N'-diphenyl-N,N'-bis(1-naphthylphenyl)-1, 1'-biphenyl-4,4'-diamine (alpha-NPD) organic thin films Osipov KA, Pavlovskii VN, Lutsenko EV, Gurskii AL, Yablonskii GP, Hartmann S, Janssen A, Johannes HH, Caspary R, Kowalsky W, Meyer N, Gersdorff A, Heuken A, van Gemmern P, Zimmermann C, Jessen F, Kalisch H, Jansen RH |
4838 - 4842 |
Area selective epitaxy of indium phosphide on silicon (100) substrates without buffer layers by liquid phase epitaxy Kochiya T, Oyama Y, Sugai M, Nishizawa JI |