Applied Surface Science

Applied Surface Science, Vol.421 Entire volume, number list

ISSN: 0169-4332 (Print)

In this Issue (135 articles)

1 - 1	Preface De Hosson JTM, Ali N, Fierro G, Aliofkhazraei M, Chipara M
2 - 17	Optimization of metal atomic ratio of PdxRuyNiz on carbon support for ethanol oxidation Charoen K, Warakulwit C, Prapainainar C, Seubsai A, Chareonpanich M, Prapainainar P
18 - 23	Aluminum-doped zinc oxide thin films grown on various substrates using facing target sputtering system Kim HM, Lee CH, Shon SY, Kim BH
24 - 41	Mordenite/Nafion and analcime/Nafion composite membranes prepared by spray method for improved direct methanol fuel cell performance Prapainainar P, Du ZH, Kongkachuichay P, Holmes SM, Prapainainar C
42 - 51	Local mechanical and electromechanical properties of the P(VDF-TrFE)-graphene oxide thin films Silibin MV, Bystrov VS, Karpinsky DV, Nasani N, Goncalves G, Gavrilin IM, Solnyshkin AV, Marques PAAP, Singh B, Bdikin IK
52 - 60	Silk flame retardant finish by ternary silica sol containing boron and nitrogen Zhang QH, Chen GQ, Xing TL
61 - 67	Fabrication of highly oriented nanoporous fibers via airflow bubble-spinning Liu FJ, Li SK, Fang Y, Zheng FF, Li JH, He JH
68 - 76	Ternary cobalt-molybdenum-zirconium coatings for alternative energies Yar-Mukhamedova G, Ved' M, Sakhnenko N, Koziar M
77 - 81	Surface phase transitions in cu-based solid solutions Zhevnenko SN, Chernyshikhin SV
82 - 88	Grafting of functionalized polymer on porous silicon surface using Grignard reagent Tighilt FZ, Belhousse S, Sam S, Hamdani K, Lasmi K, Chazalviel JN, Gabouze N
89 - 96	NiTi shape-memory alloy oxidized in low-temperature plasma with carbon coating: Characteristic and a potential for cardiovascular applications Witkowska J, Sowinska A, Czarnowska E, Plocinski T, Borowski T, Wierzchon T
97 - 108	Surprising formation of a rhodochrosite-like (MnCO3) phase on Co-Zn-Mn sintered spinels upon storage at room temperature and ambient air Casaletto MP, Fierro G
109 - 119	Roman sophisticated surface modification methods to manufacture silver counterfeited coins Ingo GM, Riccucci C, Faraldi F, Pascucci M, Messina E, Fierro G, Di Carlo G
120 - 127	Artificial patina formation onto copper-based alloys: Chloride and sulphate induced corrosion processes Di Carlo G, Giuliani C, Riccucci C, Pascucci M, Messina E, Fierro G, Lavorgna M, Ingo GM
128 - 133	Analysis of Eu-effect on stabilization of the TiO2-anatase structure in high temperature and photoluminescence efficiency for the coatings as-deposited in magnetron sputtering process Wojcieszak D
134 - 141	Functionalization of silicon nanowires by conductive and non-conductive polymers Belhousse S, Tighilt FZ, Sam S, Lasmi K, Hamdani K, Tahanout L, Megherbi F, Gabouze N
142 - 147	Detection of traces of triclosan in water Marques I, Magalhaes-Mota G, Pires F, Serio S, Ribeiro PA, Raposo M
148 - 154	Comparative investigation of two methods for Acetylcholinesterase enzyme immobilization on modified porous silicon Khaldi K, Sam S, Lounas A, Yaddaden C, Gabouze NE
155 - 158	Influence of surface anisotropy on domain wall dynamics in magnetic nanotube Usov NA, Serebryakova ON
159 - 169	Effect of metallic coating on the properties of copper-silicon carbide composites Chmielewski M, Pietrzak K, Teodorczyk M, Nosewicz S, Jarzabek D, Zybala R, Bazarnik P, Lewandowska M, Strojny-Nedza A
170 - 178	Investigation of various properties of HfO2-TiO2 thin film composites deposited by multi-magnetron sputtering system Mazur M, Poniedzialek A, Kaczmarek D, Wojcieszak D, Domaradzki J, Gibson D
179 - 184	Determination of the thickness of the embedding phase in 0D nanocomposites Martinez-Martinez D, Sanchez-Lopez JC
185 - 190	Comparison of structural, mechanical and corrosion properties of TiO2-WO3 mixed oxide films deposited on TiAlV surface by electron beam evaporation Kalisz M, Grobelny M, Kaczmarek D, Domaradzki J, Mazur M, Wojcieszak D
191 - 199	Nanocharacterization of the adhesion effect and bending stiffness in optical MEMS Pustan M, Birleanu C, Dudescu C
200 - 204	Analysis of induced stress on materials exposed to laser-plasma radiation during high-intensity laser experiments Sciscio M, Barberio M, Liberatore C, Veltri S, Laramee A, Palumbo L, Legare F, Antici P
205 - 212	Synthesis and characterization of novel 4-Tetra-4-Tolylsulfonyl ZnPc thin films for optoelectronic applications Khalil S, Tazarki H, Souli M, Guasch C, Jamoussi B, Kamoun N
213 - 219	Two temperature approach to femtosecond laser oxidation of molybdenum and morphological study Kotsedi L, Kaviyarasu K, Fuku XG, Eaton SM, Amara EH, Bireche F, Ramponi R, Maaza M
220 - 227	Polyethylene oxide-fullerene nanocomposites Ali N, Chipara D, Lozano K, Hinthorne J, Chipara M
228 - 233	Cu-rGO subsurface layer creation on copper substrate and its resistance to oxidation Pietrzak K, Strojny-Nedza A, Olesinska W, Bankowska A, Gladki A
234 - 239	Photocatalytic activity of ZrO2 doped lead dioxide nanocomposites: Investigation of structural and optical microscopy of RhB organic dye Kaviyarasu K, Kotsedi L, Simo A, Fuku X, Mola GT, Kennedy J, Maaza M
240 - 246	Electrospinning, preparation and photoluminescence properties of CoNb2O6:Dy3+ incorporated polyamide 6 composite fibers Erdem R, Ilhan M, Ekmekci MK, Erdem O
247 - 251	Discussion of the importance of the refraction effects for RHEED Mitura Z, Szczypinski MM, Mitura S
252 - 259	Density functional theory calculations on transition metal atoms adsorbed on graphene monolayers Dimakis N, Flor FA, Salgado A, Adjibi K, Vargas S, Saenz J
260 - 267	Efficient interface-induced effect of novel reduced graphene oxide-CoS heteronanostructures in enhancing photocatalytic acitivities He HY
269 - 270	Editorial to the proceedings of the 7th conference on spectroscopic ellipsometry (ICSE-7) Hertwig A, Hinrichs K, Beck U, Esser N
271 - 275	Ellipsometry of single-layer antireflection coatings on transparent substrates Azzam RMA
276 - 282	Determination and interpretation of the optical constants for solar cell materials Fujiwara H, Fujimoto S, Tamakoshi M, Kato M, Kadowaki H, Miyadera T, Tampo H, Chikamatsu M, Shibata H
283 - 288	Optical and structural characterization of Ge clusters embedded in ZrO2 Agocs E, Zolnai Z, Rossall AK, van den Berg JA, Fodor B, Lehninger D, Khomenkova L, Ponomaryov S, Gudymenko O, Yukhymchuk V, Kalas B, Heitmann J, Petrik P
289 - 294	Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions Agocs E, Kozma P, Nador J, Hamori A, Janosov M, Kalas B, Kurunczi S, Fodor B, Ehrentreich-Forster E, Fried M, Horvath R, Petrik P
295 - 300	Evaluation of the dielectric function of colloidal Cd1-xHgxTe quantum dot films by spectroscopic ellipsometry Bejaoui A, Alonso MI, Garriga M, Campoy-Quiles M, Goni AR, Hetsch F, Kershaw SV, Rogach AL, To CH, Foo Y, Zapien JA
301 - 309	Determination of gold nanoparticle shape from absorption spectroscopy and ellipsometry Battie Y, Izquierdo-Lorenzo I, Resano-Garcia A, Naciri AE, Akil S, Adam PM, Jradi S
310 - 314	Ellipsometric characterization of MoSe2 thin layers obtained by thermal treatment of molybdenum in selenium vapor Bayramov A, Aliyeva Y, Eyyubov G, Mammadov E, Jahangirli Z, Lincot D, Mamedov N
315 - 319	Ellipsometric study of the optical response of ZnS:Cr for PV applications Brakstad T, Hope BR, Nematollahi M, Kildemo M, Podraza NJ, Ghimire K, Reenaas TW
320 - 324	Effects of annealing and conformal alumina passivation on anisotropy and hysteresis of magneto-optical properties of cobalt slanted columnar thin films Briley C, Mock A, Korlacki R, Hofmann T, Schubert E, Schubert M
325 - 330	Ultrafast in-situ null-ellipsometry for studying pulsed laser - Silicon surface interactions Csontos J, Toth Z, Papa Z, Gabor B, Fule M, Gilicze B, Budai J
331 - 340	Systematic investigation of the properties of TiO2 films grown by reactive ion beam sputter deposition Bundesmann C, Lautenschlager T, Spemann D, Finzel A, Thelander E, Mensing M, Frost F
341 - 348	Effect of substrates and thickness on optical properties in atomic layer deposition grown ZnO thin films Pal D, Singhal J, Mathur A, Singh A, Dutta S, Zollner S, Chattopadhyay S
349 - 356	Controlling the optical parameters of self-assembled silver films with wetting layers and annealing Ciesielski A, Skowronski L, Trzcinski M, Szoplik T
357 - 360	Cavity-enhanced optical Hall effect in epitaxial graphene detected at terahertz frequencies Armakavicius N, Bouhafs C, Stanishev V, Kuhne P, Yakimova R, Knight S, Hofmann T, Schubert M, Darakchieva V
361 - 366	Optical characterization of heterocyclic azo dyes containing polymers thin films Derkowska-Zielinska B, Skowronski L, Biitseva A, Grabowski A, Naparty MK, Smokal V, Kysil A, Krupka O
367 - 372	Optical properties of epitaxial Na0.5Bi0.5TiO3 lead-free piezoelectric thin films: Ellipsometric and theoretical studies Dorywalski K, Lemee N, Andriyevsky B, Schmidt-Grund R, Grundmannd M, Piasecki M, Bousquet M, Krzyzynski T
373 - 377	Investigation of percolation thickness of sputter coated thin NiCr films on clear float glass Erkan S, Arpat E, Peters S
378 - 382	User oriented end-station on VUV pump-probe magneto-optical ellipsometry at ELI beamlines Espinoza S, Neuber G, Brooks CD, Besner B, Hashemi M, Rubhausen M, Andreasson J
383 - 388	Spectroscopic ellipsometry studies on ZnCdO thin films with different Cd concentrations grown by pulsed laser deposition Chen S, Li QX, Ferguson I, Lin T, Wan LY, Feng ZC, Zhu LP, Ye ZZ
389 - 396	Composition and temperature dependent optical properties of AlxGa1-xN alloy by spectroscopic ellipsometry Liu Y, Li QX, Wan LY, Kucukgok B, Ghafari E, Ferguson IT, Zhang X, Wang SC, Feng ZC, Lu N
397 - 404	Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires Fodor B, Defforge T, Agocs E, Fried M, Gautier G, Petrik P
405 - 419	Temperature-dependent dispersion model of float zone crystalline silicon Franta D, Dubroka A, Wang CN, Giglia A, Vohanka J, Franta P, Ohlidal I
420 - 423	Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry Franta D, Kotilainen M, Krumpolec R, Ohlidal I
424 - 429	Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride Franta D, Necas D, Giglia A, Franta P, Ohlidal I
430 - 434	Vacuum variable-angle far-infrared ellipsometer Fris P, Dubroka A
435 - 439	Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials Funke S, Wurstbauer U, Miller B, Matkovic A, Green A, Diebold A, Roling C, Thiesen PH
440 - 445	Infrared-spectroscopic single-shot laser mapping ellipsometry: Proof of concept for fast investigations of structured surfaces and interactions in organic thin films Furchner A, Kratz C, Gkogkou D, Ketelsen H, Hinrichs K
446 - 452	Structural, morphological, optical and electrical properties of Ga-doped ZnO transparent conducting thin films Yang J, Jiang YL, Li LJ, Gao MZ
453 - 459	Spectroscopic ellipsometry data inversion using constrained splines and application to characterization of ZnO with various morphologies Gilliot M, Hadjadj A, Stchakovsky M
460 - 464	Characterization of anisotropically shaped silver nanoparticle arrays via spectroscopic ellipsometry supported by numerical optical modeling Gkogkou D, Shaykhutdinov T, Oates TWH, Gernert U, Schreiber B, Facsko S, Hildebrandt P, Weidinger IM, Esser N, Hinrichs K
465 - 470	Using a fast dual-wavelength imaging ellipsometric system to measure the flow thickness profile of an oil thin film Kuo CW, Han CY, Jhou JY, Peng ZY
471 - 479	Traceable Mueller polarimetry and scatterometry for shape reconstruction of grating structures Hansen PE, Madsen MH, Lehtolahti J, Nielsen L
480 - 486	Dependence of the optical constants and the performance in the SPREE gas measurement on the thickness of doped tin oxide over coatings Fischer D, Hertwig A, Beck U, Negendank D, Lohse V, Kormunda M, Esser N
487 - 493	Ellipsometric porosimetry on pore-controlled TiO2 layers Rosu DM, Ortel E, Hodoroaba VD, Kraehnert R, Hertwig A
494 - 499	Estimating depolarization with the Jones matrix quality factor Hilfiker JN, Hale JS, Herzinger CM, Tiwald T, Hong N, Schoche S, Arwin H
500 - 507	Spectroscopic ellipsometry characterization of coatings on biaxially anisotropic polymeric substrates Hilfiker JN, Pietz B, Dodge B, Sun JN, Hong NN, Schoeche S
508 - 512	Determining thickness and refractive index from free-standing ultrathin polymer films with spectroscopic ellipsometry Hilfiker JN, Stadermann M, Sun JN, Tiwald T, Hale JS, Miller PE, Aracne-Ruddle C
513 - 517	Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry Hofmann T, Knight S, Sekora D, Schmidt D, Herzinger CM, Woollam JA, Schubert E, Schubert M
518 - 528	Mueller matrix characterization of flexible plastic substrates Hong NN, Synowicki RA, Hilfiker JN
529 - 534	Characterization of thermochromic VO2 (prepared at 250 degrees C) in a wide temperature range by spectroscopic ellipsometry Houska J, Kolenaty D, Rezek J, Vlcek J
535 - 541	Using high numerical aperture objective lens in micro-reflectance difference spectrometer Shen WF, Hu CG, Li S, Hu XT
542 - 546	Ellipsometry of surface layers on a 1-kg sphere from natural silicon Klenovsky P, Zuda J, Klapetek P, Humlicek J
547 - 552	Spectroscopic imaging ellipsometry of self-assembled SiGe/Si nanostructures. Alonso MI, Funke S, Gonzalez A, Garriga M, Vaccaro PO, Goni AR, Ruiz A, Alonso M, Thiesen PH
553 - 556	Monitoring silver solid-state dewetting with in situ ellipsometry Jacquet P, Kildemo M, Teisseire J, Gozhyk I, Jupille J, Lazzari R
557 - 564	Spectroscopic ellipsometry characterization of ZnO:Sn thin films with various Sn composition deposited by remote-plasma reactive sputtering Janicek P, Niang KM, Mistrik J, Palka K, Flewitt AJ
565 - 570	Polarization characteristics of diffraction scattering from metal rough surface Jin LH, Taguchi T, Kondoh E, Gelloz B
571 - 577	Partially coherent light propagation in stratified media containing an optically thick anisotropic layer Nichols SM, Arteaga O, Martin AT, Kahr B
578 - 584	Mueller matrix modeling of thick anisotropic crystals with metallic coatings Martin AT, Nichols SM, Tan M, Kahr B
585 - 592	Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry Kalas B, Nador J, Agocs E, Saftics A, Kurunczi S, Fried M, Petrik P
593 - 600	Optical response of gold hemispheroidal lattices on transparent substrates Kildemo M, Banon JP, Baron A, Svendsen BB, Brakstad T, Simonsen I
601 - 607	Spectroscopic ellipsometry for analysis of polycrystalline thin-film photovoltaic devices and prediction of external quantum efficiency Ibdah AR, Koirala P, Aryal P, Pradhan P, Marsillac S, Rockett AA, Podraza NJ, Collins RW
608 - 610	Real-time reflectance-difference spectroscopy during the epitaxial growth of InAs/GaAs/(001) Armenta-Franco A, Lastras-Martinez A, Ortega-Gallegos J, Ariza-Flores D, Guevara-Macias LE, Balderas-Navarro RE, Lastras-Martinez LF
611 - 616	Dielectric functions of La-based cuprate superconductors for visible and near-infrared wavelengths Zhao ML, Lian J, Yu HS, Jin K, Xu LP, Hu ZG, Yang XL, Kang SS
617 - 623	Model selection in spectroscopic ellipsometry data analysis: Combining an information criteria approach with screening sensitivity analysis Likhachev DV
624 - 629	Application of ellipsometry for the accurate oxide layer measurement on silicon spheres Busch I, Liu WD, Chen C, Luo ZY, Koenders L
630 - 635	Optical characterization of the coloration process in electrochromic amorphous and crystalline WO3 films by spectroscopic ellipsometry Yuan GZ, Hua CZ, Huang L, Defranoux C, Basa P, Liu Y, Song CL, Han GR
636 - 642	Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide Lohner T, Serenyi M, Szilagyi E, Zolnai Z, Czigany Z, Khanh NQ, Petrik P, Fried M
643 - 650	Optical properties of ultrathin CIGS films studied by spectroscopic ellipsometry assisted by chemical engineering Loubat A, Eypert C, Mollica F, Bouttemy M, Naghavi N, Lincot D, Etcheberry A
651 - 655	Solid-state dewetting of thin Au films studied with real-time, in situ spectroscopic ellipsometry Magnozzi M, Bisio F, Canepa M
656 - 662	Experimental validation of the partial coherence model in spectroscopic ellipsometry and Mueller matrix polarimetry Miranda-Medina M, Garcia-Caurel E, Peinado A, Stchakovsky M, Hingerl K, Ossikovski R
663 - 666	Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry Mock A, Carlson T, VanDerslice J, Mohrmann J, Woollam JA, Schubert E, Schubert M
667 - 673	In-situ Mueller matrix ellipsometry of silicon nanowires grown by plasma-enhanced vapor-liquid-solid method for radial junction solar cells Mrazkova Z, Foldyna M, Misra S, Al-Ghzaiwat M, Postava K, Pistora J, Cabarrocas PRI
674 - 679	Investigation of optical properties of ternary Zn-Ti-O thin films prepared by magnetron reactive co-sputtering Netrvalova M, Novak P, Sutta P, Medlin R
680 - 686	Evolution of Al:ZnO optical response as a function of doping level Ochoa-Martinez E, Navarrete-Astorga E, Ramos-Barrado J, Gabas M
687 - 696	Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness Ohlidal I, Franta D, Necas D
697 - 701	Retrieval of the non-depolarizing components of depolarizing Mueller matrices by using symmetry conditions and least squares minimization Kuntman E, Canillas A, Arteaga O
702 - 706	Back-focal plane Mueller matrix microscopy: Mueller conoscopy and Mueller diffractrometry Arteaga O, Nichols SM, Anto J
707 - 713	Ellipsometric study of peptide layers - island-like character, depolarization and quasi-absorptione Papa Z, Ramakrishnan S, Martin M, Cloitre T, Zimanyi L, Toth Z, Gergely C, Budai J
714 - 721	Spectroscopic ellipsometric investigation of graphene and thin carbon films from the point of view of depolarization effects Papa Z, Csontos J, Smausz T, Toth Z, Budai J
722 - 727	Atomic Force Microscopy and Spectroscopic Ellipsometry combined analysis of Small Ubiquitin-like Modifier adsorption on functional monolayers Solano I, Parisse P, Gramazio F, Ianeselli L, Medagli B, Cavalleri O, Casalis L, Canepa M
728 - 737	IR-Mueller matrix ellipsometry of self-assembled nanopatterned gold grid polarizer Peinado A, Kildemo M, Aas LMS, Martella C, Giordano MC, Chiappe D, de Mongeot FB, Borondics F, Garcia-Caurel E
738 - 743	Occurrence and significance of evanescent fields in structured samples Perin JP, Hingerl K
744 - 747	Optical properties of Zr and ZrO2 Petrik P, Sulyok A, Novotny T, Perez-Fero E, Kalas B, Agocs E, Lohner T, Lehninger D, Khomenkova L, Nagy R, Heitmann J, Menyhard M, Hozer Z
748 - 754	Spectroscopic ellipsometry and X-ray diffraction studies on Si1-xGex/Si epifilms and superlattices Xie D, Qiu ZR, Wan LY, Talwar DN, Cheng HH, Liu SY, Mei T, Feng ZC
755 - 760	Functionalization of gold and graphene electrodes by p-maleimido-phenyl towards thiol-sensing systems investigated by EQCM and IR ellipsometric spectroscopy Neubert TJ, Rosicke F, Sun GG, Janietz S, Gluba MA, Hinrichs K, Nickel NH, Rappich J
761 - 765	Nonlinear ellipsometry of Si(111) by second harmonic generation Reitbock C, Stifter D, Alejo-Molina A, Hardhienata H, Hingerl K
766 - 771	Control of slanting angle, porosity, and anisotropic optical constants of slanted columnar thin films via in situ nucleation layer tailoring Rice C, Mock A, Sekora D, Schmidt D, Hofmann T, Schubert E, Schubert M
772 - 777	Characterization of thin SiGe layers on Si (001) by spectroscopic ellipsometry for Ge fractions from 0 to 100% Schmidt J, Eilert M, Peters S, Wietler TF
778 - 782	Optical properties of graphene oxide and reduced graphene oxide determined by spectroscopic ellipsometry Schoche S, Hong N, Khorasaninejad M, Ambrosio A, Orabona E, Maddalena P, Capasso F
783 - 787	Optical and structural properties of cobalt-permalloy slanted columnar heterostructure thin films Sekora D, Briley C, Schubert M, Schubert E
788 - 793	Anisotropic optical constants and inter-band optical transitions in layered semiconductor TlGaSe2 Shim Y, Itoh Y, Wakita K, Mamedov N
794 - 801	Optical and microstructural properties of decorative Al/Ti/TiO2 interference coatings Skowronski L, Wachowiak AA, Wachowiak W
802 - 806	An original method to determine complex refractive index of liquids by spectroscopic ellipsometry and illustrated applications Stchakovsky M, Battie Y, Naciri AE
807 - 812	Visualization of low-contrast surface modifications: Thin films, printed pattern, laser-induced changes, imperfections, impurities, and degradation Stockmann J, Hertwig A, Beck U
813 - 818	Optical properties of InP from infrared to vacuum ultraviolet studied by spectroscopic ellipsometry Subedi I, Slocum MA, Forbes DV, Hubbard SM, Podraza NJ
819 - 823	Analyzing optical properties of thin vanadium oxide films through semiconductor-to-metal phase transition using spectroscopic ellipsometry Sun JN, Pribil GK
824 - 830	Optical constants of electroplated gold from spectroscopic ellipsometry Synowicki RA, Herzinger CM, Hall JT, Malingowski A
831 - 836	Optical anisotropy studies of silver nanowire/polymer composite films with Mueller matrix ellipsometry Tomiyama T, Yamazaki H
837 - 842	Optical properties of lithium gallium oxide Tumenas S, Mackonis P, Nedzinskas R, Trinkler L, Berzina B, Korsaks V, Chang L, Chou MMC
843 - 851	Quartz crystal microbalance with coupled Spectroscopic Ellipsometry-study of temperature-responsive polymer brush systems Adam S, Koenig M, Rodenhausen KB, Eichhorn KJ, Oertel U, Schubert M, Stamm M, Uhlmann P
852 - 858	Spectroscopic ellipsometry determination of optical and electrical properties of aluminum doped zinc oxide Uprety P, Junda MM, Ghimire K, Adhikari D, Grice CR, Podraza NJ
859 - 865	Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures Wang CN, Caha O, Munz F, Kostelnik P, Novak T, Humlicek J
866 - 869	Temperature dependence of optical constants of La0.7Sr0.3MnO3 thin films Yamada Y, So J, Asano H, Tazawa M, Yoshimura K
870 - 877	Experimental study of thickness dependence of polarization and depolarization properties of anisotropic turbid media using Mueller matrix polarimetry and differential decomposition Yoo SH, Ossikovski R, Garcia-Caurel E
878 - 883	Convergence and precision characteristics of finite difference time domain method for the analysis of spectroscopic ellipsometry data at oblique incidence Foo Y, Zapien JA
884 - 890	Optical properties of thickness-controlled MoS2 thin films studied by spectroscopic ellipsometry Li DH, Song XF, Xu JP, Wang ZY, Zhang RJ, Zhou P, Zhang H, Huang RZ, Wang SY, Zheng YX, Zhang DW, Chen LY
891 - 898	Structural and optical properties of highly (110)-oriented non-polar ZnO evaporated films on Si substrates Yang SD, Zheng YX, Yang L, Liu ZH, Zhou WJ, Wang SY, Zhang RJ, Chen LY
899 - 904	Ellipsometric study on temperature dependent optical properties of topological bismuth film Yang L, Zheng YX, Yang SD, Liu ZH, Zhang JB, Zhang RJ, Wang SY, Zhang DX, Chen LY
905 - 912	Temperature dependence of the interband critical points of bulk Ge and strained Ge on Si Fernando NS, Nunley TN, Ghosh A, Nelson CM, Cooke JA, Medina AA, Zollner S, Xu C, Menendez J, Kouvetakis J
913 - 916	Temperature-dependent dielectric function of nickel Zollner S, Nunley TN, Trujillo DP, Pineda LG, Abdallah LS