Applied Surface Science

Applied Surface Science, Vol.157, No.4 Entire volume, number list

ISSN: 0169-4332 (Print)

In this Issue (36 articles)

V - V	NC-AFM'99 - Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy - Pontresina, Switzerland, September 1-4, 1999 - Preface Bennewitz R, Gerber C, Meyer E
207 - 211	Bias dependence of Si(111) 7 X 7 images observed by noncontact atomic force microscopy Arai T, Tomitori M
212 - 217	Atomic-scale structures on a non-stoichiometric TiO2(110) surface studied by noncontact AFM Ashino M, Uchihashi T, Yokoyama K, Sugawara Y, Morita S, Ishikawa M
218 - 221	Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM Hosoi H, Sueoka K, Hayakawa K, Mukasa K
222 - 227	Atomic-scale variations in contact potential difference on Au/Si(111) 7 X 7 surface in ultrahigh vacuum Kitamura S, Suzuki K, Iwatsuki M, Mooney CB
228 - 232	Imaging of fullerene molecules on Si(111)-7 X 7 surface with NC-AFM Kobayashi K, Yamada H, Horiuchi T, Matsushige K
233 - 238	Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy Pang CL, Raza H, Haycock SA, Thornton G
239 - 243	Noncontact AFM imaging on Al-adsorbed Si(111) surface with an empty orbital Sugawara Y, Orisaka S, Morita S
244 - 250	High-resolution imaging of organic monolayers using noncontact AFM Uchihashi T, Ishida T, Komiyama M, Ashino M, Sugawara Y, Mizutani W, Yokoyama K, Morita S, Tokumoto H, Ishikawa M
251 - 255	Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy Leveque G, Girard P, Skouri E, Yarekha D
256 - 262	Kelvin probe force microscopy using near-field optical tips Shikler R, Rosenwaks Y
263 - 268	Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces Sommerhalter C, Glatzel T, Matthes TW, Jager-Waldau A, Lux-Steiner MC
269 - 273	Carbon nanotubes as tips in non-contact SFM Barwich V, Bammerlin M, Baratoff A, Bennewitz R, Guggisberg M, Loppacher C, Pfeiffer O, Meyer E, Guntherodt HJ, Salvetat JP, Bonard JM, Forro L
274 - 279	Metallic adhesion forces and tunneling between atomically defined tip and sample Schirmeisen A, Cross G, Stalder A, Grutter P, Durig U
280 - 284	Quantitative electrostatic force measurement in AFM Jeffery S, Oral A, Pethica JB
285 - 289	Study of tip-sample interaction in scanning force microscopy Luna M, Colchero J, Gomez-Herrero J, Baro AM
290 - 294	Force-distance studies with piezoelectric tuning forks below 4.2 K Rychen J, Ihn T, Studerus P, Herrmann A, Ensslin K, Hug HJ, van Schendel PJA, Guntherodt HJ
295 - 301	Experimental and theoretical analysis of shear-force interaction in the non-contact regime with 100 pN force resolution Schmidt JU, Bergander H, Eng LM
302 - 307	Atomic resolution imaging using the electric double layer technique: friction vs. height contrast mechanisms Sokolov IY, Henderson GS
308 - 313	Implementation and optimization of a scanning Joule expansion microscope for the study of small conducting gold wires Cannaerts M, Seynaeve E, Rens G, Volodin A, Van Haesendonck C
314 - 319	Normal and lateral force investigation using magnetically activated force sensors Jarvis SP, Yamada H, Kobayashi K, Toda A, Tokumoto H
320 - 325	Strength measurement and calculations on silicon-based nanometric oscillators for scanning force microcopy operating in the gigahertz range Kawakatsu H, Toshiyoshi H, Saya D, Fukushima K, Fujita H
326 - 331	Self-assembled monolayers containing biphenyl derivatives as challenge for nc-AFM Nakasa A, Akiba U, Fujihira M
332 - 336	Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy Nishi R, Houda I, Aramata T, Sugawara Y, Morita S
337 - 342	Using higher flexural modes in non-contact force microscopy Pfeiffer O, Loppacher C, Wattinger C, Bammerlin M, Gysin U, Guggisberg M, Rast S, Bennewitz R, Meyer E, Guntherodt HJ
343 - 348	Development of low temperature ultrahigh vacuum noncontact atomic force microscope with PZT cantilever Suehira N, Tomiyoshi Y, Sugiyama K, Watanabe S, Fujii T, Sugawara Y, Morita S
349 - 354	A low-temperature scanning force microscope for investigating buried two-dimensional electron systems under quantum Hall conditions Weitz P, Ahlswede E, Weis J, Von Klitzing K, Eberl K
355 - 360	Molecular dynamics simulations of dynamic force microscopy: applications to the Si(111)-7 X 7 surface Abdurixit A, Baratoff A, Meyer E
361 - 366	Frequency shift and energy dissipation in non-contact atomic-force microscopy Ke SH, Uda T, Terakura K
367 - 372	Theoretical simulation of noncontact AFM images of Si(111) root 3 X root 3-Ag surface based on Fourier expansion method Sasaki N, Aizawa H, Tsukada M
373 - 381	Measurements and analysis of surface potential change during wear of single-crystal silicon (100) at ultralow loads using Kelvin probe microscopy Bhushan B, Goldade AV
382 - 386	Non-contact AFM investigation of influence of freezing process on the surface structure of potato starch granule Krok F, Szymonska J, Tomasik P, Szymonski M
387 - 392	Scanning probe microscopy - a tool for the investigation of high-k materials Landau SA, Junghans N, Weiss PA, Kolbesen BO, Olbrich A, Schindler G, Hartner W, Hintermaier F, Dehm C, Mazure C
393 - 397	Application of non-contact scanning force microscopy to the study of water adsorption on graphite, gold and mica Luna M, Colchero J, Gil A, Gomez-Herrero J, Baro AM
398 - 404	Chemical force microscopy of -CH3 and -COOH terminal groups in mixed self-assembled monolayers by pulsed-force-mode atomic force microscopy Okabe Y, Akiba U, Fujihira M
405 - 411	Study of mixed Langmuir-Blodgett films of hydrocarbon and fluorocarbon amphiphilic compounds by scanning surface potential microscopy and friction force microscopy Yagi K, Fujihira M